defect of field vision 中文意思是什麼

defect of field vision 解釋
視野缺損
  • defect : n. 1. 缺陷,缺點,弱點;短處。2. 不足,缺乏。vi. 叛變;逃走。 He defected to the West. 他叛逃到西方。
  • of : OF =Old French 古法語。
  • field : n 菲爾德〈姓氏〉。n 1 原野,曠野;(海、空、冰雪等的)茫茫一片。2 田地,牧場;割草場;〈pl 〉〈集...
  • vision : n 1 視力,視覺。2 〈不用冠詞〉先見,洞察;想像力。3 景象,光景;姿態;美景;極美的人〈尤指婦女〉...
  1. With the development of microelectronic products ( integrated circuit, printed circuit board, etc ) directing to high density, thin separation and low defect ratio, its inspection requirement is higher on aspects of precision, efficiency, universal, and intelligence etc. therefore, this paper researched on the general key techniques in the field of microelectronic products vision inspection, covered the shortage of traditional inspection on aspects of fast and precision locating, image mosaic, and fine defect test, completed theory study on physical dimension and defect inspection of microelectronic products based on machine vision, developed the prototype and used lots of experiments to prove its correctness and feasibility

    隨著微電子產品(集成電路晶元、印刷電路板等)向著高密度、細間距和低缺陷方向發展,對其檢測技術在精密、高效、通用和智能化等方面提出了更高要求。由此,本文對微電子產品視覺檢測中的關鍵技術進行研究,彌補了傳統檢測在精確快速定位、圖像全景組合和精細缺陷檢測等方面的不足,最終完成基於機器視覺的微電子產品外形尺寸和缺陷檢測的理論研究和樣機研製,並進行了大量實驗證明其正確性和可行性,力圖為我國自主創新的微電子產品視覺檢測技術提供理論和實際借鑒。
  2. Except that, many problem can " t be solved, such as the conflict of ccd " s high resolving power and big vision field, how to control the automatic gathering of pcb " s image using master and slave computer parallel structure, how to inspect the defect of pcb such as width of circuit, distance of circuit, losing circuit and so on. the research aim at how to combine computer vision, precise machine, automatic control with image process, at how to resolve the contradiction between high resolving power of image gathering and wide vision field, at how to realize automatic mosaic of image, at how to realize precise orientation of two dimension worktable, at how to realize communication between master computer and slave computer, and at how to inspect the defect of line width, line distance and losing

    除此以外,還有ccd高解析度和大視場之間的矛盾,上下位微機并行系統如何控制印刷電路板圖像自動採集,印刷電路板的線寬、線距和丟失線條等缺陷如何檢測等問題還懸而未決,本課題將就如何結合計算機視覺技術、精密機械技術、自動控制技術和圖像處理技術,如何解決圖像採集高解析度與大視場之間的矛盾,如何實現圖像的自動拼接,如何實現兩維工作臺的精確定位,如何實現上下位機的準確通訊,如何檢測線寬、線距缺陷和丟失線條等問題展開重點研究。
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