diffraction current 中文意思是什麼

diffraction current 解釋
衍射流
  • diffraction : 分解
  • current : adj. 1. 通用的，流行的。2. 現在的，現時的，當時的。3. 流暢的；草寫的。n. 1. 水流；氣流；電流。2. 思潮，潮流；趨勢，傾向。3. 進行，過程。
  1. In the paper, we describe the whole configuration of the joint transform correlator ; introduce the correlative theories of joint fourier transform in detail ; in order to achieve better correlation result, the nonlinear processing of joint transform power spectrum ( jtps ) is put forward, the effect of jtps laplace sharpening and binary processing to the correlation image is given ; the method of the best binary threshold is determined ; we analyse the correlation image, present the way that removes liquid crystal diffraction spot, direct current spot and image noise, and binarize the correlation image finally

    本論文主要對提出的聯合變換相關的整體結構進行了描述；詳細介紹了聯合傅里葉變換的相關理論；為了得到更好的相關結果，本文提出對聯合功率譜進行非線性處理的方法，給出了聯合變換功率譜的拉普拉斯銳化和譜的二值化處理對相關峰圖像的影響及二值化最佳閾值的確定方法；對相關峰圖像信息進行了分析；提出了消除液晶衍射光斑、直流光斑和圖像噪聲的方法；最後對相關峰圖像進行了二值化處理。
  2. We introduce the fabrication of all samples and anneal of fexcu ( 1 - x ) granular film in detail. the configuration of granule film is investigated by scanning tunneling microscope ( stm ). the matter phase is analyzed by x - ray diffraction ( xrd ). the hysteresis loop of co / al2o3 / feni magnetic tunnel junction is studied by vibrating sample magnetometer ( vsm ). we use microresistance test system ( mts ) to investigate the character of resistance, conductance, voltage and current

    用掃描電子顯微鏡（ stm ）觀察顆粒膜樣品的表面形貌；用x ?射線衍射儀（ xrd ）對顆粒膜樣品進行物相分析；用振動樣品磁強計（ vsm ）對co al _ 2o _ 3 feni隧道結的磁滯回線作了研究；用微電阻測試系統對樣品電阻、電導、電流、電壓相關特性進行詳細的研究。
  3. The x - ray diffraction, scanning electronic microscope and the squid were used to characterize the properties of the mgb2 core in mgb2 / fe tapes and wires. the effect of the proportion of mg, b and sic as well as the sintering parameters on the phase formation, microstructure and the critical current densities of mgb2 / fe tapes and wires was discussed in details. the results showed that the high purity of mgb2 core could be synthesized by both the traditional vacuum sintering and the sparking plasma sintering and the vacuum sintering environment restrained the oxidation of mg effectively

    相對于傳統真空燒結， sps燒結方式成相速度快、樣品晶粒細小均勻、 mgb2超導芯緻密性好、晶間連接優良，因而sps燒結樣品的臨界電流密度明顯高於傳統真空燒結樣品，其中未摻雜的帶材樣品經過sps800 ， 15分鐘燒結后，自場下的臨界電流密度jc值在10k時達到8 . 64 105a / cm2 ，而且隨著測量溫度和外加磁場的增加， sps燒結樣品的臨界電流密度下降率比傳統真空燒結樣品緩慢，在20k ，自場時為5 . 97 105a / cm2 ， 20k ， 3t時，臨界電流密度值仍大於104a / cm2 。
  4. Biology, etc. owing to many merits has not yet been used to measure parameters of gratings. the paper researches on the subject in view of current lack of it. the main tasks of the paper include : analyzing ellipsometric characteristics of gratings in detail with vector diffraction theory and ellipsometrics ; devising a reflective quarter wave plate at normal incidence according to some ellipsometric characteristics ; making use of normal simplex algorithm during ellipsometric inversion of gratings parameters, inversing ellipsometric parameters with gaussian noise of different standard deviations to simulate actually measured values with examples of isotropic metallic and anisotropic step gratings and testing that ellipsometry about gratings parameters is feasible with the range of certain precision ; discussing choice of incidence angle at length

    本論文的主要工作包括：結合光柵的矢量衍射理論和薄膜的橢偏理論，詳細分析了光柵的橢偏特性；並且根據一些橢偏特性設計出一款正入射反射型單波長1 4波片；在光柵參數的橢偏反演中，引入正單純形法作為反演演算法，分別以各向同性的正弦形金屬光柵和各向異性的階梯型光柵為例，在標準橢偏值的基礎上加入不同偏差的高斯噪聲來模擬實際的橢偏測量值進行反演，在一定精度范圍內得出滿意的光柵參數，說明光柵參數的橢偏測量是可行的；還就入射角的選取問題進行了一定的探討。
  5. Current researches, applications, preparation and structure of si3n4 are summarized in this paper. a new conclusion is drawn that silicon wafer can react with nitrogen at the temperature higher than 1100 and in super - pure nitrogen by direct - nitridation of silicon at the temperature from 800 to 1200. the prepared silicon nitride samples are tested by xps ( x - ray photoelectron spectroscopy ), sem ( scanning electron microscopy ), optical microscopy, xrd ( x - ray diffraction ) and edx ( energy dispersive x - ray analysis )

    通過矽片在800到1200各個溫度和各種氮氣氣氛下的氮化處理的實驗結果，報道了不同與其他研究者的氮化條件，矽片在氮氣保護的熱處理中的氮化條件為：高於1100的溫度和高純氮的氣氛條件，同時對該氮化硅薄膜進行了金相顯微鏡、掃描電鏡（ sem ） 、 x射線衍射儀（ xrd ） 、 x射線光電子譜（ xps ） 、 x射線能譜儀（ edx ）和抗氧化性等測試和分析。
  6. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
  7. Wave diffraction in current on a shoal

    局部淺灘上波流的共同繞射
  8. As mentioned above, to image the diffraction pattern it is necessary to reduce the power of the diffraction lens by altering the current through the lens coils from the value used to form an enlarged image of the first image

    如上所言，要成像衍射模型就必須縮減衍射透鏡的能量，通過改變從已有形態到形成第一映像的放大映像過程中穿過透鏡圈的能量實現。
  9. In the present research, scanning electron microscope ( sem ), laser raman spectroscopy ( lrs ), x - ray photoelectron spectroscopy ( xrs ), x - ray diffraction ( xrd ) and electron probe micro analysis ( epma ) were utilized to investigate the difference in micro - structure and elements distribution between domestic and foreign pdcs. combined with analysis on current manufacturing process, the mechanism for the difference was discussed. scanning electron microscope ( sem ), laser granularity analysis, atom emission spectroscopy ( aes ) and plasma emission spectroscopy ( icpaes ) are also utilized to investigate the grain shape and impurities of key material - diamond power

    本課題採用掃描電鏡、拉曼光譜、光電子能譜、 x -射線衍射分析、電子探針等方法分析了國內外聚晶金剛石-硬質合金復合片在微觀組織結構、元素成分分佈方面的差異，結合對現有燒結工藝的分析，研討了造成這些差異的機理；採用掃描電子顯微鏡、激光粒度分析、原子發射光譜、等離子發射光譜等方法對關鍵原材料-金剛石微粉的晶形、雜質含量進行了比較分析測試。
  10. Plane diffraction grating, logarithmic amplifier and stable constant - current source are used in the system, thus the performance of the instrument is enhanced significantly and the cost is reduced

    系統採用了平面衍射光柵、專用陣列探測器、對數放大器以及高穩定恆流源，有效地提高了儀器的整體性能，同時降低了生化分析儀的成本。
分享友人
分享到 Line

分享到臉書