diffraction spectroscopy 中文意思是什麼
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The structures and characteristics of several graphite samples are measured by means of powder x - ray diffraction ( xrd ), brunauer - emmer - teller ( bet ) surface area measurement, inductively coupled plasma ( icp ) spectroscopy, particle size analysis and electrochemical measurements. the effects of origin, structure, impurity, particle size, specific surface area of carbon materials on the electrochemical characteristics are studied. a synthetic graphite with abundant resources, low cost and favorable performance is determined as the raw material for modification of graphite
採用xrd 、 bet 、 icp 、激光粒徑分析及電化學性能測試等方法，對國內外多種典型石墨樣品的結構與性能進行比較，研究石墨材料的來源、晶體結構、雜質含量、顆粒大小、比表面積等因素對其充放電性能的影響，確定一種性能較好、價格低廉、來源廣泛的普通人造石墨粉作為熱處理與摻雜改性、以及復合結構炭材料研究的原材料。 -
Firstly, the tio2 thin films are deposited by dc reactive magnetron sputtering apparatus, and characterlized by n & k analyzer1200, x - ray diffraction spectroscopy ( xrd ), scanning electronic microscopy ( sem ), alpha - step500. and it was analyzed that the effect on performance and structure of films with the change of argon flow, total gas pressure, the substrate - to - target distance and temperature
第一、應用穩定的直流磁控濺射設備制備tio2減反射薄膜並通過n & kanalyzer1200薄膜光學分析儀、 x射線衍射分析（ xrd ） 、掃描電子顯微鏡（ sem ） 、 alpha - step500型臺階儀等儀器對薄膜進行表徵，分析氧分壓、總氣壓、工作溫度、靶基距等制備工藝參數對薄膜性能結構的影響。 -
The as - grown crystals were characterization by cutting and directional, x - ray diffraction, high resolution ohmmeter, ir transmission spectroscopy, visible light absorption spectroscopy, scan electronic microscopy ( sem ) and positron annihilate time technique ( pat ). the ir transmittance of czt single crystals grown with cd - riched is about 53 %, while 23 % with no cd riched
採用解理實驗、 x射線衍射、電學性能測試、紅外透過譜測試、可見光吸收譜測試、 sem蝕坑分析、探測器的試制等分析測試方法，並首次採用正電子湮沒壽命譜分析方法來研究czt單晶體的空位缺陷，綜合表徵了所生長的晶體的質量和性能。 -
Components, structure and surface morphology of the resulted films were identified by fourier transform infrared ( ftir ) spectroscopy, x - ray diffraction ( xrd ) and scanning electronic microscopy ( sem ). the analyses showed the content of cubic boron nitride in the resultant films on substrates was rather high and crystal particles of c - bn with uniform size, smooth crystal plane and regular shapes ( quadrangle and hexagon ) densely arrayed on the substrate
傅里葉轉換紅外吸收（ ftir ）光譜儀、 x射線衍射（ xrd ）儀和掃描電鏡（ stm ）的測量結果顯示，基底上的bn膜中立方相含量很高，且晶粒大小均勻、排列緻密，晶形呈規則的四角和六角形。 -
The crystalline structure changes of pp induced by pan - milling were characterized by x - ray diffraction and raman spectroscopy. xrd analyses show that when pp was co - milled with uhmwpe, crystal transformation of pp occurred, its crystallinity and crystallite size decreased, whereas, only slight reduction of crystallinity and crystallite size were observed and no crystal transformation was found when pp was co - milled with wtr chips, and amorphization of pp was strongly enhanced by co - milling pp with iron
採用x -射線衍射研究了聚丙烯碾磨粉碎過程微觀結構變化， uhmwpe存在下pp發生晶型轉變、結晶度降低和晶粒尺寸減小；彈性材料wtr抑制pp塑性變形，碾磨導致分子堆積有序區域膨脹，晶面間距增大，結晶度下降；剛性材料金屬鐵與pp產生強烈摩擦，加快晶粒細化，晶格破裂導致非晶化。 -
Treatment of the spinel limn2o4 with aqueous acid produces - mno2. x - ray diffraction and atomic absorption spectroscopy show that - mno2 with lattice constant of 0. 806nm preserves the structural framework of the limn2o4 and the conversion of limn2o4 to - mno2 results in some contraction of the lattice
利用limn2o4與稀酸作用制得- mno2 ，經xrd 、原子吸收光譜（ aas ）分析表明- mno2仍然保持了尖晶石的面心立方點陣，晶胞參數0 . 806nm ； limn2o4經過酸處理、鋰離子脫出后晶胞體積發生了收縮。 -
The cenosphere particles were characterized with optical microscope, field emission scanning electron microscopy ( fesem ), energy - dispersive spectroscopy ( eds ) and x - ray diffraction ( xrd ) in and after the plating
用光學顯微鏡、場發射掃描電子顯微鏡、能譜儀和x射線衍射儀對其進行了分析表徵。 -
Ge - sio2thin films were prepared by an rf co - sputtering technique on p - si substrates from a ge - sio2 composite target. the as - deposited films were annealed in the temperature range of 300 - 1000 under nitrogen ambience. the structure of films was evaluated by x - ray diffraction ( xrd ), x - ray photoernission spectroscopy ( xps )
當溫度較低時（沉積時的基片溫度ts 450 ，后處理退火溫度ta 800時，制備的樣品均為非晶結構，當溫度較高時（ ts 450 ， ta 800 ）薄膜樣品中才出現si的結晶顆粒。 -
The corrosion behavior of nanocrystalline ( nc ) copper bulks with various grain sizes prepared from igc ( inert gas condemsation ) and vacuum annealing in comparison with conventional microcrystalline ( mc ) copper ( as - rolled and electrolytic ) in acid copper sulphate solution and neutral solution containing chlorides under free corrosion conditions and anodic polarizations has been studied using potentiodynamic polarization, potentiometric analysis, cyclic voltammetry and electrochemical impedance spectroscopy. x - ray diffraction was used to estimate the grain size of the annealed nc copper. field emission gun scanning electron microscopy and x - ray energy - dispersive spectroscopy was used to characterize the surface morphology and analyze the surface composition after the polarization and potentiometric test of both nc and mc copper
本文研究了用igc （惰性氣體蒸發凝聚原位溫壓法）制備並真空退火到不同晶粒尺寸的納米晶銅和微米晶銅（冷軋紫銅、電解銅）在酸性硫酸銅溶液和中性含氯溶液中，在自腐蝕狀態和陽極極化狀態下的腐蝕性能。使用了動電勢極化、電位測定、循環伏安法（ cv ）和電化學阻抗譜（ eis ）等方法。 x -射線衍射（ xrd ）的方法用來估算納米晶銅晶粒尺寸。 -
Effects of oxygen pressure on microstructure of lno conductive thin film has been studied by in situ reflection high energy diffraction ( rheed ) and ex situ x - ray photoelectron spectroscopy ( xps ). in the relatively low oxygen pressure, lno film displays spotty rheed pattern
首先，通過原位高能電子衍射（ rheed ）及x光電子能譜（ xps ）研究了氧分壓對lno導電薄膜微結構的影響，並進一步提出了氧分壓對lno薄膜微結構的影響的機理。 -
Current researches, applications, preparation and structure of si3n4 are summarized in this paper. a new conclusion is drawn that silicon wafer can react with nitrogen at the temperature higher than 1100 and in super - pure nitrogen by direct - nitridation of silicon at the temperature from 800 to 1200. the prepared silicon nitride samples are tested by xps ( x - ray photoelectron spectroscopy ), sem ( scanning electron microscopy ), optical microscopy, xrd ( x - ray diffraction ) and edx ( energy dispersive x - ray analysis )
通過矽片在800到1200各個溫度和各種氮氣氣氛下的氮化處理的實驗結果，報道了不同與其他研究者的氮化條件，矽片在氮氣保護的熱處理中的氮化條件為：高於1100的溫度和高純氮的氣氛條件，同時對該氮化硅薄膜進行了金相顯微鏡、掃描電鏡（ sem ） 、 x射線衍射儀（ xrd ） 、 x射線光電子譜（ xps ） 、 x射線能譜儀（ edx ）和抗氧化性等測試和分析。 -
The phases structure of the kapton film and protective film were determined by x - ray diffraction ( xrd ) and x - ray photoelectron spectroscopy ( xps )
用x射線衍射分析（ xrd ） 、光電子能譜（ xps ）對基體薄膜及鍍膜的物相成分、化學結構進行表徵。 -
The morphologies of powder were observed by using high - resolution transmission electron microscopy ( hrtem ) ; x - ray diffraction ( xrd ) pattern was used to analyze the phases of the powder ; energy dispersive x - ray spectroscopy ( edx ) was used to analyze the component of composite powder
用高分辨電鏡觀察復合粉體的形貌，進行電子衍射分析；用d / 3ax3b型x射線衍射儀作復合粉體的物相分析；用pv9900型能譜儀作復合粉末的成分分析。 -
The effect of growth parameters on the morphology, structure and chemical compositon of sic whiskers have been characterized by x - ray diffraction ( xrd ), scanning electron microscope ( sem ), energy dispersive x - ray spectroscopy ( eds ) and transmission electron microscope ( tem )
運用x射線衍射（ xrd ） 、掃描電子顯微鏡（ sem ） 、電子能量色散譜（ eds ） 、透射電子顯微鏡（ tem ）等表徵手段，系統研究了工藝參數對sic晶須形貌、結構和化學成份的影響。 -
Means of mensuration of polyiodides are various and x - ray diffraction, raman and far - ir spectroscopy are primary methods for the characterization of polyiodides
高居碘的測試手段多樣，主要的有x -射線衍、拉曼光譜和遠紅外光譜。 -
The composites with different compatibilizers and nano - sio2 content were characterized by means of mechanical testing, differential scanning calorimetry ( dsc ), x - ray diffraction ( xrd ), fourier transformation infra - red spectroscopy ( ft - ir ), transmission electron microscope ( tem ), scanning electron microscope ( sem ), etc. the relation between the structure and property of the composites was discussed in this thesis
研究了不同增容劑、納米sio _ 2含量對復合材料的沖擊強度、拉伸強度等力學性能；並利用差熱掃描量熱分析（ dsc ） 、 x射線衍射譜（ xrd ） 、紅外吸收光譜（ ir ） 、掃描電鏡（ sem ）等分析，討論了復合材料結構與性能的關系。 -
In charter ii, the data of sem, x - ray diffraction and raman spectroscopy were used to characterize the structure of a - c
其中第二章從表面形貌、 x射線衍射、 raman散射光譜等多方面闡述了非晶碳的研究手段和一般特徵。 -
Abstract : the cold - pressing ceramic processing technique was used to prepare ce - doped barium titanate ceramics. the solid solubility of ce ions in batio3 lattice and the effect of the ce doping on the structure of batio3 dielectric ceramics were investigated by x - ray diffraction spectroscopy
文摘:採用冷壓陶瓷處理技術制備了鈰參雜的鈦酸鋇陶瓷.應用x光衍射譜來調查鈰在鈦酸鋇晶格中的固溶性以及鈰的參雜對鈦酸鋇介電陶瓷結構的影響 -
The main work includes four contents as follow : 1 ) the electrodes annealed in various temperatures were studied. with x - ray diffraction spectroscopy ( xrd ) and sims, the interfacial reaction is analyzed and a new two - step annealing method is suggested
研究了al單層電極及ti al雙層電極與藍寶石基gan在不同退火條件下的歐姆接觸情況，並用x射線衍射譜（ xrd ） ，二次離子質譜（ sims ）對界面固相反應進行了分析。 -
In the present dissertation, nanocomposite thin films and extended molecular devices were prepared via the electrostatic self - assembly monolayer technique. the structures and the properties of the thin films were studied by uv - vis spectroscopy, x - ray diffraction spectroscopy, x - ray photoelectron spectroscopy, laser raman spectroscopy, atomic force microscopy, fiber optic experimental setups and so on. a novel fiber optic humidity sensor based on the self - assembled polyelectrolyte multilayer thin films was presented, and other thin film devices were also described
在對納米復合薄膜研究的重要性及自組裝薄膜技術的發展動態進行綜合分析的基礎上，開展了利用靜電吸附自組裝技術制備納米復合薄膜及廣義的分子器件的研究，採用紫外-可見光光譜儀、 x射線衍射儀、 x射線光電子能譜儀、激光拉曼光譜儀、原子力顯微鏡、光纖光學系統等研究了復合薄膜的結構與性能，研製了一種光纖濕度傳感器和其他薄膜器件。
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