fast-scanning infrared microscope 中文意思是什麼

fast-scanning infrared microscope 解釋
快速掃描紅外顯微鏡
  • fast : adj 1 緊 (opp loose), 牢實的,堅牢的,粘得緊的,堅固的;固定的。2 忠實的,可靠的。3 耐久的;不...
  • scanning : n. 1. 細看,細察,審視。2. 【電視】掃描,掃掠,搜索。
  • infrared : adj 【物理學】紅外線的;紅外區的;產生紅外輻射的;對紅外輻射敏感的。 an infrared detector 【軍事...
  • microscope : n 顯微鏡。 a binocular microscope 雙目顯微鏡。 an electron microscope 電子顯微鏡。 a field ion em...
  1. In czochralski silicon crystals ( czsi ) through fast neutron irradiation, formation and conversion of defects were investigated using fourier transform infrared spectroscopy ( ftir ), positron annihilation technology ( pat ) and scanning electron microscope ( sem ). the results showed that fast neutron irradiation induced large quantity of metastable defects which can be the capture centers of positron, positron annihilation average lifetime of samples increased with increasing of irradiation dosage. positron annihilation average lifetime of irradiation samples through dosage up to 1 1018 n. cm - 2 tended to constant

    本文對直拉硅樣品進行了不同劑量的快中子輻照,在硅中引入大量的亞穩態缺陷,研究這些亞穩態缺陷的形成,並在較寬的溫度范圍內對輻照樣品進行了退火處理,研究退火后亞穩態缺陷的轉化及同硅中氧的相互作用,應用傅立葉變換紅外光譜技術( ftir ) 、正電子湮沒技術( pat )和掃描電鏡( sem )進行了測試。
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