fluorescence scattering 中文意思是什麼
fluorescence scattering
解釋
熒光散射- fluorescence : n. 熒光（性）。
- scattering : adj. 1. 分散在不同方向的，分散在不同范圍的。2. 廣泛擴散的。3. （選票）數量分散的，不集中的。n. 1. 散亂。2. 在媒介質中的散播。3. 【物理學】散射。adv. -ly
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Efficient enhancement of stimulated raman scattering of carbon disulfide by fluorescence of dye rhodamine 6g
2受激拉曼散射的高效放大 -
Detector : the most commonly used detector is ultraviolet absorption detector ; other universal detectors are photodiode array detector ( dad ), fluorescence detector, refractive index detector, evaporative light - scattering detector, electrochemical detector and mass spectrometry detector etc
檢測器最常用的檢測器為紫外吸收檢測器，其他常見的檢測器有二極體陣列檢測器（ dad ） 、熒光檢測器、示差折光檢測器、蒸發光散射檢測器、電化學檢測器和質譜檢測器等。 -
A linear relation can be found between response value of ultraviolet absorption detector, fluorescence detector, electrochemical detector and refractive index detector and quality of the object under test ; however, relation between response value of evaporative light - scattering detector and quality of the object under test is usually not a linear one, therefore, mathematical conversion of response value should be made before making calculation when necessary
紫外、熒光、電化學和示差折光檢測器的響應值與待測物的質量呈線性關系，但蒸發光散射檢測器響應值與待測物的質量通常並不呈線性關系，必要時需對響應值進行數學轉換后進行計算。 -
Ultraviolet absorption detector, photodiode array detector ( dad ), fluorescence detector, and electrochemical detector are optional detectors, response value of which is relative to not only quality of the object under test, but also structure of the compound ; refractive index detector and evaporative light - scattering detector are universal detector, responding to structure of all compounds ; evaporative light - scattering detector is quality - type detector, whose responding value only relates to quality of the object under test for compounds with similiar structures ; photodiode array detector ( dad ) can, at the same time, record absorption spectra of the object under test in a prescribed wave scope, consequently, it can be used in spectrum control and inspection of purity of chromatographic peaks of the object under test
紫外、二極體陣列、熒光、電化學檢測器為選擇性檢測器，其響應值不僅與待測物的質量有關，還與化合物的結構有關；示差折光檢測器和蒸發光散射檢測器為通用型檢測器，對所有的化合物結構均有響應；蒸發光散射檢測器屬質量型檢測器，對結構類似的化合物，其響應值幾乎僅與待測物的質量有關；二極體陣列檢測器可以同時記錄待測物在規定波長范圍內的吸收光譜，故可用於待測物的光譜管制和色譜峰純度的檢查。 -
The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。 -
Resonance scattering and fluorescence spectral study of the nanoparticle system of aucl - 4 - i
納米微粒體系的共振散射和熒光光譜
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