grazing incidence ray 中文意思是什麼
grazing incidence ray
解釋
旁掠射線-
It reformed the coventional grazing incidence method of reflecting x ray, and made it possible to reflect x ray in normal incidence way. it moves x ray optics forward greatly
它從根本上改變了傳統的掠入射反射x光的方法，使正入射反射x光成為可能，並極大的促進了x光學的發展。 -
3 the main facilities in our experiment are introduced. they consist of the hi - 13 model tandem accelerator, the 2. 2 - meter grazing incidence vuv to soft x - ray monochromator and the data - processing system. the testing system is also described
3介紹了主要的實驗設備，即hi - 13串列加速器和2 . 2米掠入射真空紫外到軟x射線譜段光譜儀的結構和原理，介紹了實驗數據獲取系統和實驗系統的調試。 -
In theory, firstly, the theorectical considerations on soft x - ray are discussed. secondly, the conclusion is obtained based on the applying the lorentz reciprocity theorem, which demonstrates that equivalence of brazing exit and grazing incidence methods
在理論研究方面，首先討論了軟x射線熒光產生的原子物理相關理論；其次根據洛倫茲互換定理，得出了掠出射和掠入射兩種熒光分析理論具有互換性的結論。 -
The surface morphologies of thin films were observed by using scan electron microscope ( sem ) and atomic force microscope ( afm ). based on grazing incidence x - ray diffraction ( gixrd ) equipment, we find that residual stress exist in magnetron sputtering plct film, in addition, the ferroelectric properties of plct thin films were measured by radiant premier lc type multifunctional ferroelectric properties test system
利用廣角x射線衍射技術對不同濺射工藝下plct薄膜的相結構進行了研究;採用掃描電子顯微鏡（ sem ）和原子力顯微鏡（ afm ）分別觀察了薄膜的表面形貌;利用掠入射x射線衍射（ gixrd ）測量了薄膜的殘余應力。 -
The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。 -
After vaccum annealling in magnetic fileld, the films were studied by grazing incidence x - ray diffraction analysis and scan of x - ray diffraction. the results showed that fe atoms could be separated from cu matrix, which results in the increasing of the interface scattering, and enhance gmr effect
通過對真空磁場熱處理前後的薄膜的gixa分析及xrd掃描發現，真空磁場熱處理能夠使沉積態薄膜中的fe原子從cu的晶格中定向析出，這使得熱處理后薄膜內部的界面散射增多，能夠有效的提高薄膜的巨磁阻值。
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