in-circuit 中文意思是什麼
in-circuit
解釋
在線、在線路中 內電路-
Railway fixed equipment. rules for the application for safety equipment in circuit diagrams for failsafe systems
鐵路固定設備.故障安全系統電路圖中安全設備的應用規則 -
In the method of impulsive synchronization, both seriate system and discrete system have been discussed. a series of discrete hyperchaos systems that have the lowest dimension have been constructed, and we have achieved the impulsive synchronization of discrete system in circuit
脈沖同步法中，分別從連續系統和離散系統兩方面進行討論，構造出一系列具有最低維數的離散超混沌系統，並通過電子線路實現了離散系統的脈沖同步。 -
Application of dummy electric worktable ewb in circuit experiment teaching
在電路實驗教學中的應用 -
To perform an in - circuit test, you need a test fixture that connects the circuit nodes on the board under test to the tester
為了完成在線測試，你需要一個測試固定裝置，它可以將被測電路板上的節點連接到測試設備上。 -
The design of the switched capacitor filter is one of the research focuses in circuit and system
開關電容濾波器設計是電路與系統領域里的研究熱點之一。 -
Experiment in circuit for controlling hyperchaos
控制超混沌的電路實驗 -
Most in - circuit test fixtures use spring - loaded probes and are vacuum actuated
很多在線測試固定裝置是帶有彈簧的探針或者採用真空啟動的。 -
The tr - 518f board tester is developed to meet the industry needs for sophisticated in - circuit test capability
元件開路空焊問題的先進測試機種。此外， -
And, when coupled with functional testing, the fault coverage for the entire process is as good as or better than in - circuit testing alone
加上功能測試，這個過程中檢測到的故障率要比單獨進行在線測試故障發現率大。 -
Because most of the faults found at board test are manufacturing defects, fault coverage for mda tests is nearly as good as fault coverage for in - circuit tests
因為在板級測試中發現的大部分故障都是生產缺陷，生產缺陷分析測試到的故障幾乎都可以覆蓋在線測試所發現的問題。 -
An in - circuit tester tests a digital ic using the ic ' s truth table
在線測試設備採用真值表來測試數字集成電路。 -
The first test an in - circuit tester performs is a shorts - and - opens test
在線測試完成的第一項測試任務就是短路、開路測試。 -
After performing the shorts and opens test, the in - circuit tester tests each component on a pcb assembly one at a time
在線測試完成的第一項測試任務就是短路、開路測試。 -
These testers cost less than in - circuit testers, and some manufacturers claim that tests run faster on mdas
這些測試設備所需要的費用要比在線測試設備少，而且有些製造商還宣稱在生產缺陷分析設備上，測試速度進行的更快。 -
In - circuit testers can now also test for solder opens on surface - mounted devices ( smds ), a common manufacturing defect on boards with smds
對于表面安裝設備來說，焊接開路是一個很普遍的製造缺陷，在線測試設備可以將其測試出來。 -
For complex boards or boards that aren ' t tested with an in - circuit tester, most companies perform a functional test before final assembly
對于復雜的電路板或者沒有經過在線測試的電路板而言，很多公司在最後裝配之前進行功能測試。 -
Today, the test engineer has many more options, including in - circuit testers, manufacturing defects analyzers, and several types of functional testers
今天，測試工程師有很多選擇，包括在線測試設備，製造缺陷分析設備和一些功能測試設備。 -
Because in - circuit testers and mdas test components individually, a pcb assembly can pass an in - circuit or mda test and still not function properly
在線測試和生產故障發現測試都是對器件單獨進行測試，一塊印刷電路板可以通過在線測試或生產缺陷測試，但是功能上還可能不是很完全。 -
Inquiry about majorization of vhdl language in circuit design
語言在電路設計中的優化探討 -
On the base of studying imaging theory of lens, the imaging theory of laser confocal scanning microscopy was analyzed in detail in this paper, and the advancement of that the optical fiber was applied to the system was described ; on the base of completed the demonstration for whole project, the experiment scheme was designed ; the relationship between the main parameters of key devices and the resolution was deduced, and the requirements of coupling efficiency and vignetting effects to optical system was analyzed ; the design of optical system and the planar scanning controlling circuit was completed ; a new method was put forward to resolved the inherent non - liner scanning problem of the galvanometer scanner by using software liner controlling in circuit design, and the perfect planar scanning was realized ; at last the low noise, high multiple and non - distortion amplify circuit of photoelectric detector was completed
本文在透鏡成像理論的基礎上，系統、深入地分析了共焦掃描顯微成像的機理，論述了應用單模光纖的激光共焦掃描顯微成像系統的優點；進行了總體方案的論證，並設計確定了單模光纖激光共焦掃描顯微成像系統的總體方案；從理論上推導分析了解析度要求與試驗系統中相關器件主要參數之間的關系，分析了系統耦合效率和漸暈現象對光學系統的設計要求；完成了方案中光學系統和二維掃描控制電路的設計，並在電路設計中採用了用軟體解決檢流計式光學掃描器（振鏡）非線性問題的新方法，能夠實現較為理想的二維模擬掃描；完成了高增益、低噪聲和低失真的探測接收系統的設計和調試。
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