molecular beam epitaxy (mbe) 中文意思是什麼

molecular beam epitaxy (mbe) 解釋
分子束磊晶法;分子子束外延
  • molecular : adj. 分子的,由分子形成的,分子內[間]的。adv. -ly
  • beam : n 1 梁,棟梁,桁條;(船的)橫梁。2 船幅;(動物、人的)體幅。3 (秤)桿,杠桿,(織機的)卷軸,...
  • epitaxy : n. 【物理學】(晶體)取向附生,外延。epitaxial,epitaxic adj.
  1. Molecular beam epitaxy, mbe

    分子束磊晶
  2. High quality single - crystal zns - based ii - vi thin films have been prepared on gaas and gap substrate using molecular beam epitaxy ( mbe ) technique. successful n - type doping of znsxse1 - x alloy using aluminum source has been carried out

    本文研究了在gaas和gap襯底上,本徵型和n型al摻雜zns基單晶薄膜的分子束外延生長,獲得了高質量的單晶外延薄膜。
  3. Main works and results include : ( 1 ). growth method of self - organized quantum dots was studied. high quality inas self - organized quantum dots were grown by mbe ( molecular beam epitaxy ) technique

    本文開展的主要工作和結果有: ( 1 )研究了自組織量子點的生長方法,利用分子束外延技術( mbe )生長出高質量的inas自組織量子點。
  4. Fortunately, with the improvement in the material growth, gap1 - xnx alloys with nitrogen concentration as high as several percentage have been successfully grown by molecular beam epitaxy ( mbe ) or metalorganic vapor - phase epitaxy ( movpe ). more and more attentions have been paid to this alloy for its distinct property such as the giant band gap and effect, for this reason, gap1 - xnx alloys are usually called abnormal alloys

    人們研究發現, gapn混晶具有一些獨特的光電性質,例如其帶隙不是gap和gan的線性內插值,而是存在著較大的帶隙降低和巨大的帶隙彎曲系數,因此gapn混晶又被稱為「反常」混晶,從而引起了人們越來越多的關注,並成為當前的一個研究熱點。
  5. To study its properties and obtain high quality thin films, a variety of techniques have been used such as molecular beam epitaxy ( mbe ), metal organic chemical vapor deposition ( mocvd ), magnetron sputtering, pulsed laser deposition, to prepare zno thin films

    為了獲得高質量的氧化鋅薄膜材料,人們已採用分子束外延,有機化學汽相沉積,脈沖激光沉積,磁控濺射等各種技術來制備氧化鋅薄膜材料。
  6. Molecular beam epitaxy ( mbe ) has been used to grow insb heteroepilayer on gaas ( 001 ) substrate with optimized low temperature buffer layer. the surface morphology and crystal quality of insb epilayers have been investigated by means of atomic force microscope ( afm ), scanning electron microscopy ( sem ) and double crystals x - ray diffraction ( dcxrd )

    本文採用分子束外延( mbe )方法在gaas ( 001 )襯底上優化低溫緩沖層生長條件制備了異質外延insb薄膜,採用原子力顯微鏡( afm ) 、掃描電鏡( sem )與x射線雙晶衍射( dcxrd )等方法研究了insb / gaas薄膜的表面形貌與結晶質量。
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