parametric fault 中文意思是什麼

parametric fault 解釋
參數故障
  • parametric : adj. 參(變)數的;參量的。
  • fault : n 1 過失,過錯;罪過,責任。2 缺點,缺陷,瑕疵。3 (獵狗的)失去嗅跡。4 【電學】故障,誤差;漏電...
  1. Considering different soil spring models for vertical fault movement and horizontal fault movement, two damage cases of pe pipeline in ji - ji earthquake have also been simulated. the large deformation of a buried pipeline under fault movement is investigated in the 4th chapter. to examine the inelastic behavior of buried pipelines, the parametric studies on pipe material property, diameter ( d ), diameter - to - thickness ratio ( d / t ), crossing angle ( ), as well as soil stiffness, have been conducted using a shell - spring fem method

    對於0 p三90 」的情況,當斷層位移相對管徑還不是很大時(管子內的彎曲應變與軸向拉伸應變相差不大的情況) ,斷層附近管子變形形式與梁相似;當斷層位移相對管徑很大時(管子以軸向拉伸應變為主的情況) ,斷層附近的管子軸線變形為一圓弧,管子表現得像一條沒有彎曲剛度的索。
  2. This thesis aims at discussing the model of manufacturing defects, the principles of soft and hard faults induced by manufacturing defects, the effects of soft fault on circuit reliability and yield and the relationship between yield loss and reliability decrease caused by manufacturing defects. the author ' s main contributions are as following : reliability and yield are two significant factors to semiconductor manufacture. based on the principles of the manufacturability engineering, the thesis discusses the effects of the manufacturing defect on the functional yield, parametric yield and the reliability for ics, and abstracts geometric models from actual chips

    本文對集成電路製造缺陷模型、由製造缺陷導致的軟、硬故障的作用機理、軟故障對電路可靠性和成品率的影響以及由製造缺陷導致的電路成品率的損失和可靠性下降之間的關系進行了系統的研究,主要研究結果如下:可靠性和成品率是影響半導體生產的兩個主要因素,本文首先從集成電路的可製造性工程理論出發,討論了製造缺陷在影響集成電路功能成品率、參數成品率和可靠性方面的作用。
  3. Assisted with the sensitivity of the linear analog circuits, the feasibility of parametric faults detection was analyzed through the maximum fault errors acquired at the sensitive frequencies, a stimulation matrix and its stimulation expression were put forward on the test points information

    摘要從線性模擬電路靈敏度的概念入手,分析了通過獲取敏感頻點激勵下的最大故障誤差來檢測電路參數故障的可能性,提出了一種針對測試頻率和測點信息的激勵矩陣。
  4. For each parametric study case, the fault displacement ( a ) is up to 7 meters

    當管子與斷層的交角大於90度時,壓縮應變主導著管子的變形。
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