roughness measurement 中文意思是什麼

roughness measurement 解釋
粗糙度測量
  • roughness : n. 1. 粗糙；凹凸不平，崎嶇；蓬亂。2. 粗暴；狂風暴雨。3. 未加工。4. 難聽，刺耳；味澀；不調和。5. 概略。6. 【工業】粗糙程度。
  • measurement : n. 1. 測量，計量，量度。2. 份量，尺寸，大小，寬度，厚度，深度（等）。3. 測量法。 measurement goods （按體積、容積計算的）體積貨物。
  1. Nanometer scale surface roughness measurement based on afm

    基於原子力顯微鏡的納米級表面粗糙度測量
  2. Influence of incidence angle on the measurement of surface roughness by laser speckle

    激光入射角對光聲信號大小的影響
  3. Calibration specification for contact stylus instruments of surface roughness measurement by the profile method

    觸針式表面粗糙度測量儀校準規范
  4. Afm measurement indicates that the surface roughness of films is different with difference of fe content, and the films all represent self - assembly phenomenon. the results of the magnetic properties measurement reveal that in the assputtered films, the more fe content in the film, the higher the magnetic properties of the film

    利用振動樣品磁強計測量不同cu - fe過飽和固溶體薄膜的磁性能，結合eds及xrf對薄膜成分標定的結果，表明沉積態薄膜的磁性能隨薄膜中的fe含量的增加而增強。
  5. We also report the uv - visible optical absorption spectra of these colloids. to the metal plate prepared simultaneously, the measurement result of sem and afm of this plate is also reported and the roughness of the silver plate surface is about 60nm. both the colloids and the nano - scale metal surface can become the very perfect sers substrates. rhodamine b, a kind of strong fluorescence laser dye, with gold colloidal surface, has been studied by surface - enhanced raman spectroscopy ( sers ) with near - infrared ( nir ) excitation in the presence of the halide ions ( cf, br -, f )

    利用透射電子顯微鏡（ tem ） ，對膠體粒子的尺寸大小及形態進行了觀測，表明這些膠體為粒徑介於5 35nm的納米體系，並對該膠體體系進行了紫外?可見吸收光譜的研究；在制備出金屬膠體的同時，經過激光照射后的金屬表面為納米量級的粗糙表面，對該表面進行了掃描電鏡（ sem ）及原子力顯微鏡（ afm ）的測量，結果顯示該表面的粗糙度平均為60nm 。
  6. Measurement of device surface profile and roughness

    器件表面形貌及粗糙度檢測
  7. Standard test method for measurement of vehicular response to traveled surface roughness

    測量車行道路面粗糙度的行車響應曲線的標準試驗方法
  8. Measurement and characterization of surface texture is an important aspect of precision metrology. historically this has involved partitioning a profile into different wavelength regimes referred to as roughness, waviness and form followed by numerical quantization. parameters computed are then inspected for tolerance compliance to ensure a part performs its intended function. this approach is satisfactory when the specification has been carefully determined and the process is stable. however, when the manufacturing process is under development or when instability or modifications to the process invalidate specifications, there is a need to study surface finish parameters in relation to functional performance or process measures. in this context, the problem of surface texture classification and recognition are discussed. advanced techniques developed for this purpose along with applications are presented. also, the techniques discussed here will be useful across large bandwidth, from the characterization of nano scale to traditional micro scale surfaces

    表面結構的測量與特徵描述是精密計量技術的一個重要方面，傳統上包括將輪廓情況根據不同的波長范圍劃分為粗糙度、波紋度和形狀及后續的數字量化.按算得的參數檢查它是否為公差允許，以保證零件執行其指定的功能.當技術特性已經經過仔細確定，並且其過程穩定時，該方法是令人滿意的;但是，當製造過程正在進行中或過程的不穩定、過程變化使技術特性失效時，就需要研究和功能表現及過程評定相關的表面參數.討論了表面結構的分類與識別問題.同時闡述了為此目的而開發的先進技術及其應用.所研究的技術對從納米尺度到傳統的微米尺度的較大帶寬范圍內的表面特徵描述都是有效的
  9. Precision copper sphere grinders, super - precision copper sphere wrapping machines, copper sphere polishing machines, automatic ball inspectors, laser measurement devices, surface roughness machines, perfect circle measurement machines, digital scopes, etc

    精密鋼球研磨機，超精密鋼球lapping machine ，鋼球polishing machine ，自動球檢查器，激光測定機，表面打磨機，正圓度測定機，電子觀測器等
  10. Instrument for the measurement of surface roughness by the profile method. terms

    輪廓法測量表面粗糙度的儀器.術語
  11. Instruments for the measurement of surface roughness by the interferometric method

    干擾測量法測量表面粗糙度的測量儀
  12. The method uses frequency components of the marks and the corresponding amplitudes as the indexes for the quantitative evaluation, which can be obtained directly from the surface roughness measurement system

    此法以振紋之頻率成分及其振幅為量化之指針，其值可直接由三維表面粗度量測系統求得。
  13. Measurement of roughness average ra and peak count rpc on metallic flat products

    金屬扁平製品的平均粗糙程度ra和最大數量rpc的測量
  14. Measurement of roughness average - ra and peak count rpc on metallic flat products

    平均粗糙程度的測量.金屬扁平製品的ra和最大數量rpc
  15. Measurement of roughness average ra and peak count rpc on metallic flat products ; german version en 10049 : 2005

    金屬扁平製品的平均粗糙程度ra和最大數量rpc的測量.德
  16. Otherwise, using the ta buffer layer can effectively reduce the surface roughness. in addition, measured by our measurement system, the polycrystalline the film has similar negative magnetoresistance effect to single - crystalline film, so it is potential to be applied in spintronic devices

    通過磁電子輸運測試系統研究制備的薄膜還發現多晶fe _ 3o _ 4具有同單晶fe _ 3o _ 4類似的負磁電阻特性，因此有望將多晶fe _ 3o _ 4薄膜應用到自旋電子器件中。
  17. Study on an approach to measure road roughness spectrum of tracked vehicle measurement road

    曲面插值的圖像縮放方法
  18. Surface texture. measurement devices. roughness comparison specimens

    表面組織結構.測量裝置.粗糙度比較試樣塊
  19. Surface roughness and peak count measurement of cold - rolled steel sheet

    冷軋薄鋼板表面粗糙度和峰值測量
  20. In this paper, non - contact surface roughness measurement methods and their current research status are synthetically reviewed, and advance direction of the research is prospected to promote the research in theory and application in the future

    摘要文中綜述了各類非接觸式測量方法及其研究現狀，並對其未來的研究發展方向進行了展望，以進一步推動理論和應用研究的工作。
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