sample bias 中文意思是什麼
sample bias
解釋
樣本偏差-
Heckman, j. j. ( 1979 ), sample selection bias as a specification error, econometrica, 47, 153 - 161
樣本選擇偏差，一看就知道是個很重要的問題嘛，排名第五，不算虧待。 -
Comparing with non - bnyain methods, it ' s prominent featares lay in that it combines the prior and posterior information, which avoids the disadvantag of subjective bias caused by simply using the prior information only, of blind search caused by the incomplete sample information, of noise affection caused by simply using the sample information only if we choice a suitable priof, we can conduct the bayesian leaming effectively, so it fits the problems of data mining and machine leaming that possess charaters of probability and statistics, especially when the samples are rare
與非貝葉揚方法相比，貝葉斯方法的特出特點是其學習機制可以綜合先驗信息和后驗信息，既可避免只使用先驗信息可能帶來的主觀偏見，和缺乏樣本信息時的大量盲目搜索與計算，也可避免只使用樣本信息帶來的噪音的影響只要合理地確定先驗，就可以進行有效的學習。因此，適用於具有概率統計特徵的數據採掘和機器學習（或發現）問題，尤其是樣本難得的問題 -
The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。 -
These sample points were randomly selected before any data processing tasks were undertaken to avoid bias from human operator
為避免操作員的人為偏差，上述采樣是在完成資料處理前隨機抽取的。 -
This paper proposes weighted support vector machine algorithms based on the analysis of the cause of such problem, and this algorithm overcomes the drawback which standard support vector machine algorithm ca n ' t deal with each sample flexibly and compensates for the unfavorable impact caused by this bias
通過比較它們各自的優缺點等情況，為提出新的支持向量機演算法做了理論準備。 （ 2 ）介紹了超球面支持向量機演算法的思想，以及超球面和超平面的區別。 -
Small sample bias
小樣本偏誤
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