scanning beam 中文意思是什麼
scanning beam
解釋
掃描光線。-
Lc apparatus almost meet all the needs of space optical communication such as weight, size, power consume, life, cost, driving voltage, intergration of optics and electricity, programe, optically take ? over aperture, beam scanning, deflexional range and so on. switches, deflexional facilities and scanning equipments which made with lc have been used in the system of labor in space communication. the only bug of lc apparatus is that their answer speed only get microsecond rate or submicrosecond rate. but it is practical for them to be used in special beam capture, scan, deflexion controling which don ’ t concerned with code rate and code type
液晶器件幾乎滿足空間光通信的所有大的指標要求如重量、尺寸、功耗、壽命、成本、驅動電壓、光電集成、可編程性、光學接收孔徑、光束掃描和偏轉范圍等等。液晶光開關、光偏轉器、光掃描器已經開始應用於光纖通信的實驗系統中。液晶類器件應用於光通信的唯一重大缺陷，是其響應速度目前只能達到微秒級或亞微秒級，不過，在不涉及到碼型碼率的空間光束捕獲、掃描、偏轉、控制方面，液晶器件完全可能進入實用化。 -
In the system, the collimation semiconductor laser - scanned beam scanning two perpendiculars direct of one plane of the measured workpiece at the same time is made. the beams with the dimension information of two perpendiculars direct are processed by the scanning receive system, the high - speed photoelectric transition and electronic data process. two measured results of the diametric directs and ellipse tolerance, etc, parameter, of the turning workpiece on the same plane are obtained by non - contact automatic measurement
在單向激光掃描檢測技術的基礎之上，提出了一種雙向激光掃描檢測系統，其採用激光掃描檢測技術與特殊光學系統相結合，用準直半導體激光掃描光束對被測工件徑向某一截面的兩個相互垂直方向同時掃描，經掃描接收光學系統、高速光電變換、電子學系統和微機數據處理系統，對將攜帶有垂直方向被測量信息的光束進行處理，實現了回轉體工件同一截面兩個垂直方向的徑向尺寸和橢圓度等參數的非接觸自動測量，解決了同時非接觸測量回轉體零件同一截面兩個徑向尺寸的難題，它具有高速，高精度和非接觸自動測量等特點。 -
Ebs electron beam scanning system
電子束掃描系統 -
Acoustical holography by electron - beam scanning
電子束掃描聲全息 -
Abstract : in this paper ， a ray - optics analysis is performed to investigate the asymmetry of dual beam scanning field produced by a rotating polygon. some basic equations of dual beam scan are derived ， such as ， the position vector for the incident point ， the scalar expression for reflected ray ， scan pattern on observation plane ect. the far - field asymmetry of the scanning field has been discussed
文摘:應用幾何光學理論研究了多光束轉鏡掃描場的非對稱性，導出多光束掃描入射點位置矢量、反射線標量表達式、觀察面上的掃描軌跡方程，並研究了掃描遠場的非對稱性。 -
Abstract : this paper describes the procedure required for an image geometric operation. a actual example for converting image of scanning beam form to coreline form is given
文摘:介紹了圖像幾何運算的兩個步驟，並以按水平掃描線排列的數字圖像轉換為按外極線排列的圖像為例，具體闡述了圖像幾何運算的方法。 -
Thirdly, according as the difference of precision, we may short the steps of edge extraction and improve the efficiency of algorithm with dilation algorithm. at last, with felicitical using algorithm of scanning beam, we attain the rigor edge image with texture
2 ）在邊界連接中，根據對實際情況的研究，提出了一種具有通用意義邊界連接演算法3 ）根據精度要求的不同，可以利用膨脹演算法簡化輪廓提取的步驟，以提高演算法的時間效率。 -
Firstly, the complex characteristics of the seal images caused in the process of producing conditions are analyzed. to solve these problems respectively, the circularity clusters and the ostu method are firstly used to realize the shape classification and threshold processing of different seal images. then the image denoise is performed well by scanning beam seed filling and labeling algorithm
論文中首先分析了印鑒圖像由於蓋印條件造成的圖像本身的一些復雜特點，提出了運用圓形度聚類和最大方差比演算法對圖像進行形狀分類和閾值處理，隨后利用掃描線種子填充演算法和貼刪標簽演算法進行噪聲的去除等預處理。 -
As the vital development of the millimeter wave guidance technology, phased array antennas use electrical control scanning beam, which results to faster scanning velocity, more flexible beam control and higher anti - interference ability. thus it can realize target seeking, tracing, guidance at the same time, and can work in the complex and worsening condition
作為毫米波制導技術的一個重要發展方向，相控陣制導技術中的相控陣天線是採用電控方式掃描波束，掃描速度快、波束控制靈活、抗干擾能力強等，可以同時完成目標搜索、跟蹤、引導等多項功能，能工作在日益復雜和惡化的工作環境中。 -
The super resolution effect of sb layer super resolution structure is also investigated with near - field scanning optical microscope. in addition, a rigorous three - dimensional ( 3d ) optical electromagnetic finite - difference time - domain ( fdtd ) model for analysis of a sil system is detailed. in order to accurately analyse sil model, a new method of setting a focused gaussian beam source in fdtd grids is presented
此外，本文還建立了對sil系統光傳輸特性進行模擬的時域有限差分程序，提出一種在fdtd模擬的離散空間設置會聚高斯光源的新方法，並模擬了會聚高斯光束在sil系統中的傳輸，研究了sil在不同離焦情況下底面出射光場幅度及光束半徑的變化規律，為sil存儲系統的優化設計提供了理論依據。 -
In the experiment, we use the he - ne laser and the semiconductor laser as the source, record the bessel beam patterns behind the axicon by using a digital camera and a microscope, measure the radius of the bessel beam central spot by film - scanning and measure the effect of both the radius of the aperture and the open angle of the axicon on the maximum non - diffraction distance. the experiments show that a specific propagating range has constant power and the beam has a bessel - like distribution in this range. the results agree with the beam corresponding to a diffraction free beam
同時我們還採用膠片掃描的方法測量了無衍射光束的中心光斑尺寸，測量了不同光闌孔徑和不同稜角情況下的最大無衍射距離和傳播軸附近橫截面內微小光孔中的光強，實驗結果顯示當激光光束經過軸棱錐轉換後有一段距離功率變化很小，且分佈近似貝塞爾分佈，符合無衍射光束的特性;經過聚焦后，呈現三維分佈中空的光束bottlebeam ，實驗結果與理論分析基本吻合。 -
The phase shifter, as a important component in transmit / receive ( t / r ) module of phased array radar, steer the electronic beam for inertialess scanning
移相器是相控陣雷達發射/接收（ t / r ）組件的重要組成部分，用來控制雷達波束的無慣性電掃描。 -
According to the principle of a new scanning electron microscope and the mechanism of the interaction between electron beam and solid target, the trajectories of an incident electron in a sample are simulated, a simulation program is compiled using the monte carlo method, and the backscattering coefficients corresponding to different parameters of the sem are obtained
摘要根據新型分析掃描電子顯微鏡的工作原理及載能電子束和固體相互作用原理，利用蒙特卡羅方法模擬入射電子和靶物質的相互作用過程，編制了蒙特卡羅模擬計算程序，獲得了對應不同電鏡工作參數的入射電子背散射率。 -
An electron beam, forming a scanning spot on the signal plate, zigzags its way, line by line, across the plate.
在信號板上形成掃描點的電子束，逐條地曲折掃過信號板。 -
The microfissuring behaviors in the heat - affected zone ( haz ) of electron beam ( eb ) welded nickel - based superalloy gh 4133 have been studied by using analytical scanning electron microscopy ( sem )
摘要利用金相分析和掃描電鏡對鎳基高溫合金電子束焊接熱影響區微裂紋行為進行了分析。 -
To receive energy transmitted in a steered beam by any of the three scanning methods, the applied frequency, time, or phase relationships are maintained at each element, which has the effect of making the radar sensitive to energy from the direction of transmission
仍然以每個單元接收通過三種掃描方法? ?頻率，時間，相位關系控制波束發射的能量，這使雷達對發射方向的能量敏感。 -
The results showed that the processing parameters ( such as laser power, the diameter of laser, scanning speed of laser beam, ratio of overlapping ) are important to acquire a perfect component. furthermore, in order to assure geometric properties ( accuracy, surface finish ), the structure of the off - axial powder nozzle was improved to avoid the oxidation of the molten pool. the density metal test sample of rene95 high - temperature alloy was made by lsf through optimizing the processing parameters
本文對激光立體成形的工藝特性進行了深入系統的研究，發現如果要獲得理想的成形效果，就必須對成形過程中的工藝參數進行精密控制，例如激光功率、激光光斑大小、光束掃描速度、搭接率等；同時為了保證成形件有較高的尺寸精度和表面質量，必須對成形零件的氧化問題進行控制，通過改進側向送粉噴嘴的結構設計，成形件的表面氧化問題得到適度控制。 -
The author ? major contributions are as follows. 1. with the performance requirement ( the pattern of the antenna, the rang of scanning angle, the maximal sidelcbe level and the beam ~ vidth ) givcn, a method is presented to determine the basic parameters of a serpentine feed, which includes the distance and ~ vaveguide length bet ~ veeii t ~ vo couplers, the size of the arrays and the number of components
根據天線的工作頻帶、掃描范圍、副瓣電平、半功率寬度等技術指標要求，給出了確定波導慢波線基本結構尺寸的計算公式，即對相鄰單元之間的空間距離、耦合器之間的饋線波導長度、陣列的大小和單元數的計算。 -
Some electro - optical crystals can result in birefringency when they are pressed by electric field, by controlling the intensity of the electric field, we can change the phase of the output optical beam, so the desired scanning direction can be got
它主要是利用某些電光晶體在電場的作用下，可以產生雙折射的原理，通過控制加在光學相控陣中各相控單元兩極間的電場強度，可以改變出射光的相位，從而得到所需角度的掃描。 -
In this paper, the author attempts to discuss two main problems of convolution back projection algorithm basing on fan - beam scanning
本文主要探討了卷積反投影演算法的兩個核心問題：卷積窗函數與內插函數。
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