twyman green interferometer 中文意思是什麼

twyman green interferometer 解釋
特外曼
  • twyman : 特懷曼
  • green : adj 1 綠色的,青色的。2 未成熟的;年青的;無經驗的;易受騙的,天真的。3 未加工的;未處理過的;(...
  • interferometer : n. 【物理學】干涉儀,干擾計。adj. -metric ,-etry n.
  1. This multi - purpose optical metering system had adopted the twyman - green interferometric system as its center, containing an advanced digital wave surface interferometry and a kind of homodyne interferometer displacement testing method with nanometer - sized capacity. at the same time, many wide - applied metering technology, for example, the diffracted field ( fringe ) measurement, co - focal lens system, optical fiber sensors and 4f ( focal distance ) space filter system which can embody the chief principle of fourier optics well, were combined into it successfully. this instrument can firstly offer and show modern optical testing method in the laboratory for majors of information processing, instrument science, measuring and testing technology and automatic technology

    該多功能激光光電實驗系統以泰曼-格林干涉( twyman - green )光路作核心,包括先進的數字波面干涉技術和一種基於空間干涉原理的、納米解析度零差干涉儀位移測量方法,同時將多種新穎、工程實用價值高的測量技術和光路如衍射測量、共焦顯微技術、光纖傳感技術以及反映傅立葉光學基本光學原理的4f空間濾波系統也組合進去。
  2. In order to study the thermal performance and residual stress of microelectronic subassembly, in this paper, a newly optical interferometry method for 3 - d displacement measurement is developed based on wavefront interference theory. in which the moire interferometry provide the in - plane displacement, but the system is different from the conventional interferometry, the system applies the double diffraction of the specimen grating, the in - plane displacement sensitivity is a factor of 2 higher than that of the conventional moire interferometer. twyman / green interferometry method for out - of - plane displacement measurement is adapted, the advantages of the optical set - up are structure novelty, and the fringe patterns of the displacement fields shown high contrast and spatial resolution

    為了詳細研究試件的熱變形特徵以及殘余應力的影響作用,本文在波前干涉理論的基礎上,設計了一新型三維光學測試系統,該系統的平面位移測試基於雲紋干涉方法,但採用與普通雲紋干涉不同的光路系統,利用試件光柵和平面反射鏡組形成的兩次衍射,使平面位移干涉條紋倍增,測量靈敏度是普通雲紋干涉的2倍,系統的離面位移場測試採用泰曼格林干涉光路。
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