x-ray stress analysis 中文意思是什麼

x-ray stress analysis 解釋
射線衍射法
  • x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
  • ray : n 雷〈姓氏，男子名， Raymond 的昵稱〉。n 1 光線，射線，熱線；〈詩〉光輝，閃爍，曙光，一線光明。2 ...
  • stress : n 1 壓力，壓迫，緊迫，緊張。2 【語音】重音；重讀；【詩】揚音；語勢，著重點。3 重要（性），重點，...
  • analysis : n. （pl. -ses ）1. 分解，分析；【數學】解析。2. 梗概，要略。3. 〈美國〉用精神分析法治療（＝ psychoanalysis）。
  1. With the very low water to cement ratio, rpc has ultra - high strength high ductility and low permeability. in this paper, the compressive strength of rpc can reach to a high point with the number approximately 135mpa. as illustrated from the study results, we can approve some fundamental conclusions : there are big effects on rpc with deferent kinds and properties of raw materials and deferent curing conditions ; stress - strain curve shows the process of destroy with rpc samples ; x - ray diffraction analysis indicates that heat treatment at temperatures 90 accelerate the hydration of rpc sharply, therefore, mechanical and microstructural properties of rpc are highly dependent on heat treatment ; it is believed that rpc materials have excellent resistance to chloride permeability ; during the heat treatment, the shrinkage of rpc developed quickly because of chemical reactions ; the rpc with slag mostly has the advantage of rpc without slag about resistance to solutions corrosion

    研究結果表明：通過對rpc各組分摻量變化的研究，可以找到rpc的最優配合比；試件成型后的熱養護制度對rpc的性能影響巨大； rpc的抗壓應力?應變曲線可以反映出試件受破壞時微裂紋的擴展情況，剛纖維的摻入可以大幅改善rpc的韌性； rpc在成型后存在較大的收縮，而其中的化學收縮要遠遠大於乾燥收縮； rpc具有很強的抗氯離子滲透性能，漿體的密實度很高；通過x射線衍射實驗，可以發現rpc的膠凝體中ch晶體已經幾乎不存在，膠凝體主要由c - s - h凝膠和未水化水泥顆粒組成；在抗溶液侵蝕的實驗中，摻礦渣rpc的抗溶液侵蝕性能在絕大多數情況下要好於不摻礦渣試件，酸、堿溶液和浙江工業大學碩士學位論文摘要一些鹽溶液都會對rpc的結構產生侵蝕作用，但是機理各有不同。
  2. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
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