掃式顯影 的英文怎麼說

中文拼音 [sǎoshìxiǎnyǐng]
掃式顯影 英文
brush development
  • : 掃構詞成分。
  • : 名詞1 (樣式) type; style 2 (格式) pattern; form 3 (儀式; 典禮) ceremony; ritual 4 (自然科...
  • : Ⅰ形容詞1 (明顯) apparent; obvious; noticeable; evident 2 (有名聲有權勢的) illustrious and inf...
  • : Ⅰ名詞1 (物體擋住光線后映出的形象) shadow 2 (鏡中、水面等反映出來的物體形象) reflection; image...
  • 顯影 : [攝影學] develop
  1. Multiphasic helical ct imaging revealed multifocal hypovascular nodules predominantly at the periphery of both hepatic lobes with concentric filling of contrast medium and delayed enhancement

    多相螺旋電腦斷層瞄發覺有多顆低血管性小結節主要分佈於左右兩葉肝臟的周邊,並呈現出向心的劑填充及延遲
  2. Different principles and modes of sfm are discussed. the imaging principle of piezoresponse atomic force microscopy, scanning nonlinear dielectric microscopy, kelvin force microscopy are theoretically analysed, and the influence of voltage, contact force and microcantilever on the domain investigation is studied. the parameters of instrument are optimized using the same sample

    探討sfm檢測電疇的不同機理和成像模,從理論上分析了壓電響應原子力微鏡( pfm ) 、描非線性介電微鏡( sndm )和開爾文力微鏡( kfm )檢測電疇的成像原理;實驗研究了電壓、作用力、探針等的改變對電疇成像的響。
  3. Nano - composite nd2fe14b / - fe magnetic material has been prepared by mechanical milling nd2fe14b alloy under ar2 and subsequent crystallization at different temperature. effect of ball milling ( attritor mechanical milling and planetary mechanical milling ) and crystallization technique on structure and magnetic of nanocomposite nd2fe14b alloy has been analyzed by xrd, sem, tem and ppms

    通過x射線衍射( xrd ) 、描電子微鏡( sem ) 、透射電子微鏡( tem )和物理性能測試系統( ppms )著重研究了不同球磨工藝(攪拌球磨與行星球磨)及晶化處理工藝參數對納米復相nd2fe14b合金組織結構和磁體性能的響。
  4. Due to the remarkable difference in hue and the big geometric deformation caused by different imaging conditions in linear ccd push - broom images, a matching method is proposed that is based on the invariant moment of histograms, two - dimension invariant moment of images, and feature weighted gray value window

    針對線陣ccd推遙感立體像因成像條件不同而引起的色調差異著和幾何變形較大的情況,提出一種基於直方圖不變矩、圖像不變矩以及灰度加權窗口三級匹配基元的匹配方案。
  5. The interaction mechanism of atomic force between tip and sample was unveiled more clearly with the analysis of the change regularity of force - distance curve. the theoretical research about the light pressure of laser and the gravity exerting on the micro - cantilever was first conducted in this paper : setting up the interacting model and formula of the light pressure, investigating the effects of these factors on the interaction mechanism of atomic force and the performance of afm, conceiving a method to remove these effects and so on. all of these were the theoretical foundation of developing the new atomic force microscopy and the new type of horizontal afm system

    本文在全面分析描探針微鏡( spm )技術,特別是afm技術的國內外發展歷史、現狀及存在的主要問題的基礎上,進一步揭示了afm的原子力作用機理,著重分析了力?距離曲線的變化規律;對作用在微懸臂上的光壓力和微懸臂本身的重力進行了系統的理論研究和計算分析,建立了激光束對afm微懸臂的光壓作用模型及計算公,考察了這些因素對原子力作用機理及afm性能的響;提出克服或消除這些響的理論構想,為發展新的afm技術、研製新型afm系統提供了重要的理論依據。
  6. The natures of the probe and formation mechanisms in these techniques are different ; therefore, the images of spm can reflect different properties of sample surface. in this work, related properties of ferroelectric thin film were investigated as followed : the main factors determining the image formation of piezoresponse force microscopy ( pfm ) and scanning nonlinear dielectric microscopy ( sndm ) were studied. to avoid the misreading of the same conductive tip with different state, a new method of polarization distribution mapping with nonconductive tip was proposed, and the result of experiment demonstrated that the polarization distribution of ferroelectric thin films could be characterized well by the new approach

    本工作主要分為以下幾個部分:從研究鐵電薄膜的壓電響應力微鏡( pfm )和描非線性介電微鏡( sndm )成像的響因素入手,討論了針尖對成像質量的響;為降低實驗成本、減小導電探針針尖狀態變化對鐵電薄膜微區電性能測試的負面響,提出了以非導電探針檢測微區極性分佈的方法,並在現有spa - 300hv型spm的實驗平臺上以pfm模成功實現了新方法對鐵電薄膜極性分佈的表徵。
  7. The lab is equipped with three confocal microscopes, many with muiltiple lasers, that provide high - resolution imaging of cells and fluorscent markers during recording and stimulation

    本實驗室配置有3臺共軛焦微鏡,多半配有多頻譜雷射瞄的功能,可在研究神經元刺激及記錄實驗時,提供高解析度細胞與偵測螢光染劑表現的功能。
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