晶體測試設備 的英文怎麼說

中文拼音 [jīngtǐcèshìshèbèi]
晶體測試設備 英文
crystal test set
  • 晶 : Ⅰ形容詞（光亮） brilliant; glittering Ⅱ名詞1. （水晶） quartz; （rock） crystal 2. （晶體） any crystalline substance
  • 體 : 體構詞成分。
  • 測 : 動詞1. （測量） survey; fathom; measure 2. （測度; 推測） conjecture; infer
  • 試 : 名詞（古代占卜用的器具） astrolabe
  • 設 : Ⅰ動詞1 （設立; 布置） set up; establish; found 2 （籌劃） work out : 設計陷害 plot a frame up; fr...
  • 備 : Ⅰ動詞1 （具備; 具有） have; be equipped with 2 （準備） prepare; provide with; get ready 3 （防備...
  • 晶體 : [晶體學] crystal; vitrella; crystal body; crystalloid; x-tal
  • 測試 : test; testing; checkout; measurement
  • 設備 : equipment; device; facility; implementor; apparatus; installation; appointment; furnishing; setou...
  1. The company possesses 6 sets of diode cmos chip equipment, producing three - inch 1. 2 million cmos chips per year. there is 3 productive flowing lines in the middle procession and 2 billion diodes were produced yearly. have yiguan machines and discrete machine for test, mimeograph and packing

    公司擁有前道生產二極體晶元設備6套，年產3英寸晶元120萬片中道具有3條生產流水線，年產二極體20億只后道具有測試列印包裝一貫機分立機。
  2. This paper first begin with the connotation of virtual instrument technology, study and discuss the criterion and the working theory of usb deeply. on the principle of usb1. 1criterion, using usb interface chip usbn9604 and low consumption mirochip c8051f231, we designed the available interface of usb bus and its controlling software, turn the communicating function based usb bus between computer and testing device. second based on the developed interface of usb bus, using microchip pic16c62 and a mount of relays, we designed the multiswitching scanner and its controlling software to complete the funtion of accesses swithing in testing system. third calling the api function inside the windows using vb programming language, communicat with the impelling program of selected hid, achieve the function of testing instrument with usb interface, complete the development of upside software faced testing. at last, based on the deep studying of pcb testing method, used the developed multiswithing scanner and software faced testing, combinated with necessary testing instrument, we constructed the pcb testing system and analized the testing result simply

    論文首先從虛擬儀器的技術內涵出發，深入研究和討論了通用串列總線usb規范及工作原理，並依據usb1 . 1規范，採用usb介面晶元usbn9604和低功耗微處理器c8051f231設計開發了通用的usb總線介面及其控制固件，實現了通用計算機與測試設備之間基於usb總線的通信功能；其次，在所開發的usb總線介面的基礎上，使用微處理器pic16c62和多路繼電器開關，設計開發出實現測試系統中測試通道切換功能的多路通道掃描器及其控制固件；再次，採用vb語言編程，調用windows內部api函數，與選定hid類驅動程序進行通信，實現usb總線介面測試儀器功能，完成面向測試的上層軟體開發；最後，在深入研究印刷電路板測試方法的基礎上，利用已開發的多路通道掃描器和面向測試軟體，結合必要測試儀器組建印刷電路板測試系統，並對測試結果進行了簡要的誤差分析。
  3. Crystal test set

    晶體測試設備
  4. Our main products are environmental chambers, on - line reliability evaluation system, burn - in system and lcd processing equipment

    經銷產品主要包括各種模擬環境試驗設備、在線快速可靠性測試評估系統、半導體老化篩選設備、液晶熱處理設備。
  5. It ' s a spr instrument based on angular interrogation, which can fulfill not only wide range but also highly sensitive angular scan. utilizing the principle of virtual instrument, an expandable, easy to use system control and data processing software is presented. micro fluid injection system, spr chips and temperature - controllable flow cell are developed as the accessories of the spr instrument

    它是一種基於高精度機械掃描結構的諧振角調制spr系統，採用先進的虛擬儀器技術以及嵌入式微控制器為主體的儀器；設計、編制了操作簡便、功能完備的信息處理軟體和操作控制軟體；設計和製造了配套的小型流動注入系統、溫控測試池及可批量制備的spr生物傳感晶元等，具有創新性。
  6. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
  7. Quart crystal devices and materials, sensors and materials, resistors, potentiometers, capacitors and ti - srseries ceramics powder, high performance electronic ceramic material and parts, industry furnaces, various electric instruments and specific equipment

    主要產品：石英晶體材料和器件，敏感材料和元器件，電阻器，電容器及鈦鍶系統瓷粉，高性能電子陶瓷材料及結構件，工業窯爐，無線電測試儀器和專用設備。
  8. Focusing on microfluidic chips for biochemical analysis, the research consists of establishing theoretical basis for system design and fabrication, solving key processing problems, developing new techniques, equipment and instrument for bio - mems, and research on microfluidics and micro stereo vision

    以應用於生化分析的微流控晶元為研究對象，建立系統設計與加工理論，解決關鍵工藝技術，開發新工藝、新設備和微系統測試技術，開展微流體輸運和顯微立體視覺研究。
  9. The experimental instruments, apparatus and the means to prepare all the samples are introduced in the first section. in section 2, the experimental system including the oxidization system and diffusion system, are introduced therein. in section 3, the samples preparation including the pre - deposition, redistribution and re - oxidization, the samples of b doping, and the fabrication of ga - diffusion transistor, b - diffusion and the transistor formed by b diffusion following ga diffusion are detailed therein, and the as - prepared samples are analyzed by sims, srp and four point probe

    首先介紹了制備各種樣品所用的實驗儀器、設備與方法；第二節中介紹了實驗系統，包括氧化系統、擴散系統，第三節介紹了樣品的制備，包括ga的預沉積、再分佈、二次氧化樣品，擴硼樣品，以及擴嫁晶體管、擴硼晶體管和擴鐮后再補充擴硼晶體管的制備流程；實驗所得樣品，藉助二次離子質譜（ sims ） 、擴展電阻（ srp ） 、四探針薄層電阻等先進的測試分析方法進行分析。
  10. Measurement of quartz crystal unit parameters - part 8 : test fixture for surface mounted quartz crystal units

    石英晶體元件參數的測量.第8部分:表面安裝的石英晶體元件用試驗設備
  11. Automatic transistor test set

    晶體管自動測試設備
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