次級離子質譜 的英文怎麼說
中文拼音 [cìjílízizhípǔ]
次級離子質譜
英文
secondary ion mass spectrometry- 次 : Ⅰ名詞1 (次序; 等第) order; sequence 2 [書面語] (出外遠行時停留的處所) stopping place on a jou...
- 級 : Ⅰ名詞1 (等級) level; rank; grade 2 (年級) any of the yearly divisions of a school course; gra...
- 離 : Ⅰ動詞1 (離開) leave; part from; be away from; separate 2 (背離) go against 3 (缺少) dispens...
- 子 : 子Ⅰ名詞1 (兒子) son 2 (人的通稱) person 3 (古代特指有學問的男人) ancient title of respect f...
- 質 : Ⅰ名詞1 (性質; 本質) nature; character; essence 2 (質量) quality 3 (物質) matter; substance;...
- 譜 : Ⅰ名詞[書面語]1 (按類別或系統編成的書或冊子等) table; chart; register 2 (指導練習的格式或圖形)...
- 次級 : secondary
- 離子 : [物理學] ion
-
By sims method, we analyzed the profile distribution of mn and c, found that increasing the annealing temperature is beneficial to the diffusion of mn, but has no influence to c. mfm and squid measurements demonstrate that sub micron single - domain magnetic mnas particles found in sample annealing at 850 for 15s show ferromagnetism at room temperature and have a high curie temperature more than 300k
利用二次離子質譜方法對mn和c在樣品中的分佈進行了研究,發現退火溫度的上升,有利於mn的擴散;而對c的分佈影響較小。利用磁力顯微鏡和超導量子干涉儀對樣品的磁性質進行了研究。發現在850 + 15s退火處理的樣品中形成了亞微米級單疇磁性mnas粒子;經測試其在室溫下呈現出鐵磁性,居里溫度在300k以上。Surface chemical analysis - secondary - ion mass spectrometry - determination of relative sensitivity factors from ion - implanted reference materials
表面化學分析.次級離子質譜法.測定離子注入標樣的相對靈敏系數Sims measuring widths of interfaces in sputter depth profiling using sims
用次級離子質譜法Surface chemical analysis - secondary ion mass spectrometry - determination of boron atomic concentration in silicon using uniformly doped materials
表面化學分析.次級離子質譜法.利用均勻摻雜材料測定硅中硼原子濃度Surface chemical analysis - secondary - ion mass spectrometry - method for estimating depth resolution parameters with multiple delta - layer reference materials
表面化學分析.次級離子質譜法.多層標準材料深度溶解參數的估算方法Surface chemical analysis - secondary - ion mass spectrometry - determination of boron atomic concentration in silicon using uniformly doped materials
表面化學分析.次級離子質光譜測定法.採用均勻塗料的硅中硼原子濃度測定The instrument directs the secondary ions to a mass spectrometer that identifies their compositions
儀器會將次級離子導向質譜儀,以?定其組成。分享友人