溶失量測定 的英文怎麼說

中文拼音 [róngshīliángcèdìng]
溶失量測定 英文
loss by solution test
  • 溶 : 動詞（溶化; 溶解） dissolve
  • 量 : 量動1. （度量） measure 2. （估量） estimate; size up
  • 測 : 動詞1. （測量） survey; fathom; measure 2. （測度; 推測） conjecture; infer
  • 定 : Ⅰ形容詞1 （平靜; 穩定） calm; stable 2 （已經確定的; 不改變的） fixed; settled; established Ⅱ動詞...
  • 測定 : determine; determination; setting-out; admeasurement; assignment; assay; finding
  1. Instant coffee. determination of loss in mass at 70 degrees under reduced pressure

    速溶咖啡.減壓后70時質量損失的測定
  2. Aluminium and aluminium alloys - anodizing - assessment of quality of sealed anodic oxidation coatings by measurement of the loss of mass after immersion in phosphoric acid chromic acid solution with prior acid treatment

    鋁和鋁合金.陽極氧化.測定預先酸處理的浸入磷酸鉻酸溶液后質量損失評估密封陽極氧化鍍層質量
  3. Aluminium and aluminium alloys - anodizing - assessment of quality of sealed anodic oxidation coatings by measurement of the loss of mass after immersion in phosphoric acid chromic acid solution without prior acid treatment

    鋁和鋁合金.陽極氧化.測定未預先酸處理的浸入磷酸鉻酸溶液后質量損失以評估密封陽極氧化鍍層質量
  4. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
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