激發態壽命 的英文怎麼說
中文拼音 [jīfātàishòumìng]
激發態壽命
英文
lifetime of excited state-
For micro - cavity semiconductor laser, station model is proposed in this paper and its steady - state and instantaneous characteristics when the coupling efficiency of spontaneous emission into a lasing mode is equal to 1 are analysised. for current noise, sp noise, noise, p noise, as well as current modulation, sp modulation, modulation and p modulation, using small - signal approximation, we derive the laser ' s corresponding transfer functions. and we calculate their signal - to - noise ratio ( snr ) gain in various parameters through frequency domain analysis in the premiss of large input snr
本文對于微腔半導體激光器,提出站模型,能夠較直觀簡潔地分析微腔半導體激光器的穩態和瞬態特性,利用此模型對具有重要實用價值的= 1的微腔半導體激光器進行了討論;對于電流i噪聲、自發發射壽命_ ( sp )噪聲、自發發射因子噪聲、光子壽命_ p噪聲,以及電流調制、 _ ( sp )調制、調制、 _ p調制,在小信號近似下,得到了相應的激光器的傳遞函數;在大信噪比的前提下,對激光器進行了頻域分析,分別計算了它們在不同參數下的信噪比增益,分析了其抗噪聲性能。By using the multi - configuration dirac - fock ( mcdf ) method, the effects of relaxation and correlation on the transition energies and probabilities of electric - dipole allowed ( el ) resonance and intercombination transitions for 2p53s3 - 2p6 in neutral neon have been systematically studied firstly. and the results of the transition energies and probabilities ( lifetimes ) in length and velocity gauge have been presented. during the calculation, in order to consider the rearrangement effects of the bound - state density and some important correlations, the asfs of transition initial - and final - states were divided according to their angular - momentum and parity and calculated, and different number of csfs were included in the expansion of asfs
本文利用多組態dirac - fork ( mcdf )理論方法,通過對輻射躍遷初、末態電子波函數的獨立計算以及在原子態波函數的展開中考慮不同數量的組態波函數,系統地研究了弛豫和相關效應對中性ne原子2p ~ 53s ~ ( 1 . 3 ) p _ 1 ~ o - 2p ~ 6 ~ 1s _ 0電偶極共振和復合躍遷的能量以及躍遷幾率的影響,給出了長度和速度兩種不同規范下激發態的能量和輻射壽命;以中性ne原子的研究為基礎,進一步研究了類ne等電子系列離子( z = 11 - 18 )較低的激發組態2p ~ 53s和基組態2p ~ 6的能級結構以及各能級間的輻射躍遷特性。But up to now, there is no direct experimental measurement result about the reduced transition probability of the first excitation state of 64cu and only one experiment which had measured the lifetime of low - lying excitation state of 64cu
但直到現在,有關『 ll第一激發態ba )值無直接的實驗測量結果,僅有一個實驗測量了刷cll第一激發態的能級壽命,該實驗通過『 i … , ny )反應布居『 u的激發態,通過脈沖質子束流(脈沖寬度0The experiment populated the excitation state of 64cu via 64ni ( p, ny ) 64cu * reaction and the lifetime of low - lying excitation state of 64cu were determined via the delayed coincidence method between pulse proton beam and de - excitation y rays detected by ge ( li ) detector
Sns )與ge ( l )探測器測量退激y射線延遲符合的方法,由時間譜tof峰的中值移動的方法來確定激發態壽命。Photoluminescence characteristics of four hemicyanine derivatives with similar molecular compositions but different donor - acceptor groups in langmuir - blodgett ( lb ) films have been studied by steady state and time - resolved fluorescence spectroscopies. the study mainly include the aggregation behavior of hemicyanine derivatives in lb films, the influence of the donor - acceptor on the excited level and excited lifetime of the hemicyenine derivatives
通過改變半花菁的親水基團與疏水基團而得到了四種半花菁衍生物,利用穩態和時間分辨熒光研究了不同親水基團與疏水基團對半花菁衍生物光學特性的影響.主要包括半花菁衍生物在lb膜中的聚集特性,親水基團與疏水基團對半花菁衍生物激發態壽命的影響等In practical application, the m10 180 bolts, which are installed in the head cover of the torque divider of ts5560 special automobile, sometimes fracture all of a sudden. according to the tests of acceleration, stress and strain, and the exciting test, it is resonance vibration that leads to the compound - bending fatigue fracture of the bolts. the exciting force caused by drive system, transmitted through the torque divider, produces a 1000 - 1500hz cyclical excitation at the junction of the bolts and head cover, which causes the first order bending resonance vibration of the bolts
通過加速度、應力應變測試實驗和激振試驗的研究,發現ts5560特種車分動器取力器氣缸端蓋m10 180螺栓斷裂問題是由於共振引起的雙向彎曲疲勞斷裂:傳動系統工作所產生的激勵,經過分動器結構的傳遞(特別是分動器一階扭轉模態的放大) ,在螺栓的連接處產生1000 1500hz的振動激勵,其導致螺栓一階彎曲共振,在螺栓一階彎曲模態的阻尼比較小的情況下,使得螺栓產生較大的共振響應,導致螺紋處的彎曲動應力較大,疲勞壽命較低。Because the routine test method could not meet the requirement of modern devices, the author put forward a new test method called temperature ramp measurement ( trm ). by this method, we can observe dynamically the whole process of devices " degradation, so the estimation value of life and failure active energy can be extracted accurately
針對目前常規評價方法不能適應當前微電子器件快速發展的需求,提出了恆定電應力的溫度斜坡法(簡稱trm法) ,動態觀察和分析器件退化的全過程,應用此方法給出了實驗樣品的失效激活能和壽命預測值,並與常規方法進行了比較,得到了比較一致的結果。分享友人