熒光薄膜技術 的英文怎麼說

中文拼音 [yíngguāngbómójìshù]
熒光薄膜技術 英文
fluorescen film techniquet
  • 熒 : 形容詞[書面語]1. （光亮微弱的樣子） glimmering 2. （眼光迷亂; 疑惑） dazzled; perplexed
  • 光 : Ⅰ名詞1 （照耀在物體上、使人能看見物體的一種物質） light; ray 2 （景物） scenery 3 （光彩; 榮譽） ...
  • 薄 : 名詞[方言] （浮萍） duckweed
  • 膜 : 名詞1. [生物學] （像薄皮的組織） membrane 2. （像膜的薄皮） film; thin coating
  • 技 : 名詞（技能; 本領） skill; ability; trick; technique
  • 術 : 術名詞1. （技藝; 技術; 學術） art; skill; technique 2. （方法; 策略） method; tactics 3. （姓氏） a surname
  • 薄膜 : thin film; film; diaphragm
  1. This demonstrates the feasibility of using grazing emission x - ray fluorescence spectroscopy as a method of studying the thin layer ' s characteristics, such as composition and thickiness etc. with the intimately combining of theoretical, set - up and experimental research, the study on the analysis techniques of grazing emission x - ray fluorescence is developed, and the first set of grazing emission x - ray fluorescence setup is established. at the same time, the angular dependence of the fluorescence intensity with different thickness layer is measured. all the work in this thesis provides the basis for the further researches

    本論文採用理論、裝置和實驗研究密切結合的方式，開展了掠射x射線熒光分析技術研究工作，在國內建立了首臺掠出射x射線熒光光譜分析裝置，並對不同厚度單層和雙層薄膜樣品在掠出射條件下產生的熒光光強與掠射角的對應博士學位論文:掠射x射線熒光分析技術研究關系進行了實驗測定。
  2. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
  3. In this paper, organic small molecules and polymer films were prepared via electrostatic self - assembled method and spin - coating method. the characteristics of films are examined by uv - vis, pl, xps, raman and so on. and some theories are investigated with respect to organic molecules and polyionic deposition on solid surface and the photoelectric characteristics of organic ultrothin films

    採用紫外-可見光吸收光譜、熒光光譜、 x射線光電子能譜、拉曼光譜及低角度x射線衍射光譜等技術手段對有機材料及薄膜進行表徵和性能測試，分析了有機分子、聚離子在固體表面成膜性能以及有機超薄膜結構的光電特性等。
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