石英光譜儀 的英文怎麼說
中文拼音 [dànyīngguāngpǔyí]
石英光譜儀
英文
quartz spectrograph- 石 : 石量詞(容量單位, 十斗為一石) dan, a unit of dry measure for grain (= l00 sheng)
- 英 : 名詞1 [書面語] (花) flower 2 (才能或智慧過人的人) hero; outstanding person 3 (英國) britain...
- 光 : Ⅰ名詞1 (照耀在物體上、使人能看見物體的一種物質) light; ray 2 (景物) scenery 3 (光彩; 榮譽) ...
- 譜 : Ⅰ名詞[書面語]1 (按類別或系統編成的書或冊子等) table; chart; register 2 (指導練習的格式或圖形)...
- 儀 : 名詞1 (人的外表) appearance; bearing 2 (禮節; 儀式) ceremony; rite 3 (禮物)present; gift 4 ...
- 石英 : quartz; silici-; 石英電子手錶 crystal-oscillator watch; [鐘] quartzcrystal watch
-
The transmittance and reflectance spectra of bn films were obtained as a function of incident photon wavelengths, and the thickness of films was measured by alpha - step meter
用紫外-可見分光光度計測量了沉積在石英片上的bn薄膜的透射光譜和反射光譜,用臺階儀測量薄膜的厚度。Either the boron nitride ( bn ) thin films with different cubic phase content were deposited on n - type si ( 111 ) and fused silica substrates by radio frequency ( rf ) sputtering using two - stage deposition process. the films were characterized by fourier transform infrared ( ftir ) spectroscopy. the transmittance te ( ) and reflectance re ( ) were obtained as a function of incident photo wavelengths and the thickness of films was measured by alpha - step. the absorption coefficient was calculated from te ( ) and re ( ). the optical band gap ( eg ) of the films was determined by effective medium form of formula containing eg
本文還研究了立方相含量與光學帶隙的關系,在n型si ( 111 )片和熔融石英片上沉積出不同體積分數的立方氮化硼薄膜,薄膜的成分由傅立葉紅外吸收譜標識;用紫外-可見分光光度計測量了沉積在石英片上的bn薄膜的透射光譜te ( )和反射光譜re ( ) ,薄膜的厚度用臺階儀測得。And then, zno thin films were synthesize on quartz and silicon substrates by sol - gel dip - coating and spin - coating. the properties of the films and the effects of growth parameters on the quality of zno films were studied using x - ray diffraction, optical absorption, photoluminescence techniques, etc. to modify the energy gap of the zno, mg2 + was added in the sol - gel solution, and mgxzn1 - xo films were prepared by the same method as that for zno films
利用溶膠凝膠法成功地在石英玻璃和單晶矽片等襯底上制備出了c軸擇優取向的zno薄膜,並利用x射線衍射儀、紫外-可見光光譜儀、熒光光譜儀等對zno薄膜的結構和性能進行了測試、分析,並研究了熱處理參數等條件對zno薄膜性能的影響。
分享友人