等速電透分析 的英文怎麼說
中文拼音 [děngsùdiàntòufēnxī]
等速電透分析
英文
analytical isotachophoresis- 等 : Ⅰ量詞1 (等級) class; grade; rank 2 (種; 類) kind; sort; type Ⅱ形容詞(程度或數量上相同) equa...
- 速 : Ⅰ形容詞(迅速; 快) fast; rapid; quick; speedy Ⅱ名詞1 (速度) speed; velocity 2 (姓氏) a surna...
- 電 : Ⅰ名詞1 (有電荷存在和電荷變化的現象) electricity 2 (電報) telegram; cable Ⅱ動詞1 (觸電) give...
- 透 : Ⅰ動詞1 (滲透; 穿透) penetrate; pass [seep] through 2 (暗地裡告訴) tell secretly; let out; lea...
- 分 : 分Ⅰ名詞1. (成分) component 2. (職責和權利的限度) what is within one's duty or rights Ⅱ同 「份」Ⅲ動詞[書面語] (料想) judge
- 析 : Ⅰ動詞1. (分開; 散開) divide; separate 2. (分析) analyse; dissect; resolve Ⅱ名詞(姓氏) a surname
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The paper mainly focused on the beam transport part of asipp key laboratory of ion beam bioengineering and it ' s component elements, for example, van de graff accelerator, bending magnet, magnetic quadruple lenses, beam shutter, collimator and so on. the laboratory has performed the milestone achievement that is beam passed the hole of lo ^ m diameter in experiments. many experimental results are discussed by theories according to experiments
本文重點討論了中科院離子束生物工程學重點實驗室單粒子束裝置的束流傳輸部分,對主要部件進行了詳細的討論,如:靜電加速器、偏轉磁鐵、磁四極透鏡、束線開關、瞄準器等,實驗中已取得束流穿過10 m小孔的標志性成果,並運用相關理論結合具體實驗分析了實驗結果。Uniform and compact plzt and sno _ 2 ceramic targets, which diameter were 212mm and 221mm, respectively, had been successfully fabricated. ( 2 ) a rotating magnetic field rf magnetron sputtering system had been designed and set up, which showed high utilization efficiency of target, high films uniformity, and high deposition rate, etc. ( 3 ) the plzt and sno _ 2 thin films were investigated by afm, xrd, sem, and spectral photometer. the optimized processing parameters of preparing these films had been found
並以此為基礎分別制備了緻密、均勻、平整、直徑為212mm的plzt和221mm的sno _ 2陶瓷濺射靶材; ( 2 )為克服現有磁控濺射設備的不足,提出了一種新的磁控濺射方案,採用該方案的設備具有:靶材利用率高、鍍膜均勻、成膜速度快等特點; ( 3 )運用afm 、 xrd 、 sem以及雙光路分光光度計等分析手段對plzt和sno _ 2薄膜的微結構和性能進行研究,找到了制備plzt電光薄膜和sno2透明電極材料的最佳工藝條件。In simulations, all important phenomena, such as non - neutral sheath widening near cathode, cathode electron emitting, current channel migrating to the load side of the plasma, ion accelerating toward cathode and magnetic insulation of cathode emitting electrons etc, have been observed and depict the internal physics of this device. also presented is the influence of cathode emitted electrons on phenomena in the conduction processes of pegs. the simulation results show, without cathode emitted electrons, rapid magnetic field penetration takes place only in region near the cathode, with cathode emitted electrons, magnetic field penetration takes place in all plasma region
診斷發現了陰極表面非中性鞘層的形成、陰極電子發射、電流通道的漂移、等離子體離子加速以及陰極電子磁隔離等物理現象,揭示了這一斷路器件的物理機制;分析了陰極電子對peos導通過程中的物理現象的影響,模擬結果顯示:忽略陰極電子作用,磁場滲透現象主要出現在陰極表面區域,考慮陰極電子作用,磁場滲透現象出現在整個等離子體區域。Prepared technical parameters were optimized by l9 ( 34 ) experiment analysis. a unique method for cleaning and drying of substrate - cleaning used by scour, drying used by infrared light was fished out by large numbers of experiment. chemical mechnism of zno thin film prepared by sol - gel technique was discussed by dta for the first time. by the measurements of sem, xrd and uvs, the thin film was analysed. the result proved that the thin film with strongly preferred orientation of c - axis perpendicular to the substrate surface which surface was homogenous, dense and crackfree was the crystalline phase of hexagonal wurtzite. the thin film was composed of plentiful asteroidal crystal which crystal dimension approximately 10 30nm. the average transmittance of thin film in visible region was above 90 %. the results of measurements else also proved that the thickness of single dip - coating was 75 240nm, this films resistivity was found to be 3. 105 102 3. 96 105 ? cm. the thickness and resistivity of thin film influenced by dope - content, withdrawal speed, pre - heat - treatment, anealing were reseached respectively
利用xrd 、 sem以及uvs光譜儀等分析方法對薄膜進行了研究,結果顯示,所制備的薄膜為六方纖鋅礦型結構,具有高c軸擇優取向性;表面均勻、緻密,薄膜材料由許多星狀晶粒組成,晶粒尺寸大約為10 - 30nm左右;薄膜可見光透過率平均可達90 % ;對薄膜厚度以及電學性能進行了測定后發現:單次鍍膜厚度約為75 - 240nm , al ~ ( 3 + )離子摻雜型氧化鋅薄膜的電阻率在3 . 015 102 - 3 . 96 103 ? cm范圍內;分別研究了摻雜濃度、提拉速度、預燒溫度、退火溫度等工藝參數對薄膜厚度和電阻率的影響。分享友人