薄片試樣 的英文怎麼說
中文拼音 [bópiānshìyàng]
薄片試樣
英文
napkin-
Standard test methods for sampling and testing of flaked aluminum powders and pastes
薄片鋁粉和糊料的抽樣和試驗的標準試驗方法2. we make the diamond thin film by mpcvd on the mo substrate. considering the experiment conditions we do the same work on the samples, which are get by the step 1, then we test the thin film field emission properties 3
2 .用mpcvd在mo片上進行生長金剛石薄膜的實驗，並參考相應的實驗參數在1得到的樣品基礎上生長出金剛石薄膜，並測試了該薄膜的場發射特性。At present, the problem in testing sheet resistance for micro - areas is that probes must be set up at the suitable locations by handwork. in order to know the wafer ' s impurity distributing, we need test many times, so will waste a lot of time. if the wafer ' s diameter would be 300mm, this problem will be more serious. in this paper, image analysis is introduced, through pre - processing and edge picking - up, the probe tips are recognized. then probe tips will be aligned respectively in two perpendicular directions through driving stepper motors. thus the distribution of sheet resistance for whole wafer is got by automatic testing and it offers information for detecting the impurity distribution and the diffusion uniformity
這樣，完成200mm （ 8時）圓片雜質的擴散分佈需要對許多圖形進行測試，需要花費很長的時間，當測試300mm矽片時問題就更為突出。本文將圖象與視覺測量系統引入四探針測試系統中，對採集到的原始探針圖像進行預處理、邊緣提取等操作，以便實現探針針尖的識別，然後由電機控制實現探針的自動定位。這樣測試系統可以自動獲得全片的薄層電阻分佈，為超大規模集成電路檢測雜質分佈和擴散的均勻性提供信息。
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