薄膜系數 的英文怎麼說
中文拼音 [bómóxìshǔ]
薄膜系數
英文
film coefficient-
It is found that the ca ( no3 ) 2 - po ( oh ) x ( oet ) 3 - x - c2h5oh system with cf3cooh added gives out much gas during heat - treatment which will result in films with many c
Fha薄膜較純ha薄膜有較好的與基板的結合強度,這得益於兩方面:一方面fha熱膨脹系數較ha小,與When an oxidizing plasma is run in a system coated with fluorocarbon film, a substantial quantity of f atoms is released in the plasma.
當氧氣等離子體在覆蓋有氟碳薄膜的系統中起輝時,就會有相當數量的F原子在等離子體中釋放。It was concluded that, the structure of ito thin films were influenced by many working parameters such as substrate temperature, oxygenous pressure and substrate and so on. it was indicated by sem spectra of zno thin films that the surface of the sample was leveled off, and the crystals were felsitic
結果表明,對于ito薄膜,薄膜的光電性能薄膜結構的擇優取向性和與襯底溫度、濺射氧氣壓等工藝參數有很大關系, ito薄膜的sem表明,樣品表面較平整,且晶粒也比較緻密。While successfully used in measuring the thermal properties of solid material, such as bulk samples and thin films, 3 method is seldom applied to the fluid
摘要3法已成功應用於體態、薄膜等材料導熱系數的測量,但還很少應用於流體領域。Carboxy ion ( cooh " ) was performed at an energy of sokev with fluences ranging from ixlo14 to ixlo15 ions / cm2 at room temperature
Cn薄膜的摩擦系數更低,具有更光滑的表面是主要原因。It is found that the relation between the melting temperature and the cohesive energy of bulk materials can be used to nanomaterials, but the coefficient depends on the height of nanofilms
研究表明,塊體材料熔化溫度與結合能的關系式在納米薄膜體系仍然成立,但比例系數是一個依賴于薄膜厚度的參量。In the theoretical description of grazing emission fluorescence, the mode of fluorescence intensity emitted from layered materials dependence of grazing angle is established by applying asymptotic approximations to double fourier integrals, and the theoretic calculation formula of fluorescence intensity from a thin layer is derived. by the derived expressions, the theoretic simulation curves of several thin layers on si substrate are calculated. in the experimental setup, the requirement of construction of the setup and some important parameters are brought forward
最後,利用平穩位相方法建立了掠出射情況下薄層樣品產生的熒光強度和掠出射角的對應關系數學模型,推導了薄層樣品熒光強度理論計算公式,並以此為依據模擬計算得出了cr 、 fe 、 ti和ni等幾種以si作基底的單層薄膜樣品的熒光強度隨掠出射角變化的理論曲線。We discussed the effects of several variables in the experiment on the orientation of the films. the orientation mechanism of the bn films was also probed
1首次對hbn薄膜的取向生長進行了系統的研究,討論了幾種實驗參數對取向的影響,探討了薄膜取向生長機制。The relationship between crystal face index and film quality in single crystal diamond film
單晶金剛石膜中晶面指數與薄膜品質的關系Measurement of the electric - optic index of thin films by using modulated ellipsometry
利用調制式橢偏儀測量薄膜電光系數Due to good chemical stability and electrical resistivity, high thermal conductivity and mechanical intensity, wide band gap and low thermal expansion coefficient, aln thin films can be applied for insulating chips for semiconductor devices with high power, thermal dissipation lagers for large and super - large scale integrated circuits, insulating layers or passivation layers for semiconductor
超薄鋁膜由於其特殊的的光學性質,在光學多層膜上有廣泛應用。氮化鋁薄膜化學穩定性高、熱傳導率高、機械強度高、電絕緣性能佳、高能隙、熱膨脹系數低,光學特性優良,可以用作大功率的紫外光學器件的散熱材料。We research on the thermal buckling characteristics of double layer membrane which is composed of different materials with different thermal expansion coefficiens under uniform temperature elevation. the energy method is proposed which is used to solve the problem and the symbolic relation between central buckling height and substrate height under small buckling height is also given. it is the primary theory of membrane resonant sensor, which makes the research and development of novel thermal sensor possible
本文對微機械中熱脹系數不同的材料構成的雙層復合薄板在均勻溫升下的撓曲特性進行了研究,提出了在均勻溫升下雙層薄板熱撓曲求解的能量法,並給出了小撓度下中心撓度與板厚的解析關系,為薄膜諧振式傳感器溫度特性的研究和新型溫度傳感器的設計與開發打下了基礎To achieve accurate detection of surface potential, the measurement of the contact potential difference of the zno / si step was also carried out. polarization - related surface properties of ferroelectric thin films were investigated by kelvin probe force microscopy ( kpfm ), leading to the discovery of asymmetric charge writing on the surface of pb ( zr _ ( 0. 55 ) ti _ ( 0. 45 ) ) o _ 3 ( pzt ) thin film
為了優化儀器的檢測靈敏度和穩定性,選用氧化鋅薄膜上的zno / si臺階作為測試對象,檢測了zno / si的接觸電勢差;通過改變儀器系統參數,發現針尖-樣品距離和掃描速度對接觸電勢差的檢測結果影響顯著。It is found that the pyroelectric coefficient and susceptibility increase with the decrease of the magnitude of the long - range interaction and the interfacial coupling when the temperature is lower than the phase transition temperature
我們發現,在相變溫度以下,隨著雙層薄膜的界面耦合的減弱,鐵電雙層薄膜的熱電系數和介電極化率增加。We also find that the strong long - range interaction, the large transverse field and weak interfacial coupling can lead to the disappearance of some of the peaks of the pyroelectric coefficient and susceptibility of the ferroelectric bilayer. we believe that it is the reason why these phenomena always take place in the experimental studies
我們還發現,較強的長程相互作用,較大的橫場以及相對較弱的界面耦合作用將會導致鐵電雙層薄膜的熱電系數和介電極化率的某些峰消失,這可以用來解釋在實驗中常常觀測不到熱釋電系數和介電極化率的某些峰值的原因。In the framework of the long - range interaction, we study the interfacial effects on the pyroelectric and dielectric susceptibility of a ferroelectric bilayer for the first time. we find that the quantum effect can lead to the disappearance of some of the peaks of the pyroelectric and susceptibility of the bilayer
我們首次在長程相互作用的框架內,考察了界面對雙層膜的熱電、介電等物理性質的影響,且量子效應的增強會導致鐵電雙層薄膜的熱電系數和介電極化率的某些峰的消失。The sto, ybco and sto / ybco thin films were deposited on laalo3 ( 001 ) ( lao ) substrate by pulsed laser deposition ( pld ). the effects of deposition parameters, such as the substrate temperature, the of target - substrate distance, laser energy density, on the properties of the thin fillms were systematically studied. the surface morphology of the thin films was investigated by atomic force microscopy ( afm ) and scanning electron microscopy ( sem )
採用脈沖激光沉積技術在laalo3 ( 001 ) ( lao )基片上生長ybco 、 sto以及sto / ybco集成薄膜,系統研究了基片溫度、基片表面狀態、氧分壓、激光能量密度、脈沖重復頻率等工藝參數對薄膜表面性能、結晶情況的影響,優化了ybco 、 sto薄膜生長的工藝參數,運用afm 、 sem 、 xrd等分析手段表徵薄膜的微觀性能,分析結果表明:薄膜表面平整、結晶良好、 c軸織構。Then, we infer the thin film system reflection or the transmittance mathematics value formula and the characteristic matrix representation formula from the maxwell ’ s equations and the suitable boundary condition. we study the automatic design problem of optical thin film
在此基礎上從麥克斯韋方程組和適當的邊界條件出發,推導出了薄膜系統的反射或透射率的數學數值計算公式和特徵矩陣計算公式。In order to otain high quality zno thin films, we, for the first time, employ the plasma enhanced chemical vapor deposition ( pecvd ) to prepare high quality zno thin film at low temperature using a zinc organic source ( zn ( c2h5 ) 2 ) and carbon dioxide ( co2 ) gas mixtures. the effects of the growing condiction and the native oxide layer of si substrate on the quality of zno thin films was studied in detail. to prepare p - zno and overcome the dufficulty of reverse due to the interaction between the n atomic, we obtain high qulaity p - zno by a easy way of thermal zn3n2
為了在低溫下制備高質量的氧化鋅薄膜,我們採用金屬有機源和二氧化碳氣源,首次利用等離子體增強化學氣相沉積的技術在低溫下制備了高質量的氧化鋅薄膜,系統地研究了生長條件以及襯底表面氧化層對薄膜質量的影響,確定了生長高質量氧化鋅薄膜的優化條件;為獲得p - zno材料,克服在zno中摻n雜質間相互作用影響摻雜效率不易獲得p - zno的困難,我們通過熱氧化zn3n2的方法制備了p - zno ,獲得了一系列研究結果: 1 、詳細研究了氣體流速比,襯底溫度和射頻功率實驗參數對氧化鋅薄膜特性的影響。A set of calculation softwares was programmed by simulated annealing algorithm. these softwares can find the best solution without being given initial values but region of convergence, and have a lot of advantages such as fast convergence, good stability and high accuracy
根據模擬退火演算法編制的一系列計算軟體能在大面積內快速搜索,無須給定初始值,只要給定收斂區間,就能對可疑的點進行逐次逼近,直至搜索到一組最佳的薄膜參數值。分享友人