選區電子衍射 的英文怎麼說

中文拼音 [xuǎndiànziyǎnshè]
選區電子衍射 英文
selected area diffraction
  • : Ⅰ動詞1. (挑選) select; choose; pick 2. (選舉) elect Ⅱ名詞(挑選出來編在一起的作品) selections; anthology
  • : 區名詞(姓氏) a surname
  • : Ⅰ名詞1 (有電荷存在和電荷變化的現象) electricity 2 (電報) telegram; cable Ⅱ動詞1 (觸電) give...
  • : 子Ⅰ名詞1 (兒子) son 2 (人的通稱) person 3 (古代特指有學問的男人) ancient title of respect f...
  • : [書面語]Ⅰ動詞(開展; 發揮) spread out; develop; amplifyⅡ形容詞(多餘) redundant; superfluousⅢ名...
  • : Ⅰ動詞1 (用推力或彈力送出) shoot; fire 2 (液體受到壓力迅速擠出) discharge in a jet 3 (放出) ...
  • 選區 : electoral [election] district; selection precinct; electoral ward; constituency
  • 電子 : [物理學] [電學] electron
  1. Using the microwave selective heating property for materials, by setup equivalent equation, and first time inducing the electromagnetic field perturbation theory to the design of heating materials for substrate in mpcvd, three temperature distribution modes were established, including temperature distribution comprehensive mode of inhomogeneous plasma, temperature distribution composite mode of composite substrate materials, temperature distribution perturbation mode of composite materials, which ii provided an whole new technology route to the design of substrate heating system in mpcvd and guided the preparation of heating materials for substrate. and then the heating materials for substrate were designed and optimized to obtain large area homogeneous temperature distribution even larger than substrate holder ' s diameter. as an important part, this thesis researched the nucleation and growth of diamond films in mpcvd, systematically researched the effects of substrate pretreatment, methane concentration, deposition pressure and substrate temperature etc experimental technologic parameters on diamond films " quality on ( 100 ) single crystal silicon substrate in the process of mpcvd, characterized the films qualities in laser raman spectra ( raman ), x - ray diffraction ( xrd ), scanning electron microscopy ( sem ), infrared transmission spectra ( ir ), atomic force microscopy ( afm ), determined the optimum parameters for mpcvd high quality diamond in the mpcvd - 4 mode system

    該系統可通過沉積參數的精確控制,以控制沉積過程,減少金剛石膜生長過程中的缺陷,並採用光纖光譜儀檢測分析等離體的可見光光譜以監測微波等離體化學氣相沉積過程;利用微波對材料的擇加熱特性,通過構造等效方程,並首次將磁場攝動理論引入到mpcvd的基片加熱材料的設計中,建立了非均勻等離體溫度場綜合模型、復合介質基片材料的復合溫度場模型及復合介質材料溫度場攝動模型,為mpcvd的基片加熱系統設計提供了一條全新的技術路線以指導基片加熱材料的制備,並對基片加熱材料進行了設計和優,以獲取大面積均勻的溫度場,甚至獲得大於基片臺尺寸的均勻溫度;作為研究重點之一,開展了微波等離體化學氣相沉積金剛石的成核與生長研究,系統地研究了在( 100 )單晶硅基片上mpcvd沉積金剛石膜的實驗過程中,基片預處理、甲烷濃度、沉積氣壓、基體溫度等不同實驗工藝參數對金剛石薄膜質量的影響,分別用raman光譜、 x( xrd ) 、掃描鏡( sem ) 、紅外透光譜( ir ) 、原力顯微鏡( afm )對薄膜進行了表徵,確立了該系統上mpcvd金剛石膜的最佳的實驗工藝參數。
  2. Selected area electron diffraction image

    選區電子衍射
  3. Method of selected area electron diffraction for transmission electron microscopes

    顯微鏡選區電子衍射分析方法
  4. Saed ( selected area electron diffraction ), hrem ( high resolution electron microscopy ) and eds ( energy dispersive spectrum ) experiments confirmed that both the porous layer and lamellar layer are composed of nano - crystalline ha ( hydroxyapatite )

    實驗中採用了選區電子衍射、高分辨觀察和x - ray能譜等實驗手段,分析了羥基磷灰石各層的形態、成分與微結構。
  5. More recent studies show nanowires products with narrow dismeter distribution around 5 - 10mn and lengths ranging from several hundred nanometers to several micrometers can be obtained if the mixture solution of naoh and koh was replaced by koh solution. the nanowires were analyzed by a range of methods including powder x - ray diffraction ( xrd ), high resolution electron microscopy ( hrem ), selected area electron diffraction ( saed ), electron energy loss spectroscopy ( eels ), xrd and hrem image simulations. the structure of nanowires is determinded to be of the type of k2ti6oi3

    利用x( xri ) ) 、高分辨顯微鏡( hrtem ) 、選區電子衍射( saed ) 、能量損失譜( eels )以及x和高分辨像模擬等分析測試手段,初步分析了這種納米線的生長機理,探討了她的結構和光學性能,實驗結果顯示這種納米線具有kzti6o ; 3的結構,紫外一可見光吸收光譜顯示, kzti6ol3納米線禁帶寬度約為3 . 45ev 。
  6. Especially, the nano - iron and nano - tungsten sols as well as their powders were characterized in detail by xrd, ft - ir, uv - vis, xfs, tem, sem, edax and so on. another new method is put forward firstly to estimate the addition of dispersants and its effect by uv - vis

    重點取納米鐵乙醇溶膠和納米鎢乙醇溶膠以及其中的納米顆粒進行了詳細表徵,所涉及的測試方法包括x、傅立葉紅外光譜、紫外-可見光譜、熒光光譜、透顯微鏡及、掃描顯微鏡及微能譜分析等等。
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