鏡面光柵 的英文怎麼說

中文拼音 [jìngmiànguāngzhà]
鏡面光柵 英文
speculum grating
  • : Ⅰ名詞1 (鏡子) looking glass; mirror 2 (幫助視力或做光學實驗的器具) lens; glass 3 (姓氏) a s...
  • : Ⅰ名詞1 (頭的前部; 臉) face 2 (物體的表面) surface; top 3 (外露的一層或正面) outside; the ri...
  • : Ⅰ名詞1 (照耀在物體上、使人能看見物體的一種物質) light; ray 2 (景物) scenery 3 (光彩; 榮譽) ...
  • : 柵名詞(柵欄) railings; paling; palisade; bars
  • 鏡面 : minute surface; mirror face; mirror plane; mirror plate; mirror surface鏡面反射 [物理學] direct r...
  1. The enterprise wenglor sensoric elektronische geraete gmbh is well - known and engaged not only in tettnang, but also in the specialized industries of its sphere of activity, with plastic light guidance cable, light screems, color sensors and at the same time with one - way light barrier, printers ' imprint scanner and knitting and drafting machines, mesh - making machines a competent partner

    Wenglor sensoric elektronische geraete gmbh是一家現代化的、可靠的專門產品供應商,這家供應商從事條形碼讀取儀器,印刷商標讀取器,單向,色彩感應器,澤敏感元件、澤傳感器,塑料導電纜,傳導線纜,勢壘、電裝置對、欄,事故維護,來復式卡釬、圓規,反射箱,傳感技術,編織、針織機,網路生產機械的製造、銷售。
  2. The paper lays a strong emphasis on discussing the realization of the autocontrol of raster scanning of the scanner in x - y dimension, the " tapping " of the cantilever of the tappingmode afm by a direct digital synthesizer. then a method of parallel communication between dsp and pc in epp mode is given. finally, the author discussed the digital pid closed loop control of the scanner in z - direction, the automatic approaching of the tip using step - motor, and also some electro - magnetic interferences

    論文首先簡單介紹了掃描探針顯微的發展、分類、工作原理及應用;接著對ti公司的tms320vc5402dsp的特點及外圍擴展作了簡單介紹;然後分章節重點講述了利用vc5402dsp實現掃描探針顯微的核心部件? ?壓電陶瓷管的x向和y向的掃描控制;藉助直接數字集成器( dds )實現輕敲式原子力顯微的微懸臂的「輕敲」 ; vc5402dsp的主機介( hpi )與pc機在增強并行口( epp )模式下的通信;論文最後還介紹了掃描管z向的數字pid閉環控制,步進電機的自動進針,並對實際出現的一些電磁干擾問題作了討論。
  3. If you were to block out the outermost diffracted orders by placing an opaque mask at the rear of the objective, you could reduce the resolution of the lines of the grating, or any other detailed object, or " destroy " the resolution altogether so that the specimen would not be visible

    假如用不透明的遮擋物在物后焦擋住外圈衍射級的線,線形格圖像的解析度將下降,這樣完全地破壞了解析度,標本的細節就無法看見。
  4. In order to study the thermal performance and residual stress of microelectronic subassembly, in this paper, a newly optical interferometry method for 3 - d displacement measurement is developed based on wavefront interference theory. in which the moire interferometry provide the in - plane displacement, but the system is different from the conventional interferometry, the system applies the double diffraction of the specimen grating, the in - plane displacement sensitivity is a factor of 2 higher than that of the conventional moire interferometer. twyman / green interferometry method for out - of - plane displacement measurement is adapted, the advantages of the optical set - up are structure novelty, and the fringe patterns of the displacement fields shown high contrast and spatial resolution

    為了詳細研究試件的熱變形特徵以及殘余應力的影響作用,本文在波前干涉理論的基礎上,設計了一新型三維學測試系統,該系統的平位移測試基於雲紋干涉方法,但採用與普通雲紋干涉不同的路系統,利用試件和平反射組形成的兩次衍射,使平位移干涉條紋倍增,測量靈敏度是普通雲紋干涉的2倍,系統的離位移場測試採用泰曼格林干涉路。
  5. It has broad application prospect in the following fields such as microelectronics, photoelectronic devices, large screen flat panel display, field emitter array, acoustic surface wave device, photon crystal, light waveguide array, holographic honeycomb lens and micro - optical element array, micro - structure manufacture, fabrication of large area grating and grid of high resolution, photoresist performance testing, profile measurement and metrology, etc. the paper only involves the primary research of interferometric lithography

    在微電子、電子器件、大屏幕平板顯示器、場發射器陣列、表聲波器件、子晶體、波導陣列、全息透和微學元件陣列、微結構製造,高分辨、大和網格製造,在抗蝕劑性能測試、形測量和計量等領域,干涉刻技術都具有廣闊的應用前景。
  6. Abstract : using the ray - tracing method, we demonstrate that a grating - telescope stretcher is the conjugation of a grating pair compressor. we present an analytical formula for calculating the phase dispersions of the grating - telescope stretcher. the computer simulation with the formula demonstrates that there exists an optimal material dispersion for an amplification system, with which we can achieve the largest dispersion - free bandwidth

    文摘:用線追跡法論證了-球系統與普通的對系統是一對相位共軛元件,並提出了-球系統色散的解析計算公式,以及對一個典型的放大系統做了模擬.模擬結果表明,對於一個放大系統,存在一個最佳的材料色散,用它可以獲得最大的無色散帶寬
  7. We give some useful analyses and the computer simulations for the ion etching process. compared with the atomic force microscope ( afm ) scanning photograph of the etching surface, the theoretical results prove that these simulation analyses assure the precision required by this problem, so these mathematical models are reasonable and correct. the analysis method in this paper is useful to analyze etching process, and it can also afford some valuable reference to etching technology

    在本論文我們主要利用這個數學模型,對使用離子束刻蝕製作單臺階的臺階與溝槽部分的表形隨時間的演變過程分別進行了計算機模擬分析,並通過把理論結果與在實驗中得到的刻蝕表在原子力顯微( afm )下拍攝的照片進行比較,結果說明這種模擬分析能夠保證對該問題分析所要求的精度,從而也證明了理論模型的合理性和正確性。
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