電子衍射象 的英文怎麼說
中文拼音 [diànziyǎnshèxiàng]
電子衍射象
英文
electron diffraction image- 電 : Ⅰ名詞1 (有電荷存在和電荷變化的現象) electricity 2 (電報) telegram; cable Ⅱ動詞1 (觸電) give...
- 子 : 子Ⅰ名詞1 (兒子) son 2 (人的通稱) person 3 (古代特指有學問的男人) ancient title of respect f...
- 衍 : [書面語]Ⅰ動詞(開展; 發揮) spread out; develop; amplifyⅡ形容詞(多餘) redundant; superfluousⅢ名...
- 射 : Ⅰ動詞1 (用推力或彈力送出) shoot; fire 2 (液體受到壓力迅速擠出) discharge in a jet 3 (放出) ...
- 電子 : [物理學] [電學] electron
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Electrons which pass through the thin specimen are brought to a focus in the back focal plane of the objective lens, this lens, like all electromagnetic lenses, acts as a converging lens and thus forms a diffraction pattern in this b. f. plane
穿越薄樣本的電子被帶到目標透鏡背面焦點平面的一個焦點,這個透鏡,象所有的電子透鏡一樣,充當了聚焦透鏡的作用,因此,構造了在這個背面焦點平面的衍射模式。The ultra - thin er layers with the thicanesses in the range of 0. 5 ~ 3 monolayer ( ml ) are formed by electron beam evaporation on si ( 00l ) substrate at room temperature in an ultra - high vacuum system. after annealing at lower temperatures, ordered simcfores form on the surface. the trallsition of the surface reconsmiction pattem from ( 2 x l ) to ( 4 x 2 ) with the increase of er coverage up to l ml is observed by the reflective high energy electron diffraction ( rheed ) and low energy electron diffraction ( leed )
本文是關于硅( 001 )襯底與電子束淀積的鉺、鉿原子反應形成的超薄膜的界面與表面性質的研究,以及在該襯底上出現的共振光電子發射現象,包括了以下四個方面的工作: 1鉺導致的硅( 001 )襯底上的( 4 2 )再構研究利用反射高能電子衍射和低能電子衍射,在室溫淀積了0At the s ame time, an exceptional structure has been found in the sample annealed for one hour at 800. it appears the single crystal lattice irradiated by high - energy electron beam within a few seconds and then becomes amorphous structure quickly
同時在800退火1小時的薄膜中發現一種異常結構,在短時間高能電子束照射下呈現明晰的單晶衍射斑點,但時間一長,非晶化現象嚴重。" for their experimental discovery of the diffraction of electrons by crystals
發現晶體對電子的衍射現象Selected area electron diffraction image
選區電子衍射象The thesis mainly investigated the bati _ 4o _ 9 ( bt _ 4 ), which has the lowest dielectric loss in ba - ti system, and ( ba, sr ) tio _ 3, the a position substitute compound of batio _ 3. the dielectric properties of bt _ 4 / bst with different preparation way and different elements doping were investigated. a archimedes method, xrd, sem, impedance analyzer, network analyzer and hakki - coleman method were used to investigate the density, phase formation, microstructure, dielectric properties and doping mechanisms
本論文以在ba - ti系中具有最低介電損耗的bati _ 4o _ 9 ( bt _ 4 )高頻介質陶瓷和batio _ 3a位sr取代而得的( ba , sr ) tio _ 3 ( bst )高頻介質陶瓷作為研究對象,對不同粉體制備方法制備的bt _ 4 / bst高頻電介質材料進行不同元素的摻雜,運用阿基米德方法, x射線衍射分析儀,掃描電子顯微鏡和阻抗分析儀,網路分析儀, hakki - coleman法等方法手段和測試儀器測試燒成樣品的密度,相組成情況,微觀結構和介電性能,探討造成介電性能起伏的形成機理。Electron diffraction image
電子衍射象To carry out this analysis it is necessary for the experimentalist to have a working knowledge of the background theory of both image contrast and electron diffraction, since these fields form the basis for the interpretation of electron micrographs
要進行這種分析,試驗者必須同時擁有圖象對比和電子衍射的理論背景下的工作經驗,因為這些領域形成了電子毀損的解釋基礎。During the research, we used the diffraction of x - ray. sem ( scanning electron microscope ), electron micro - probe, petrographic analysis, cements physical performance test, adiabatic test, concrete test and so on, also, we gave explanations to all kinds of expansion phenomenon
本課題在研究過程中採用了x ?射線衍射掃描電子顯微鏡、電子探針、 x ?熒光分析、巖相分析、水泥物理性能試驗、絕熱試驗、混凝土試驗等手段,對各種膨脹現象作出了解釋。By using x - ray diffraction ( xrd ), scanning electron microscopy ( sem ), transmission electron microscopy ( tem ), differential scanning calorimeter ( dsc ) and optical microscopy, mechanical activation is investigated. and during the study, two new innovative processes or thoughts, " dual activation reactive milling " and " in situ synthesis in salt bath activated by ma " has been presented for the synthesis of nanometer - sized powder. the phase transformation and oxidation control of cu - cr system during ma is also investigated
在採用x射線衍射分析( xrd ) 、掃描及透射電子顯微鏡( sem tem ) 、能譜分析( eds ) 、熱分析( dsc ) 、激光粒度測試等試驗手段對ma過程機械激活作用的研究中,發現並提出了「雙重激活反應研磨」和「機械激活鹽浴合成」兩種創新工藝思路;同時,對cu - cr難互溶體系在機械合金化過程中飽和固溶體、氧化物非晶的形成以及氧化現象的控制進行了探討分析。Macroscopical phenomenon description, scanning electron microscope ( sem ) analysis, electronic probe and x ray diffraction ( xrd ) analysis were used to analyze the phenomena of fouling and slagging in the main combustion zone, reburning zone and burned zone, with emphasis on the difference and its reason in reburning zone
通過宏觀現象描述、微觀掃描電鏡( sem )分析、電子探針和x射線衍射儀( xrd )物相分析,對爐內主燃區、再燃區和燃盡區沾污結渣狀況進行研究,重點分析再燃區的沾污結渣差異及原因。分享友人