atomic spectrum analysis 中文意思是什麼
atomic spectrum analysis
解釋
原子光譜分析-
The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。 -
Chemical analysis methods for non - rare earth impurities of rare earth metals and their oxides - determination of molybdenum and tungsten content - inductively coupled plasma atomic emission spectrographic method and inductively coupled plasma mass spectrum method
稀土金屬及其氧化物中非稀土雜質化學分析方法鉬鎢量的測定電感耦合等離子體發射光譜法和電感耦合等離子體質譜法 -
A review with 37 references is given on the recent progress of selenium species analysis with emphases to the methods of separation and examination technology, e. g, chromatography, the hydride genetic method, inductive coupling plasma mass spectrum, the atomic spectrum
摘要對近年來有關硒的形態分析的發展作了綜述，對新的分離方法如色譜法、氫化物發生法、毛細管電泳和新的檢測技術如電感藕合等離子體質譜、原子光譜給予較多的關注。 -
Energy spectrometer and atomic absorption spectrum ( aas ) were used to determine their compositions, and scanning electron microscope ( sem ), transmission electron microscopic ( tem ) were used to analysis the appearance of the samples
用原子吸收分光度法和能譜確定樣品的組成。掃描電子顯示鏡（ sem ）和透射電子顯微鏡（ tem ）分析了樣品的表面形貌及粒徑特徵。
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