bridge for testing of voltage 中文意思是什麼
bridge for testing of voltage
解釋
變比電橋-
For the convenience of test, varied circuit chip defects caused by the production process are abstracted as all kinds of models. at present the commonly used fault models mainly consist of stuck - at fault, stuck - open fault, bridge fault, store fault, delay fault, etc. testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years. bridge fault is tested easily by quiescent power supply current ( iddq ) testing method. in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing, it can is tested by the dynamic current ( iddt ) testing
為了便於測試，我們將生產過程中集成電路出現的多種多樣的缺陷抽象為各種模型。目前常用的故障模型主要有:固定故障，開路故障，橋接故障，存儲故障，時滯故障等。電壓測試主要針對固定型故障模型，多年的研究也取得了令人滿意的結果; cmos電路中的橋接故障則宜用穩態電流測試方法（ iddq ）測試;對于電壓和穩態電流難以測試的開路故障，可以使用瞬態電流測試（ iddt ）的方法進行測試。
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