burn-in test 中文意思是什麼
burn-in test
解釋
老化測試-
Zero insertion force a kind of integrated circuit socket where no pressure is needed to insert the chip. these sockets are used in eprom programmers, burn - in boards and test jigs
零插拔力:一種集成電路插座,插入晶元時不需要壓力。這些插座在eprom編程器、老化板和測試夾具中使用。 -
You can run a dynamic. burn in test for more qualified results
Monitor .來做動態測試,以節省開支,更無需為僅做靜態測試只接power -
Function to do hardware burn in test for add on cards. 3. for engineer : usually use oscilloscope probe to measure signal on
3 .維修工程師:若有習慣使用示波器去量測某點信號在power on - off瞬間的波 -
Rel122 high - temperature solid relay burn - in and test system
Rel122固體繼電器高溫老煉監測系統 -
High temperature dc burn - in test for capacitors such as chips, electrolysis, mica, membrane, paper, ceramics and metal paper kinds
用於對各種片式及電解雲母薄膜紙介陶瓷和金屬化紙介等類型電容器進行高 -
2. manufacturer to burn in test mother board for a long time
2 .工廠,針對主機板做長時間的熱機測試 -
Test burn - in system testing burn - in system
老化測試評監系統 -
Hardware burn in test function execution. the whole system computer lift test for 24 - 48 - 72. hours, combine software with hardware
一部電腦在做24 - 48 - 72小時壽命測試時,除了用測試軟體,套裝軟體 -
Burn in test card model
系列的進階卡
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