climatic test 中文意思是什麼

climatic test 解釋
環境測試
  • climatic : adj. 1. 氣候的，水土的，風土的。2. 一般趨勢的，風氣的。adv. -ally
  • test : n 1 檢驗，檢查；考查；測驗；考試；考驗。2 檢驗用品；試金石；【化學】試藥；（判斷的）標準。3 【化...
  1. Semiconductor devices - mechanical and climatic test methods - rapid change of temperature - two - fluid - bath method

    半導體裝置.機械和氣候試驗方法.溫度速變.雙流體浸泡法
  2. Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature ; two - fluid - bath method

    半導體器件.機械和氣候試驗方法.第11部分:溫度的急速變化.雙液電鍍槽法
  3. Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature - two - fluid - bath method

    半導體裝置.機械和氣候試驗方法.第11部分:溫度的急速變化.雙液電鍍槽法
  4. Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature ; two - fluid - bath method iec 60749 - 11 : 2002 ; german version en 60749 - 11 : 2002

    半導體器件.機械和氣候試驗方法.第11部分:溫度驟變
  5. Semiconductor devices - mechanical and climatic test methods - internal moisture content measurement and the analysis of other residual gases

    半導體器件.機械和氣候試驗方法.其他殘余氣體的內部濕氣含量的測量和分析
  6. Semiconductor devices - mechanical and climatic test methods - part 16 : particle impact noise detection iec 60749 - 16 : 2003 ; german version en 60749 - 16 : 2003

    半導體器件.機械和氣候試驗方法.第16部分:粒子碰撞噪
  7. Semiconductor devices - mechanical and climatic test methods - high temperature operating life

    半導體器件.機械和氣候試驗方法.高溫操作壽命
  8. Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life

    半導體器件.機械和氣候試驗方法.第23部分:高溫操作壽命
  9. Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life iec 60749 - 23 : 2004 ; german version en 60749 - 23 : 2004

    半導體器件.機械和氣候試驗方法.第23部分:高溫操作壽
  10. Sensitive switches for communication technology ; climatic test categories, measuring methods and testing procedures

    通信技術靈敏開關.第1部分:氣候試驗等級測量方法和
  11. Semiconductor devices - mechanical and climatic test methods - part 26 : electrostatic discharge sensitivity testing ; human body model

    半導體器件.機械和氣候試驗方法.第26部分:靜電放電敏感性試驗.人體模型
  12. Semiconductor devices - mechanical and climatic test methods - permanence of marking

    半導體器件.機械和氣候試驗方法.永久性標記
  13. Semiconductor devices - mechanical and climatic test methods - part 20 : resistance of plastic - encapsulated smds to the combined effect of moisture and soldering heat

    半導體裝置.機械和氣候試驗方法.第20部分:塑料密封的smds抗濕氣和釬焊熱綜合影響的性能
  14. Semiconductor devices - mechanical and climatic test methods - resistance of plastic - encapsulated smds to the combined effect of moisture and soldering heat

    半導體器件.機械和氣候試驗方法.塑料包封的smds的抗濕及釬焊熱度綜合影響
  15. Semiconductor devices - mechanical and climatic test methods - part 33 : accelerated moisture resistance - unbiased autoclave

    半導體器件.機械和氣候試驗方法.第33部分:加速抗濕.無偏壓熱器
  16. Semiconductor devices - mechanical and climatic test methods - part 27 : electrostatic discharge sensitivity testing ; machine model

    半導體器件.機械和氣候試驗方法.第27部分:靜電放電靈敏度測試.機器模型
  17. Semiconductor devices - mechanical and climatic test methods - part 30 : preconditioning of non - hermetic surface mount devices prior to reliability testing

    半導體器件.機械和氣候試驗方法.第30部分:可靠性試驗之前不氣密的表面安裝器件的預調試
  18. Solid state switches ; definitions, climatic test categories, measuring methods and testing procedures

    固態開關.定義氣候試驗類型測量方法和測試程序
  19. Semiconductor devices - mechanical and climatic test methods - temperature cycling

    半導體器件.機械和氣候試驗方法.溫度循環
  20. Semiconductor devices - mechanical and climatic test methods - part 25 : temperature cycling

    半導體器件.機械和氣候試驗方法.第25部分:溫度循環
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