diffraction area 中文意思是什麼
diffraction area
解釋
衍射區- diffraction : 分解
- area : n. 1. 面積；平地；地面。2. 空地；〈英國〉地下室前的空地。3. 地區，地方；〈比喻〉區域；范圍。
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The structures and characteristics of several graphite samples are measured by means of powder x - ray diffraction ( xrd ), brunauer - emmer - teller ( bet ) surface area measurement, inductively coupled plasma ( icp ) spectroscopy, particle size analysis and electrochemical measurements. the effects of origin, structure, impurity, particle size, specific surface area of carbon materials on the electrochemical characteristics are studied. a synthetic graphite with abundant resources, low cost and favorable performance is determined as the raw material for modification of graphite
採用xrd 、 bet 、 icp 、激光粒徑分析及電化學性能測試等方法，對國內外多種典型石墨樣品的結構與性能進行比較，研究石墨材料的來源、晶體結構、雜質含量、顆粒大小、比表面積等因素對其充放電性能的影響，確定一種性能較好、價格低廉、來源廣泛的普通人造石墨粉作為熱處理與摻雜改性、以及復合結構炭材料研究的原材料。 -
Among various fabrication techniques of thin film, the sol - gel process has gained much interest for the preparation of pzt thin film, due to ihe advantages of good homogeneity, easy control of composition, low in - ill i reaving temperature, easy formation of large area thin films pb ( zrxti : - k ) 0 :, ( pzt ) films were prepared on the ito coated glass plates and low resistor silicon wafer in sol - gel dip - coating process associated wi di heat treatment : at different temperatures and characterized by x - ray diffraction ( xrd ) and transmission electron microscopy ( tem ). lt is shown that the pzt ferroelectric thin films with ( 110 ) preferred orientation and well - crystallized perovskite structure can be obtained after annealing at 680 ? for 30 minutes on ito substrate and at 800 " c for lornin on silicon substrate
Pzt的制備方法有很多，其中溶膠?凝膠（ sol - gel ）方法可以和集成電路（ ic ）光刻工藝相互兼容，處理溫度低，有大面積塗敷性能，能精確地控制組分，無需復雜的真空設備，成本低廉，所以對于集成鐵電薄膜電容的應用這種方法有很廣闊的前景。本文利用sol - gel技術在摻錫的in _ 2o _ 3透明導電薄膜（ ito ）襯底和低阻硅襯底上成功地制備了pzt鐵電薄膜。運用了x射線衍射， sawyer - tower電路和lcr電橋分別對薄膜的晶化溫度，結構和電學性能進行了測試。 -
The main element analysis of whole rocks, the ree analysis and the trace element analysis have been done for the granitoid samples in this area. the chemical composition analysis has been done for the amphiboie and biotite minerals. the epma and x - ray powdered crystal diffraction have been done for k - feldspar, plagioclase, amphiboie, biotite, quartz, magnetite, titanite
對本區花崗巖類樣品進行了全巖主量元素、稀土元素及微量元素分析，對角閃石和黑雲母單礦物進行了化學成分分析，對鉀長石、斜長石、角閃石、黑雲母、及石英、磁鐵礦、磷灰石和榍石進行了電子探針和x射線粉晶衍射分析。 -
However, if the plane of the selector aperture is not precisely coplanar with that of the first image, then diffracted rays originating from outside the area defined by the aperture may contribute to the diffraction pattern
然而，如果選擇孔的平面與第一次成像不是正好共面，源自孔指定區域外部的衍射線可能影響衍射模型。 -
In considering diffraction errors there are two factors which will lead to diffracted rays originating from outside the area defined by the selector aperture, these are important in any work where a spatially accurate correlation of the diffraction data and the micrograph is required
考慮到衍射的差錯，有兩個因素決定源自選擇孔指定區域外部的衍射線，在任何工作中這些都是重要的，當衍射數據和顯微圖之間準確的空間對射被要求時。 -
( 3 ) based on the theory of linear diffraction, the linear propagation of obscuration is analyzed through equivalent diffraction distances, fresnel parameter, and obscuration ’ s area percent by the optical propagation software
用中國工程物理研究院研發的光傳輸軟體數值模擬驗證了散射點的衍射規律。三、從散射點線性理論基礎上分析散射點的傳輸規律。 -
Such conclusion is given : shorten the fresnel shu, shorten the obscuration ’ s area percent and shorten the equivalent diffraction distances will improve the optical quality. ( 4 ) the nonlinear paraxial equation is understood to analyze the n slabs ’ hot - image rule
得出在高功率固體激光裝置中應縮小散射點的菲涅耳數和散射面積比，控制散射點的等效衍射距離，使散射點接近等效衍射距離為零，即像面的位置。 -
Using the microwave selective heating property for materials, by setup equivalent equation, and first time inducing the electromagnetic field perturbation theory to the design of heating materials for substrate in mpcvd, three temperature distribution modes were established, including temperature distribution comprehensive mode of inhomogeneous plasma, temperature distribution composite mode of composite substrate materials, temperature distribution perturbation mode of composite materials, which ii provided an whole new technology route to the design of substrate heating system in mpcvd and guided the preparation of heating materials for substrate. and then the heating materials for substrate were designed and optimized to obtain large area homogeneous temperature distribution even larger than substrate holder ' s diameter. as an important part, this thesis researched the nucleation and growth of diamond films in mpcvd, systematically researched the effects of substrate pretreatment, methane concentration, deposition pressure and substrate temperature etc experimental technologic parameters on diamond films " quality on ( 100 ) single crystal silicon substrate in the process of mpcvd, characterized the films qualities in laser raman spectra ( raman ), x - ray diffraction ( xrd ), scanning electron microscopy ( sem ), infrared transmission spectra ( ir ), atomic force microscopy ( afm ), determined the optimum parameters for mpcvd high quality diamond in the mpcvd - 4 mode system
該系統可通過沉積參數的精確控制，以控制沉積過程，減少金剛石膜生長過程中的缺陷，並採用光纖光譜儀檢測分析等離子體的可見光光譜以監測微波等離體化學氣相沉積過程；利用微波對材料的選擇加熱特性，通過構造等效方程，並首次將電磁場攝動理論引入到mpcvd的基片加熱材料的設計中，建立了非均勻等離子體溫度場綜合模型、復合介質基片材料的復合溫度場模型及復合介質材料溫度場攝動模型，為mpcvd的基片加熱系統設計提供了一條全新的技術路線以指導基片加熱材料的制備，並對基片加熱材料進行了設計和優選，以獲取大面積均勻的溫度場區，甚至獲得大於基片臺尺寸的均勻溫度區；作為研究重點之一，開展了微波等離體化學氣相沉積金剛石的成核與生長研究，系統地研究了在（ 100 ）單晶硅基片上mpcvd沉積金剛石膜的實驗過程中，基片預處理、甲烷濃度、沉積氣壓、基體溫度等不同實驗工藝參數對金剛石薄膜質量的影響，分別用raman光譜、 x射線衍射（ xrd ） 、掃描電鏡（ sem ） 、紅外透射光譜（ ir ） 、原子力顯微鏡（ afm ）對薄膜進行了表徵，確立了該系統上mpcvd金剛石膜的最佳的實驗工藝參數。 -
Broad - area laser diode with 0. 02 nm bandwidth and diffraction limited output due to double external cavity feedback
帶寬近衍射極限輸出的雙外腔反饋半導體激光器 -
Selected area electron diffraction image
選區電子衍射象 -
Method of selected area electron diffraction for transmission electron microscopes
透射電子顯微鏡選區電子衍射分析方法 -
Saed ( selected area electron diffraction ), hrem ( high resolution electron microscopy ) and eds ( energy dispersive spectrum ) experiments confirmed that both the porous layer and lamellar layer are composed of nano - crystalline ha ( hydroxyapatite )
實驗中採用了選區電子衍射、高分辨觀察和x - ray能譜等實驗手段，分析了羥基磷灰石各層的形態、成分與微結構。 -
More recent studies show nanowires products with narrow dismeter distribution around 5 - 10mn and lengths ranging from several hundred nanometers to several micrometers can be obtained if the mixture solution of naoh and koh was replaced by koh solution. the nanowires were analyzed by a range of methods including powder x - ray diffraction ( xrd ), high resolution electron microscopy ( hrem ), selected area electron diffraction ( saed ), electron energy loss spectroscopy ( eels ), xrd and hrem image simulations. the structure of nanowires is determinded to be of the type of k2ti6oi3
利用x射線衍射（ xri ） ） 、高分辨電子顯微鏡（ hrtem ） 、選區電子衍射（ saed ） 、電子能量損失譜（ eels ）以及x射線衍射和高分辨像模擬等分析測試手段，初步分析了這種納米線的生長機理，探討了她的結構和光學性能，實驗結果顯示這種納米線具有kzti6o ; 3的結構，紫外一可見光吸收光譜顯示， kzti6ol3納米線禁帶寬度約為3 . 45ev 。 -
With the more modern ` four - lens ' microscopes the added flexibility removes this restriction and selected area diffraction is typically available for magnifications within the range 1 0 000 to 500 000 times
更先進的四透鏡顯微鏡增加的適用性消除了這個限制，選區衍射對在10000到500000倍的放大中有代表性作用。 -
The transmission electron microscopy ( tem ) images show that ceo2 nanowires are about 60 nm in diameter, which correspond to the pore sizes of the membranes used. the selected - area electron diffraction ( saed ) pattern indicates that the nanowires selected are single crystals
從透射電鏡（幾瑪圖像可以得知ceo :納米線直徑大約60nln ，與所用膜的孔徑相符，電鏡選區衍射（ saed ）顯示所選的ceo :納米線為單晶結構。 -
Furthermore, in vitro studies including x - ray powder diffraction ( xrd ), scanning electron microscopy ( sem ), surface area analysis ( bet ), and dissolution were performed to determine differences between low potency ( completely miscible ) and high potency ( partially miscible ) compositions
此外，通過粉末x -射線衍射（ xrd ） ，電子顯微鏡掃描檢查，表面積分析（ bet ）和溶出度等體外實驗來確定低效（完全混合）和高效（部分混合）組分間的差異。 -
Characters of the pyrolysis chars and residual carbons such as reactivity, turbostratic carbon structure and specific surface area have been examined by thermal gravimetric analysis, powder x - ray diffraction and mercury intrusion methods respectively. catalytic effect of minerals has been identified
高溫下不同煤質焦碳結構趨於一致和礦物質催化作用的失去在一定程度上證明了假定活化能不隨煤質變化的煤焦燃燒反應動力學通用規律的合理性。 -
Nanostructured bi2s3, cds and zns semi conductors with different sizes and morphologies were synthesized using hydrothermal, solvothermal and liquid - phase method at low temperature through changing reaction conditions. the products were characterized by x - ray diffraction ( xrd ), transmission electron microscopy ( tem ), selected area electron diffraction ( saed )
本文利用水熱、溶劑熱等液相法，在低溫下通過改變反應條件制備了不同尺寸和形貌的bi _ 2s _ 3 、 cds和zns納米結構半導體材料，利用xrd 、 tem 、 saed等測試手段對每一種材料進行了表徵和分析。 -
A test star sensor, which based on the hybrid optics of refraction and diffraction with a boe and the large area array ccd, is designed and developed. the static performances experiments and the star observation are carried out. the experimental results demonstrate the theoretic research work
以折衍混合光學系統和大面陣ccd為基礎，設計研製了試驗星敏感器樣機，進行了靜態性能測試與觀星試驗，實驗結果證明了理論研究工作。 -
At present, local morphology was used to discriminate ferroelectric phase area and non - ferroelectric phase area, but once morphology variation of phase transformation was tiny, the ferroelectric phase area and non - ferroelectric phase area was hard to discriminate only from morphology view. however, the introduction of sndm can overcome this limitation, and visualize the investigation of annealing process. combining x - ray diffraction, atomic force microscopy ( afm ) with sndm, the phase transformation process of pzt thin films with different annealing time and of plt films with different annealing temperature were studied, respectively
結合原子力顯微鏡（ afm ） 、 sndm 、 x射線衍射（ xrd ） ，通過對微區形貌、電容分佈變化和鐵電薄膜結晶情況的表徵和分析，研究了pzt鐵電薄膜和plt鐵電薄膜的晶化過程，分析了不同退火時間對pzt鐵電薄膜微結構，不同退火溫度對plt薄膜的微結構和微區極化分佈的影響，有效克服僅依據形貌特徵判定鐵電相與非鐵電相的局限性，實現鐵電薄膜微區晶化過程的可視化分析，豐富了晶化過程的研究方法。
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