diffraction resolution 中文意思是什麼
diffraction resolution
解釋
衍射分辨力- diffraction : 分解
- resolution : n 1 決心，果斷；堅定，剛毅。2 （議會等的）決定，決議（案）；【法律】〈罕用語〉判決；（疑問等的）...
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The as - grown crystals were characterization by cutting and directional, x - ray diffraction, high resolution ohmmeter, ir transmission spectroscopy, visible light absorption spectroscopy, scan electronic microscopy ( sem ) and positron annihilate time technique ( pat ). the ir transmittance of czt single crystals grown with cd - riched is about 53 %, while 23 % with no cd riched
採用解理實驗、 x射線衍射、電學性能測試、紅外透過譜測試、可見光吸收譜測試、 sem蝕坑分析、探測器的試制等分析測試方法，並首次採用正電子湮沒壽命譜分析方法來研究czt單晶體的空位缺陷，綜合表徵了所生長的晶體的質量和性能。 -
The orientation relationships between cu and mgo are determined by means of electron diffraction patterns. the interface structures are analyzed according to high - resolution images of tem, csl and 0 - lattice theories and verified by simulation computation method
通過電子衍射圖確定了cu與mgo之間的各種取向關系；根據高分辨像對界面結構進行了研究；通過計算模擬驗證了重位點陣和o -點陣理論。 -
The effects of acid counteranions on the mesophases were investigated by x - ray diffraction and high - resolution transmission electron microscope
採用小角x射線衍射和高解析度透射電鏡研究了不同酸根離子對產物介孔結構的影響。 -
High resolution diffraction attachment
高分辨衍射附件 -
High resolution diffraction image
高分辨衍射象 -
Sem, transmission electron microscopy ( tem ), x - ray energy - dispersion analysis ( edax ), xrd, electron diffraction ( ed ) and high - resolution electron microscopy ( hrem ) were used to investigate the morphology, atomic composition and crystal structure of the nanowires. the hexagonal cdse nanowires with single crystal structure have been obtained in dmso under 140. ( 3 ) semiconductor te and cdte nanowires embedded in aao templates were fabricated for the first time by dc < wp = 7 > electrodeposition in ethylene glycol
Sem 、 tem 、 edax 、 xrd 、 ed 、 hrem分析的結果表明，所得cdse納米線為六方晶型，晶體的（ 001 ）晶面沿平行於基底的方向擇優生長，且隨沉積溫度的降低，這種擇優生長的趨勢越來越強；納米線晶體在生長時，由於受aao模板孔徑的限制，形成c軸方向拉長的晶粒，其長徑比達5 1以上；晶體的大小和完善程度隨沉積溫度的降低而增大， 185沉積得到多晶六方cdse納米線，而140沉積時可得到六方cdse單晶納米線。 -
No5 ： image processing based on the combination of high - resolution electron microscopy and electron diffraction ( invited paper ), f. h. li, microscopy research and technique, 40 ( 1998 ) 86 - 100
場發射高分辨電子顯微鏡在揭示原子解析度晶體缺陷上的應用（特邀論文） ，李方華，科儀新知， 21 （ 1999 ） 8 - 15 -
The morphologies of powder were observed by using high - resolution transmission electron microscopy ( hrtem ) ; x - ray diffraction ( xrd ) pattern was used to analyze the phases of the powder ; energy dispersive x - ray spectroscopy ( edx ) was used to analyze the component of composite powder
用高分辨電鏡觀察復合粉體的形貌，進行電子衍射分析；用d / 3ax3b型x射線衍射儀作復合粉體的物相分析；用pv9900型能譜儀作復合粉末的成分分析。 -
The resolution of optical system can not reach its diffraction limit because of the phase aberrations caused by atmospheric turbulence and other wavefront errors. adaptive optics technology uses deformable mirrors to perform dynamic phase modulation and endow optical system the ability to decrease the influence of dynamic wavefront errors
大氣湍流等動態干擾使光波面相位發生畸變，使光學系統的解析度無法達到其衍射極限，而自適應光學系統使用變形鏡對光波面進行動態相位調制，賦予了光學系統能動可變的能力而有效地解決了動態干擾的問題。 -
On the basis of the study of high resolution sequence stratigraphy, this paper discusses the reservoir petrology ' s diagenesis and secondary pore of the chang 4 + 52 ~ chang 62 pay zones in detail by using the methods of analysis of mercury injection, cast section, popular section, scanning electron microscope, x - ray diffraction and etc. the reservoir rock is mainly composed of feldspar fine sandstone, which is characterized by low compositional maturity and relatively high textural mature
本文在高解析度層序地層學研究的基礎上，通過15口井的常規物性、壓汞、鑄體分析、薄片鑒定、掃描電鏡、 x光衍射、陰極發光、粒度分析等多項測試手段，對坪北油田延長組長4 + 52長62儲層巖石學、成巖作用及次生孔隙進行了詳細研究。 -
In order to study the thermal performance and residual stress of microelectronic subassembly, in this paper, a newly optical interferometry method for 3 - d displacement measurement is developed based on wavefront interference theory. in which the moire interferometry provide the in - plane displacement, but the system is different from the conventional interferometry, the system applies the double diffraction of the specimen grating, the in - plane displacement sensitivity is a factor of 2 higher than that of the conventional moire interferometer. twyman / green interferometry method for out - of - plane displacement measurement is adapted, the advantages of the optical set - up are structure novelty, and the fringe patterns of the displacement fields shown high contrast and spatial resolution
為了詳細研究試件的熱變形特徵以及殘余應力的影響作用，本文在波前干涉理論的基礎上，設計了一新型三維光學測試系統，該系統的平面位移測試基於雲紋干涉方法，但採用與普通雲紋干涉不同的光路系統，利用試件光柵和平面反射鏡組形成的兩次衍射，使平面位移干涉條紋倍增，測量靈敏度是普通雲紋干涉的2倍，系統的離面位移場測試採用泰曼格林干涉光路。 -
We designed, simulated and experimented multi - beam lens antenna based on spot - focusing lens antenna ’ s designing, computer simulation, experiment and analysis. in this paper, the author adopted different methods to discuss resolution including geometry optics, gaussian beam and vector diffraction integration
然後在對單波束點聚焦透鏡天線進行設計、模擬和試驗的基礎上，進行準確的分析，以作為多波束天線設計的理論基礎。 -
The images will look different than they did before because we are now approaching the resolution limit ( the “ diffraction limit ” ) of the microscope
圖片看上去會與處理前有不同，因為我們面臨顯微鏡解析度的極限（衍射極限） 。 -
The effects of dispersion on the super - resolution of 3 - d confocal imaging system are analyzed by using the theory of scalar diffraction
摘要本文應用標量衍射理論分析了色散對三維共焦成像系統超分辨的形響。 -
Saed ( selected area electron diffraction ), hrem ( high resolution electron microscopy ) and eds ( energy dispersive spectrum ) experiments confirmed that both the porous layer and lamellar layer are composed of nano - crystalline ha ( hydroxyapatite )
實驗中採用了選區電子衍射、高分辨觀察和x - ray能譜等實驗手段，分析了羥基磷灰石各層的形態、成分與微結構。 -
More recent studies show nanowires products with narrow dismeter distribution around 5 - 10mn and lengths ranging from several hundred nanometers to several micrometers can be obtained if the mixture solution of naoh and koh was replaced by koh solution. the nanowires were analyzed by a range of methods including powder x - ray diffraction ( xrd ), high resolution electron microscopy ( hrem ), selected area electron diffraction ( saed ), electron energy loss spectroscopy ( eels ), xrd and hrem image simulations. the structure of nanowires is determinded to be of the type of k2ti6oi3
利用x射線衍射（ xri ） ） 、高分辨電子顯微鏡（ hrtem ） 、選區電子衍射（ saed ） 、電子能量損失譜（ eels ）以及x射線衍射和高分辨像模擬等分析測試手段，初步分析了這種納米線的生長機理，探討了她的結構和光學性能，實驗結果顯示這種納米線具有kzti6o ; 3的結構，紫外一可見光吸收光譜顯示， kzti6ol3納米線禁帶寬度約為3 . 45ev 。 -
As a natural limit for angular resolution, one may take the angular size of the central diffraction disk.
我們可以取中心衍射環的角直徑作為角解析度的一種自然極限。 -
The numerical reconstruction algorithm of digitally sampled holograms, deduced from the scalar quantity diffraction theory, is investigated. the serious recording limitations due to the finite size and resolution of ccd are detailed discussed
根據標量衍射理論，討論了利用菲涅耳衍射公式對數字無透鏡傅里葉變換全息術的數值實現，並進一步討論了ccd參數對數字全息圖記錄的限制條件。 -
( 211 ) reflection of the polycrystal a - iron sample is used in the simulation experiments, and both the resulting full - width - at - half - maximum ( fwhm ) of the diffraction peaks and peak shifts under tensive and compressive strain are in accord with that expected from analytical methods. the instrumental resolution curves, under various combination of the first collimator and second collimator and take - off angle of the monochromator, are given
用- fe多晶樣品的（ 211 ）晶面進行了模擬實驗，得到的衍射峰半高寬以及拉應變和壓應中國原子能科學研究院博士學位論文變作用下衍射峰移動的模擬結果都與解析方法的預期值符合得很好。 -
Main content of the thesis are also given in the introduction. the thesis presented three different of the residual stress based on x - ray diffraction - - two - exposure method, sin2, high - resolution reciprocal space mapping, which are applied to investigate the residual stress state of pt / ti bottom electrode stack, polycrystalline pzt ferroelectric thin films and epitaxial laalo3 / batio3 ferroelectric
基於此，提出了本文的選題依據，即研究鐵電薄膜中的殘余應力是基於「鐵電薄膜的重要應用背景和殘余應力對鐵電薄膜性能的可能影響以及目前鐵電薄膜中殘余應力研究的不足」 。
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