electron microscopic technique 中文意思是什麼
electron microscopic technique
解釋
電子顯微鏡技術- electron : n. 【物理學】電子。 the electron beam 電子束。 the electron theory 電子（學）說。
- microscopic : adj. 1. （像）顯微鏡的。2. 用顯微鏡可見的；微觀的；極微的（opp. macroscopic）。adv. -ically 1. 用顯微鏡。 2. 極微。
- technique : n. 1. （專門）技術；（藝術上的）技巧，技能。2. 手法〈如畫法，演奏法等〉。3. 方法。
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But there are still no reports about the relationships of dnpi - like and gabaergic immunoreactive ( gad - li ) terminals with pag - like immunoreactive ( pag - li ) neurons in " zone - shaped area ". to answer these questions, we observed systemically the synaptic connections among the pv - like immunoreactive neurons, fibers and terminals and the connections between dnpi - like, gabaergic terminals and pag - li neurons using the methods of electron microscopic imrnunohistochemistry, triple - immunofluorescence histochemistry and retrograde tracing method combined with pre - embeded immunoelectron microscopic double - labeled technique
但是目前對新發現的囊泡膜mu轉運體一dnn樣陽性終末與帶狀區內pag樣陽性神經元之間ej關系，以及谷氨酸脫發酶（ gad ，是gaba能神經元和終末的特異性標識物）是否參與其調控作用，尚缺乏系統的形態學資料。 -
Analysis results of histogram statistics and section electron microscopic scan technique, are that fracture feature of the cracks of the hbbb is similar and the crack is multi - source strain fatigue one. internal defects of the cast, such as impurities, gas holes, etc, are the main causes for early cracks. the contrast analysis of static strength, model and transient respond on three structures with fem proves that geometrical stress concentration in partial area has influence on early crack, also
利用直方圖等統計方法和電鏡掃描技術對該抱軸箱體裂紋分析的結果是：抱軸箱體的裂紋斷口特徵相近，裂紋性質屬于多源性低周疲勞裂紋，鑄件中的夾雜、氣孔等內部缺陷是導致過早裂損的主要原因；利用有限元法對該抱軸箱體三種結構的靜強度、模態和動態響應對比分析，證實了局部幾何性應力集中對過早裂損也有一定影響。 -
Methods : special stainings of toluidine blue, alcian blue and electron microscopic technique were used in the study
方法：採用甲苯胺藍、愛爾沙藍特殊染色法及電子顯微鏡技術。
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