flatness measurement 中文意思是什麼
flatness measurement
解釋
平面度測量- flatness : n. 1. 平坦,平滑。2. 直率,果斷。3. 無變化,單調。4. (音的)低沉;(市況的)蕭條。
- measurement : n. 1. 測量,計量,量度。2. 份量,尺寸,大小,寬度,厚度,深度(等)。3. 測量法。 measurement goods (按體積、容積計算的)體積貨物。
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Door leaves - measurement of defects of general flatness
門扇.一般不平度的測量 -
The 3d coordinate measurement machine form usa, universal tool microscope from germany, intellectual flatness check device, metalloid graphic analyzer, electric and pneumatic measurement instruments and high performance steering test equipment ensure the products quality and play the important role for the products development
從國外進口的三坐標測量儀、德國萬能工具顯微鏡、智能平面度檢查儀、金相圖像分析系統、電動量儀、氣動量儀和日本的高性能動力轉向系統試驗設備,保證動力轉向器的性能質量。 -
Doors - measurement of defects of general flatness of door leaves
門.門扇總平直度缺陷測量 -
Door leaves - general and local flatness - measurement method
門扇.普通和局部平坦性.測量方法 -
Door leaves - general and local flatness - measurement method ; german version en 952 : 1999
門扉.總體和局部平整度.測量方法 -
Study on the building - up measurement of straightness and flatness
直線度平面度組合測量的研究 -
Control algorithm is neural network self - learning, it means that measurement signals are inputed for neural network which adjusts the setpoint of actuators based on its efficiency, in order to improve strip flatness
控制演算法為神經元網路自學習的演算法,即輸入實測信號根據效率逐一調節執行元件的設定值,以改善板形。 -
In spatial domain, according to the characteristics of hvs ( human visual system ), we introduce several approachs based on images " deviation, images " flatness measurement, fuzzy classification, and an approach based on difference matrix as well
在空間域內,利用人的視覺特性,我們提出了基於圖象方差、圖象平坦測度、模糊分類的隱藏演算法,同時提出了基於差值矩陣的信息隱藏。 -
According to the feature of the human vision, we present the hiding methods based on image variance, image flatness measurement and fuzzy classification, respectively. and the techniques based on relationship between pixels, difference matrix and cryptography are also given. two hiding methods, backup hiding and camouflage hiding, are proposed too
在空間域內,利用人的視覺特性,本文提出了基於圖象方差、圖象平坦測度和基於模糊分類的隱藏演算法,同時提出了基於關系、基於差值矩陣和基於密碼演算法的隱藏方法,並提出了備份隱藏和偽裝隱藏兩種隱藏方案。 -
Testing of materials for semiconductor technology ; measurement of the geometric dimensions of semiconductor slices ; determination of flatness deviation of polished slices by means of the multiple beam interference
半導體工藝材料的檢驗.第3部分:半導體切片幾何尺寸的 -
The roll measurement with piezo - effect sensor to aquire flatness signal are presented
摘要分析了平直度控制的信號獲取及控制演算法機理。
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