polarization microscopy 中文意思是什麼

polarization microscopy 解釋
偏振光顯微鏡檢術
  • polarization : n. 1. 兩極分化。2. 【物、天】極化；極化強度。3. 【物理學】偏振（化）。
  • microscopy : n. 顯微鏡學；顯微鏡使用術。
  1. The application of sirius red stain and polarization microscopy method in the fibrotic research of hypertrophic scar and keloid

    天狼猩紅偏振光法在病理性瘢痕纖維化研究中的應用
  2. There are many methods to investigate domains, such as polarization microscopy, scanning electron microscopy, transmission electron microscopy, scanning electron acoustic microscopy and so on. however, these methods suffer from some serious disadvantages involving complex sample preparation, damage to sample, low resolution

    現有的鐵電疇檢測手段，如偏光顯微鏡、粉末花樣技術、掃描電鏡、透射電鏡、掃描電子聲顯微鏡等存在這樣或那樣的缺點：諸如制樣繁瑣、易破壞原始疇結構、或疇結構成像解析度還不夠高等。
  3. The corrosion behavior of nanocrystalline ( nc ) copper bulks with various grain sizes prepared from igc ( inert gas condemsation ) and vacuum annealing in comparison with conventional microcrystalline ( mc ) copper ( as - rolled and electrolytic ) in acid copper sulphate solution and neutral solution containing chlorides under free corrosion conditions and anodic polarizations has been studied using potentiodynamic polarization, potentiometric analysis, cyclic voltammetry and electrochemical impedance spectroscopy. x - ray diffraction was used to estimate the grain size of the annealed nc copper. field emission gun scanning electron microscopy and x - ray energy - dispersive spectroscopy was used to characterize the surface morphology and analyze the surface composition after the polarization and potentiometric test of both nc and mc copper

    本文研究了用igc （惰性氣體蒸發凝聚原位溫壓法）制備並真空退火到不同晶粒尺寸的納米晶銅和微米晶銅（冷軋紫銅、電解銅）在酸性硫酸銅溶液和中性含氯溶液中，在自腐蝕狀態和陽極極化狀態下的腐蝕性能。使用了動電勢極化、電位測定、循環伏安法（ cv ）和電化學阻抗譜（ eis ）等方法。 x -射線衍射（ xrd ）的方法用來估算納米晶銅晶粒尺寸。
  4. To achieve accurate detection of surface potential, the measurement of the contact potential difference of the zno / si step was also carried out. polarization - related surface properties of ferroelectric thin films were investigated by kelvin probe force microscopy ( kpfm ), leading to the discovery of asymmetric charge writing on the surface of pb ( zr _ ( 0. 55 ) ti _ ( 0. 45 ) ) o _ 3 ( pzt ) thin film

    為了優化儀器的檢測靈敏度和穩定性，選用氧化鋅薄膜上的zno / si臺階作為測試對象，檢測了zno / si的接觸電勢差;通過改變儀器系統參數，發現針尖-樣品距離和掃描速度對接觸電勢差的檢測結果影響顯著。
  5. The diamond coating was characterized by xray diffraction ( xrd ), scanning electron microscopy ( sem ), laser raman spectra ( raman ) and polarization microscopy

    在硬質合金基體上金剛石鍍膜后，分別用raman光譜、 x衍射（ xrdl掃描電鏡uem ）和偏光顯微鏡對薄膜進行了表徵。
  6. The natures of the probe and formation mechanisms in these techniques are different ; therefore, the images of spm can reflect different properties of sample surface. in this work, related properties of ferroelectric thin film were investigated as followed : the main factors determining the image formation of piezoresponse force microscopy ( pfm ) and scanning nonlinear dielectric microscopy ( sndm ) were studied. to avoid the misreading of the same conductive tip with different state, a new method of polarization distribution mapping with nonconductive tip was proposed, and the result of experiment demonstrated that the polarization distribution of ferroelectric thin films could be characterized well by the new approach

    本工作主要分為以下幾個部分:從研究鐵電薄膜的壓電響應力顯微鏡（ pfm ）和掃描非線性介電顯微鏡（ sndm ）成像的影響因素入手，討論了針尖對成像質量的影響;為降低實驗成本、減小導電探針針尖狀態變化對鐵電薄膜微區電性能測試的負面影響，提出了以非導電探針檢測微區極性分佈的方法，並在現有spa - 300hv型spm的實驗平臺上以pfm模式成功實現了新方法對鐵電薄膜極性分佈的表徵。
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