resistivity of semiconductor 中文意思是什麼

resistivity of semiconductor 解釋
半導體的電阻率
  • resistivity : n. 抵抗力;抵抗(性);【電學】電阻率;電阻系數,比阻。
  • of : OF =Old French 古法語。
  • semiconductor : n. 【物理學】半導體。
  1. Testing of semiconductor materials ; measurement of the resistivity of silicon or germanium single crystals by means of the four probe direct current method with collinear array

    半導體材料的試驗.用探針直線排列的四探針直流法測
  2. Testing of semiconductor materials ; determination of the radial resistivity variation of silicon or germanium slices by means of the four - probe direct current method

    半導體材料試驗:採用四探針直流法測量矽片和鍺片電
  3. It was found that, the as grown crystal of mnxcd1 - xin2te4 is p type semiconductor, both the charge density and the resistivity increase with x value, while the carrier mobility decreases with x

    晶體的電學性能,發現生長態的mncd晶體均為p型半導體。隨著組分x值的增大,載流於的濃度np減小,遷移率p 。
  4. Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy - current gage

    半導體矽片電阻率及硅薄膜薄層電阻測定非接觸渦流法
  5. Testing of materials for semiconductor technology ; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method ; homogeneously doped semiconductor wafers

    半導體工藝材料檢驗.用渦流法無接觸測定電阻率.均勻
  6. The sheet resistivity dramatically decreases to 106 ? / ?. the sheet hole concentration increases about 109 / cm2 order of magnitude and the hall mobility increases too. te doping changes < wp = 7 > cdte thin films into good p - type semiconductor and improves electrical properties of the films

    ,面載流子濃度增大到109 / cm2的數量級,遷移率亦增大到104cm2 / v . s ,摻雜te元素改善了cdte薄膜的電學性質,使其變為良好的p型半導體。
  7. Many important properties of semiconductor devices are relevant with their resistivity, which brings forward strict demands to the uniformity of the resistivity. especially micro - area ' s characteristics attract extensive attention. under this background, four - point probe measurement technique requires a new development

    許多器件的重要參數與電阻率有關,因此這對晶體電阻率的均勻性,電學特性提出了更為嚴格的要求,特別是微區的電特性和均勻性引起了人們的廣泛關注。
  8. Four - point probe measurement technique is one of the most extensive means for examining the resistivity in the semiconductor industry. with continuous progress, semiconductor industry develops at a very fast speed, the integration level of ic becomes higher and higher. presently, the ic production is entering into the age of ulsi, then testings are more and more important

    四探針測試技術是半導體工業檢測電阻率時採用最為廣泛的測試手段之一。隨著時代的不斷進步,半導體產業飛速發展,以單晶矽片為襯底的集成電路集成度越來越高,目前正進入甚大規模集成電路( ulsi )時代,測試在整個集成電路生產過程中的地位越來越重要。
  9. Testing of materials for semiconductor technology - contactless determination of the electrical resistivity of semi - insulating semi - conductor slices using a capacitive probe

    半導體工藝材料試驗.使用電容式探測器對半絕緣半導體
分享友人