scan circuit 中文意思是什麼

scan circuit 解釋
掃描電路
  • scan : vt （ nn ）1 細看，細察；審視。2 〈口語〉大略一閱；瀏覽。3 按韻節念，按句調讀，標出（詩）的格律（...
  • circuit : n 1 （某一范圍的）周邊一圈；巡迴，周遊；巡迴路線[區域]；迂路。2 巡迴審判（區）；巡迴律師會。3 【...
  1. It combained potentiostat, potentiostatic circuit instrument and ac impedance measurement organticace, which can measure usual dynamic potentio - scan, experiment of dynamic potentio - scan, but also unique measurement of ac impedance measurement, also, this new type electrochemical workstation can carry on complex experiment, sucn as potentio / current scan ac impedance measurement procedural measurment, life - span - circle ac impedance measurement procedural measurement in order to fullfill the goal of track and analysis of parameter in various electrochemical conditions. this graduation thesis indicate the structure, function of the multifunct - ional electrochemical workstation

    它把恆電位儀，恆電流儀和電化學交流阻抗分析儀有機地結合到一起，既可以做常規的基本測試如動電位掃描、動電流掃描試驗和電化學交流阻抗測量，也可以做基於這三種基本試驗的程式化試驗，如恆電流充電-電化學交流阻抗測量，電池壽命循環試驗-電化學交流阻抗測量試驗，從而完成多種狀態下電化學體系的參數跟蹤和分析。
  2. We have designed the scanning and control system, which includes a pre - amplifier, a pid feedback and scanning - control circuit, high - voltage amplifiers and so on. the function of controlling scan and feedback has been realized

    設計完成包含有前置放大電路、 pid反饋和掃描控制電路、高壓放大電路等掃描控制電路在內的掃描控制系統，完成各部分電路性能的測試及功能調試，實現反饋和掃描控制。
  3. International standard ieee 1149. 1 describes the basic circuit structure and performance of boundary scan

    國際標準ieee1149 . 1規定了邊界掃描的基本電路結構和功能。
  4. In this paper, we combine the standard modules realize the boundary scan of estarl and also expand it to the test of internal circuit. this structure can save the i / o port of the chip and simplify the testing program

    本文結合標準模塊設計實現了estar1的邊界掃描結構，並進行了擴展，應用到晶元內部測試，節約了測試i / o口消耗，簡化了測試過程。
  5. So here introduces a new method - the combination of boundary scan with deltascan, in which deltascan is applied to do short and open test in ict, so that the number of vectors used to test circuit short and open in boundary can be eliminated. all vector test, including boundary scan test, need to create test vectors

    任何邏輯元件的矢量測試，包括邊界掃描測試，都必須先生成測試矢量，然後用這些測試矢量作為輸入端的激勵信號，因此測試矢量是矢量測試的基礎，測試矢量生成方法的難易程度和測試矢量數目是邊界掃描技術能否在實際中應用的關鍵。
  6. Then a comparison is made according to their characters and the application scope of each method is determinate. from that we get the whole scheme of design for testability of dspc50, which is using boundary scan to improve the board - level testability of the chip and using full - scan in designing the nuclear circuit to reduce the difficulty of testing the chip

    在此基礎上得到dspc50的可測性設計的整體方案，即採用邊緣掃描設計提高晶元在板級的可測性，同時用全掃描思想設計晶元核心電路，以降低晶元本身測試的難度，即將晶元的全掃描設計包含入邊緣掃描系統。
  7. There are a lot of methods available to create test vector. the thesis addresses their characteristics of the methods and special structure of boundary scan circuit respectively and come to a conclusion of pseudo - exchausive testing the most rational method applied to this situation

    測試矢量的生成方法很多，本文在研究了各種方法的特性，以及邊界掃描電路的特殊結構后，採用了偽窮舉法生成測試矢量。
  8. Apart from that, it also anlagse the basic princple of ac impedance measurement, and introduce the design and experiment of handware of the workstation in terms of basic princple of ac impedance measurement. the study of this graduation thesis includs the aspects as follwos : ( 1 ) design of measuring circuit diagram. it is designed for the measurment of usual dynamic potentio - scan, experiment of dynamic potentio - scan

    介紹了電化學工作站的三種基本功能和性能指標，電化學交流阻抗測量的原理，並進而提出了電化學工作站的硬體系統結構，構建了電化學工作站的硬體結構設計; （ 2 ）下位機的介面電路板和測量電路板設計，在設計中力圖提高系統精度、靈活性。
  9. The scan and display circuit based on vhdl

    的掃描顯示電路
  10. For the image acquisition of optical scan mode, normally, ccd image sensor is used to capture image, but in our system, due to the system request of micromation and high integration, cmos image sensor is adopted as the image collection device, and then the thesis gives a interface circuit between the chip and dsp and a control solution of image collection ; toward the information storage in our solution, dsp is directly linked to usb host chip and it is the dsp that accomplishes the processing of usb protocol and interface control so as to reduce the cost, minimize product cubage and consequently meet the requirement of system micromation ; at the same time, the thesis probes preliminarily into usb otg ( on - the - go ) technology, which offers an approach between embedded machines including pda, mobile phone, printer, digital camera and so on ; in addition, some attempts on the other application area with tms320vc5402 which was commonly used to voice processing and static image processing are done, for example, to arrange the chip to control lcd module directly

    在圖像的光電掃描輸入上，傳統方案大部分採用ccd型圖像傳感器，而在本方案中，根據系統微型化、高集成的特點，使用了cmos圖像傳感器作為攝像器件，並且設計了該晶元與dsp的一種介面電路以及圖像採集控制方案；在信息存儲上，本方案採用dsp直接與usbhost晶元連接，由dsp處理usb協議和介面信息，從而降低了系統成本、縮小了產品體積，滿足了系統微型化的要求；同時本論文也對usb - otg技術進行了初步探討，利用此項技術，不再需要計算機作為主機，就能實現在pda 、移動電話、印表機、數碼相機等嵌入式應用之間直接互聯通信；另外也對廣泛用於語音處理和靜態圖像處理的tms320vc5402其它方面的應用進行了嘗試，比如直接控制液晶顯示器等。
  11. This thesis discusses the realization of pcbs ict production through a concrete example in which boundary scan technology is applied, and presents a new method to improve the test speed, based on the analysis of boundary scan circuit and means for vector creation. he applys boundary scan ( bs ) to boundary - scan device on the board where bs features by easy vector creation, need less knowledge of the device

    本文結合一個具體電路板在線測試實現，首先討論了在ict中，採用邊界掃描元件測試技術實現在線測試生產；並在分析歸納各種測試方法的基礎上探索一種新的改進方法，即將deltascan技術與邊界掃描技術相結合以減少測試矢量，增加測試速度的一種實用方法。
  12. By the advantage of high precision, strong anti - interference ability, long lifespan, etc, grating scale is the chief sensor in displacement measurement. however, as is restricted by the beam path structure, the scan frequency of the scaning circuit, etc, the maximum available measuring speed has a inverse proportion relationship to the measuring pace of a single grating scale

    光柵尺具有精度高、抗干擾能力強、壽命長等優點，成為微納米位移測量的主要工具，但由於受光路結構及信號檢測電路掃描頻率等因素的限制，單個光柵尺測量的最大允許移動速度與其測量步距成反比。
  13. We develop a clsm system included optics module, scan module, circuit and data collection module and computer processing module that can acquire reflected light and fluorescent light of sample. we debugged this system and measured some samples

    我們研製了一套反射式共聚焦激光掃描顯微鏡系統，包括光學部分模塊，掃描部分模塊，控制電路及數據採集模塊，計算機處理模塊以及各介面。
  14. The main contents are as follows : the structure of mixed - signal circuit which newly - defined in ieee1149. 4 std is analyzed in detail, especially anolog boundary module and test bus interface circuit. on the basis of mixed - signal boundary scan technology, a scheme of mixed - signal boundary - scan test system is presented and the hardwares are implemented, including the controller and display unit

    主要研究的內容以及所作的工作如下:詳細分析了ieee1149 . 4標準中針對混合信號電路測試新增的結構，即模擬邊界模塊及測試介面電路。基於混合信號邊界掃描技術標準，提出混合信號邊界掃描控制器的設計方案並實現了其硬體設計，包括邊界掃描控制模塊、顯示驅動模塊等。
  15. During test, some registers in the processor are converted into scan chains to improve controllability of the circuit, the adders in the processor are used as test generators, and the produced test patterns can detect any combinational faults within every basic building cell of fft processor

    測試時，該方案將處理器中的寄存器作為掃描鏈提高了其可控性，利用其中的加法器作為測試生成，生成的測試矢量能偵測處理器每個基本組成單元內部的任意組合失效。
  16. Internal scan is advanced for the difficulty of fixing the state of sequential circuit, can be divided into full - scan and partial - scan. in this paper we use full - scan according to the real circumstance of estarl and get high fault coverage with very little impact on the circuit

    本文根據estar1的實際情況，設計實現了全掃描結構，既得到了較高的故障覆蓋率，又對電路的延遲和晶元面積影響很小（延遲時間增加0 . 3 ，晶元面積增加0 . 01 ） 。
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