secondary ion 中文意思是什麼
secondary ion
解釋
次級離子-
In most recent studies, researchers have analyzed aluminum - rich minerals such as anorthite and hibonite using an ion microprobe, which bombards a sample with a focused ion beam to release secondary ions from the sample ' s surface
在最新的研究中，科學家使用離子微探針來分析鈣長石、黑鋁鈦鈣石等富含鋁的礦物，以聚焦的離子束撞擊樣本，使樣本表面釋出次級離子。 -
The very low electrode potential of lig is an another important reason for the good electrochemical performance of li - ion secondary batteries
嵌鋰石墨大量用做鋰離子二次電池另一個重要原因就是嵌鋰石墨具有非常低的電極電位。 -
The colloid adhered the surface of jadeite, formed limonite after dehydrating and crystal. then the secondary color came into being owing to the limonite subsidence. the iron ion which are needed for the secondary color mainly came from outside
對于硬玉所佔比例比較大的翡翠，翡翠次生色形成所需的鐵主要來自於外界，對于含有富鐵礦物的硬玉，既有自身析出的鐵，又有來自外界的鐵。 -
The fabrication parameters were preliminarily optimized. the morphology and composition of the samples of the diamond film for different b / c ratios was investigated by scanning electron micrograph ( sem ) and raman scattering spectroscopy ( raman ). the content of different levels of b dopant in the diamond film was tested by secondary ion mass spectrometry ( sims )
闡述了摻硼金剛石膜的制備工藝，研究了摻硼金剛石膜成核和生長的影響因素，初步優化了沉積摻硼金剛石膜工藝參數，同時對摻硼金剛石膜進行了掃描分析、拉曼分析、二次離子質譜分析和電阻率測試。 -
Recent studies on anode materials for lithium ion secondary battery are reviewed
綜述了最近幾年來鋰離子二次電池負極材料的研究。 -
In the paper the structure and principle of the secondary ion mass spectrometry ( sims ) are reported, and its typical applications in the hgcdte material and devices processing, especially in the measurement of the junction depth and the quantity analysis of trace impurity are introduced
摘要文章介紹了二次離子質譜儀的結構及其基本工作原理，並通過對典型應用的分析，介紹了二次離子質譜分析技術在高靈敏度碲鎘汞紅外焦平面探測器材料和器件制備工藝中的作用，特別是在結探監測和微量雜質監控方面所發揮的重要作用。 -
Secondary ion spectroscopy
二次離子譜法 -
Secondary ion spectrometer
二次離子譜儀 -
Secondary ion mass spectrometer
二次離子質譜計 -
Surface chemical analysis - secondary - ion mass spectrometry - determination of relative sensitivity factors from ion - implanted reference materials
表面化學分析.次級離子質譜法.測定離子注入標樣的相對靈敏系數 -
Surface chemical analysis - secondary - ion mass spectrometry - method for depth profiling of boron in silicon
表面化學分析.再生離子質量光譜測定.硅中硼的深仿形分析法 -
Secondary ion mass spectrometry
二次離子質譜法 -
Surface chemical analysis - information format for static secondary - ion mass spectrometry
表面化學分析.靜態次生離子質譜法的信息格式 -
Surface chemical analysis - secondary ion mass spectrometry - determination of boron atomic concentration in silicon using uniformly doped materials
表面化學分析.次級離子質譜法.利用均勻摻雜材料測定硅中硼原子濃度 -
Surface chemical analysis - secondary - ion mass spectrometry - method for estimating depth resolution parameters with multiple delta - layer reference materials
表面化學分析.次級離子質譜法.多層標準材料深度溶解參數的估算方法 -
Among the destructive techniques able to provide the desired depth resolution the most widely used technique is secondary - ion - mass spectroscopy ( sims )
在可以提供所希望的縱向解析度的損傷技術中，最廣泛運用的是二次離子質譜（ sims ） 。 -
Surface chemical analysis - secondary - ion mass spectrometry - determination of boron atomic concentration in silicon using uniformly doped materials
表面化學分析.次級離子質光譜測定法.採用均勻塗料的硅中硼原子濃度測定 -
The films were characterized by diffraction, x - ray photoelectron spectroscopy, scanning electron microscopy, secondary ion mass spectrometer to research their hfa phase, morphology, fluorine content and fluorine distribution
在實驗中運用xrd 、 xps 、 sem 、 sims 、 sem等技術對薄膜的相組成、表面形貌、氟含量以及氟分佈進行了分析和研究。 -
Secondary ion background
二次離子本底 -
The conductivity, components and profile of the n - type diamond were characterized by hall effect, secondary ion mass spectrometry ( sims ) and the scanning electron microscopy ( sem )
通過hall效應，二次離子質譜（ sims ）及掃描電子顯微鏡（ sem ）等多種技術手段，對n -型金剛石薄膜的導電特性、成分和薄膜的形貌等方面進行了表徵。
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