small angle x-ray diffraction 中文意思是什麼
small angle x-ray diffraction
解釋
小角度x射線衍射- small : adj 1 小 （opp large） 少 （opp large numerous） 細小的；窄小的；瑣細的；些微的；少額的（收入等）...
- angle : n 【英史】盎格魯人〈cf Angles〉。n 1 角，隅，角落；棱，嬗角。2 【數學】角，角位，角的度數。3 【機...
- x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
- ray : n 雷〈姓氏，男子名， Raymond 的昵稱〉。n 1 光線，射線，熱線；〈詩〉光輝，閃爍，曙光，一線光明。2 ...
- diffraction : 分解
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In the depositing process, small angle x - ray diffraction method was used to measure thin films repeatedly, form which the optimized parameters of depositing soft x ray thin films were gained. under the parameters, five soft x ray multilayer mirrors were fabricated
在多層膜的淀積過程中，使用小角x射線衍射的方法對多層鏡進行了反復的標定，獲得了軟x射線短波段多層膜反射鏡沉積的優化工藝參數。 -
The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage
利用掠入射x射線分析（ gixa ）技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射（ saxs ）技術測量了薄膜的厚度;採用原子力顯微鏡（ afm ）觀察了薄膜的表面形貌;運用能量損失譜（ eds ）及x射線熒光光譜（ xrf ）對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
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