thin-layer sample 中文意思是什麼
thin-layer sample
解釋
薄層樣品-
The phenomenon of interference is presented when the x - ray beam hits the thin layer sample at glancing angle, the angles corresponding maximal and minimal intensity of x - ray fluorescence are described when the phenomenon of double - beam interference or multiple - beam interference is occurred
介紹了掠射x射線與薄膜樣品作用時產生的干涉現象,給出了x射線雙光束干涉和多光束干涉產生極值的條件。 -
Thin layer resin phase spectrophotometric determination of trace bismuth in water sample
薄層樹脂相分光光度法測定水中痕量鉍 -
Especially, it becomes more and more important in the field of analysis of the thin layer ' s characteristics, analysis of contaminants on semiconductor wafers and surface test for ferromagnetic substance. because grazing x - ray fluorescence techniques have the advantages, which are non - destructive nature analysis method, simple and economical for sample preparation, good fidelity and high precision for results
X射線分析技術具有試樣無損分析、制樣經濟方便、操作簡單、分析結果重現性好及精度高等優點,使得這項技術在薄膜特性分析、半導體材料及磁鐵材料表面檢測方面受到特別的青睞。
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