voltage scanning 中文意思是什麼

voltage scanning 解釋
電壓掃描
  • voltage : n. 【電學】電壓,電壓量,伏特數。 the working voltage (電氣的)耐壓限度。
  • scanning : n. 1. 細看,細察,審視。2. 【電視】掃描,掃掠,搜索。
  1. Lc apparatus almost meet all the needs of space optical communication such as weight, size, power consume, life, cost, driving voltage, intergration of optics and electricity, programe, optically take ? over aperture, beam scanning, deflexional range and so on. switches, deflexional facilities and scanning equipments which made with lc have been used in the system of labor in space communication. the only bug of lc apparatus is that their answer speed only get microsecond rate or submicrosecond rate. but it is practical for them to be used in special beam capture, scan, deflexion controling which don ’ t concerned with code rate and code type

    液晶器件幾乎滿足空間光通信的所有大的指標要求如重量、尺寸、功耗、壽命、成本、驅動電壓、光電集成、可編程性、光學接收孔徑、光束掃描和偏轉范圍等等。液晶光開關、光偏轉器、光掃描器已經開始應用於光纖通信的實驗系統中。液晶類器件應用於光通信的唯一重大缺陷,是其響應速度目前只能達到微秒級或亞微秒級,不過,在不涉及到碼型碼率的空間光束捕獲、掃描、偏轉、控制方面,液晶器件完全可能進入實用化。
  2. Tensile properties and impact properties measurements were done at room temperature. the volume resistivity of rectangular samples was measured using a zc36 electrometer and a high 240a voltage supply, for samples with a low resistivity level a dt - 9205b digital multimeter was used, silver paint was applied to ensure complete contact between sample and electrodes, namely, to eliminate the contact resistance. the phase morphology of blends was also studied using a jeol jsm - 5900lv scanning electron microscope ( sem )

    體積電阻率的測定:當r _ v 10 ~ 8時,製成100 100 4mm板材,用zc36型高阻儀測量;當r _ v 10 ~ 8時,用dt - 9205b型數字式萬用表測試試樣的體積電阻,為了減小接觸電阻對測試的影響,採用銀導電膠將銅片粘接在試樣的兩個端面上,靜置24小時,待銀導電膠凝固,試謝長瓊:熱拉仲對pet / pe / cb復合導電體系形態和性能的影響樣的電阻穩定后再測量。
  3. The chemical composition and microstructures of the insulating thin films prepared by different methods were analyzed by x - ray diffraction ( xrd ) and scanning electron micrograph ( sem ) ; other properties such as electric resistance, the breakdown field strength and dielectric properties were evaluated using high resistance meter, voltage resistance meter and precision impedance analyzer respectively

    採用x射線衍射儀( xrd )對表面絕緣薄膜的物相組成進行了分析,掃描電子顯微鏡( sem )對表面絕緣薄膜的微觀結構進行了研究,並用絕緣電阻測試儀、耐壓測試儀和精密阻抗分析儀分別對絕緣膜進行絕緣電阻率、擊穿場強和介電性能的測試。
  4. We have designed the scanning and control system, which includes a pre - amplifier, a pid feedback and scanning - control circuit, high - voltage amplifiers and so on. the function of controlling scan and feedback has been realized

    設計完成包含有前置放大電路、 pid反饋和掃描控制電路、高壓放大電路等掃描控制電路在內的掃描控制系統,完成各部分電路性能的測試及功能調試,實現反饋和掃描控制。
  5. Although this book deals, in the main, with the now well established techniques of analysis in conventional tem, a brief treatment is also given of further techniques of defect analysis such as high voltage electron microscopy ( hvem ) and scanning transmission electron microscopy ( stem ) this treatment is by no means detailed but is included to show that the subject is still developing in an exciting and challenging way

    雖然這本書主要講述目前公認的常規tem分析技術,對于進一步的缺陷分析技術比如高壓電子顯微鏡( hvem )和透射電子顯微鏡法( stem )的簡單的處理也是有的,但是這種處理並不詳盡,只是列舉了在令人振奮和富有挑戰性的發展中課題中暴露出來的問題。
  6. We introduce the fabrication of all samples and anneal of fexcu ( 1 - x ) granular film in detail. the configuration of granule film is investigated by scanning tunneling microscope ( stm ). the matter phase is analyzed by x - ray diffraction ( xrd ). the hysteresis loop of co / al2o3 / feni magnetic tunnel junction is studied by vibrating sample magnetometer ( vsm ). we use microresistance test system ( mts ) to investigate the character of resistance, conductance, voltage and current

    用掃描電子顯微鏡( stm )觀察顆粒膜樣品的表面形貌;用x ?射線衍射儀( xrd )對顆粒膜樣品進行物相分析;用振動樣品磁強計( vsm )對co al _ 2o _ 3 feni隧道結的磁滯回線作了研究;用微電阻測試系統對樣品電阻、電導、電流、電壓相關特性進行詳細的研究。
  7. Fixed camera fastening its interior is loaded with an electric motor, on installs the good camera after the level to be possible to adjust the angle which the camera deals with, after achieved the best surveillance effect may accept the automatic control regulator by the electric motor the signal precisely to move the localization in under the control signal function, the camera already may automatically carry on the horizontal scanning to monitor the region, also may in under the monitoring center attendant s operation the moving surveillance object input voltage : ac 24v 50 60hz, 110v 60hz, 220v 50 60hz external dimensions : 119mm 115mm is high the weight : 0. 9kg material : abs high strength casts takes shape the degrees rotation : level biggest : 350, vertical 90 may adjust the velocity of whirl : 5 second 4 seconds revolve the spacing : exterior spacing card tunable load : 7kg function input plug : 1

    Kl - 306室內水平雲臺是安裝,固定攝像機的支撐設備.它內部裝有一電動機,在水平雲臺上安裝好攝像機后可調整攝像機俯仰的角度,達到最好的監視效果后可由電動機接受來自控制器的信號精確地運行定位.在控制信號的作用下,雲臺攝像機既可自動進行水平掃描監視區域,也可在監控中心值班人員的操縱下跟蹤監視對象
  8. Cyclic voltammetry ( cv ) and linear scanning microscopy ( lsv ) results show that the anode reactive rate is limited at low electrode voltage for electro - oxidation of methanol, formaldehyde or formic acid, the over - voltage being about soomv

    循環伏安和線性掃描曲線表明甲醇,甲醛和甲酸在低陽極電位下反應速率有限,存在約300mv的過電位。
  9. Different principles and modes of sfm are discussed. the imaging principle of piezoresponse atomic force microscopy, scanning nonlinear dielectric microscopy, kelvin force microscopy are theoretically analysed, and the influence of voltage, contact force and microcantilever on the domain investigation is studied. the parameters of instrument are optimized using the same sample

    探討sfm檢測電疇的不同機理和成像模式,從理論上分析了壓電響應原子力顯微鏡( pfm ) 、掃描非線性介電顯微鏡( sndm )和開爾文力顯微鏡( kfm )檢測電疇的成像原理;實驗研究了電壓、作用力、探針等的改變對電疇成像的影響。
  10. That test part of the software is primarily used to complete the test of some parameters, such as time base, time - expand, time interval, voltage interval, vertical, stable state, transient state and scanning linearity. the result of the test needs to be analyzed and judged. clear user interface and timely warnings for mistakes of testing process inside because of the user ' s fault operating make whole test process more easier than it did on a time

    該軟體的測試部分主要用於完成對示波器掃描時間系數、擴展掃描時間系數、 t時間測量、 v電壓測量、垂直偏轉系數、頻帶寬度、校準信號、脈沖瞬態響應、掃描線性誤差時等參數的測試檢定任務,並對測試結果進行及時的分析和判斷,由於界面清晰,而且對測試過程中由於用戶的誤操作都有及時的錯誤提示,使得整個測試過程簡單易行,對于用戶來講掌握起來也更為方便些。
  11. The lead zirconate titanate ( pzt ) / polymer composite presented large tan5 and dynamic modulus when the composites were exposed to higher polarization voltage and longer polarization time, because of the uniform dispersion of ceramic in polymer matrix and the strong interaction between grain and polymer. the morphology of the composites, namely the degree of the grains dispersion in polymer, can be observed through scanning electric microscope ( sem )

    顆粒結構性高的壓電陶瓷,其復合體系內耗大;在高極化電壓、長極化時間下,壓電陶瓷顆粒在聚合物中分散比較均勻,與聚合物接觸面大,相互間作用強;在外力作用時,體系tanb 、 g , , g ?呈現大的值。
  12. 4. a 8 - cascaded wavelength - division - multiplexed fiber bragg grating sensor system was interrogated by changing voltage acting on a employed tunable fabry - perot filter, and a feedback loop was introduced to make filter track the shifted wavelength of the sensor. at the same time an unbalanced scanning michelson interferometer was introduced to demodulate sensor signal

    同時為克服查詢某一光柵時,應變引起波長漂移導致反射波長偏離f - p透過波長,利用一反饋控制裝置,使得濾波器的透過波長自動追蹤查詢光柵的布一拉格波長,利用非平衡掃描michelson干涉儀對傳感信號進行了高解析度的解調。
  13. It was found that large scale single crystal ttf m - nbp film can be obtained by this method. atomic resolution surface images were observed both with atomic force microscope and scanning tunneling microscope. high density data storage was realized by applying voltage pulses between the stm tip and the substrate

    用原子力顯微鏡afm和掃描隧道顯微鏡stm都觀察到了ttf m - nbp薄膜表面的原子級分辨像。通過stm針尖施加脈沖電壓在ttf m - nbp薄膜上實現了納米級的信息存儲,最小記錄點直徑約為1 . 2nm 。
  14. Scanning voltage generator

    掃描電壓發生器
  15. The induced formation and motion of copper steps on the surface of cu covered with glycine occur in the area where has been scanned by scanning tunneling microscope with higher negative bias voltage v

    2 . 5v的條件下使用掃描隧道顯微鏡stm掃描吸附有甘氨酸的cu 111表面,在掃描區域內原有銅臺階的形狀發生了變化並產生了新的銅臺階。
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