x ray diffraction method 中文意思是什麼

x ray diffraction method 解釋
線繞射法
  • x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
  • ray : n 雷〈姓氏，男子名， Raymond 的昵稱〉。n 1 光線，射線，熱線；〈詩〉光輝，閃爍，曙光，一線光明。2 ...
  • diffraction : 分解
  • method : n 1 方法，方式；順序。2 （思想、言談上的）條理，規律，秩序。3 【生物學】分類法。4 〈M 〉【戲劇】...
  1. Test method for ratio of anatase to rutile in titanium dioxide pigments by x - ray diffraction

    X射線衍射法測定二氧化鈦顏料中銳鈦和金紅石比率的試驗方法
  2. The cdte films doped te are deposited onto glass substrate by close spaced sublimation. the x - ray diffraction data indicate the pure cdte films are polycrystalline zinc - blende structure with grain orientation predominantly along ( 111 ) direction. the electrical properties of cdte films are investigated by hall effect measurement using the van der pauw method

    X射線衍射分析表明，純cdte薄膜是立方閃鋅礦結構， （ 111 ）晶面取向生長； hall效應實驗測量發現薄膜電阻很高，呈p型電導，面電阻率數量級達1010
  3. Lc test method for crystallite size of calcined petroleum coke by x - ray diffraction

    用x -射線照繞射法測定煅燒石油焦中結晶尺寸
  4. Standard test method for determination of crystallite size of calcined petroleum coke by x - ray diffraction

    用x射線衍射法測定焙燒石油焦結晶大小的試驗方法
  5. In chapter two, we fabricated r - ni - fe / al2o3 nanocomposites successfully by using ball - milling mixing method plus hot - pressing process. meanwhile, their microstructures are characterized by x - ray diffraction ( xrd ) analyser, transmission electron microscopy ( tem ), field emission scanning electron microscopy ( fe - sem ) and brunauer - emmett - teller ( bet ). the results indicate that ni - fe particles are homogenously dispersed in the matrix in the composites

    在第二章中，我們採用高能球磨混合方法加上熱壓燒結工藝，成功制備了ni - 20fe al _ 2o _ 3納米復合材料，並通過x射線衍射儀（ xrd ） 、透射電鏡（ tem ） 、場發射掃描電鏡（ fe - sem ） 、比表面孔隙儀（ bet ）對該復合材料的微結構進行了表徵。
  6. Measuring retained austenite of carburize layer of low carbon alloys with x - ray diffraction method

    射線衍射法測定滲碳鋼中殘余奧氏體
  7. The testing result has a good consistance with that of the traditional x - ray diffraction method

    檢測結果與傳統的x射線檢測法的結果相一致。
  8. The enhanced photoconductive effect from small amount of tnf facilitates the preparations of new organic photoconductive devices under the drive of low fields. in the fourth chapter, inclpc nanoparticles embedded in poly ( n - vinylcarbzaole ) ( pvk ) were prepared successfully by dissolving inclpc in aprotic organic solvent / lewis acid with great concentration for the formation of electron donor - acceptor complexes, i. e., the method of complexation - mediated solubilization. the fabricated inclpc nanoparticles were characterized by means of uv / vis absorption, x - ray diffraction pattern, and tem

    論文的最後一章中，我們合成了具有較好的電子傳輸性能的化合物』一二苯基四竣酸花酚亞胺（ ddp ） ；研究了其溶解性、熱穩定性、晶體結構、紅外光譜、紫外吸收光譜和蒸鍍薄膜的屬性，並用量子化學計算方法模擬其單分子的空間構型；載流子遷移率測試的結果約為ix10 「 、 m 』 v 」 』 ? s 「 』 。
  9. Study on negative thermal expansion material zrw2o8 by x - ray diffraction method

    一種負熱膨脹性材料的物相結構分析
  10. Phase quantitative analysis of silica bricks. x - ray diffraction method

    硅磚定量相分析. x射線衍射法
  11. Standard test method for determination of relative crystallinity of zeolite zsm - 5 by x - ray diffraction

    X射線繞射法測定沸石zsm - 5相對結晶度的標準試驗方法
  12. Using the single crystal x - ray diffraction ( scxrd ) method, we got the lattice constant, and found it was more than that of silicon

    利用單晶x - ray衍射（ scxrd ）對czsige單晶的晶胞進行了測試，發現晶胞參數發生了明顯的變化。
  13. The spinel limn2o4 is synthesized by the citrous acid method. the x - ray diffraction pattern of limn2o4 show that the product is a spinel phase with a = 0. 824nm cubic unit cell

    論文首先採用檸檬酸配位法制備尖晶石型limn2o4 ， x射線衍射（ xrd ）證實了產物的結構，晶胞參數a = 0 . 824nm 。
  14. Standard test method for verifying the alignment of x - ray diffraction instrumentation for residual stress measurement

    殘余應力測量用x射線衍射儀校準檢定的測試方法
  15. Abstract : the petrologic characteristic and the pore types of y8 y10 reservoir are studied by x - ray diffraction method, the quantitative mineral clay analysis method and thin - section analysis method. based on the study, the mistakes are corrected in the naming of the sandstone and in the composition of the pore filling substance. the pore characteristic of the sandstone and the main factors of controlling the pore development are discussed

    文摘:利用x衍射全巖分析方法、粘土礦物定量分析方法和薄片鑒定等方法研究了城華地區延8 -延10儲層巖石學特徵和孔隙成因類型.綜合論述了城華地區延8延10油組不同巖相儲層砂巖的基本特徵，糾正了砂巖定名的錯誤和主要填隙物成份的錯誤，同時還論述了儲層砂巖的孔隙特徵和控制孔隙發育的主要因素
  16. The petrologic characteristic and the pore types of y8 y10 reservoir are studied by x - ray diffraction method, the quantitative mineral clay analysis method and thin - section analysis method. based on the study, the mistakes are corrected in the naming of the sandstone and in the composition of the pore filling substance. the pore characteristic of the sandstone and the main factors of controlling the pore development are discussed

    利用x衍射全巖分析方法、粘土礦物定量分析方法和薄片鑒定等方法研究了城華地區延8 -延10儲層巖石學特徵和孔隙成因類型.綜合論述了城華地區延8延10油組不同巖相儲層砂巖的基本特徵，糾正了砂巖定名的錯誤和主要填隙物成份的錯誤，同時還論述了儲層砂巖的孔隙特徵和控制孔隙發育的主要因素
  17. In the depositing process, small angle x - ray diffraction method was used to measure thin films repeatedly, form which the optimized parameters of depositing soft x ray thin films were gained. under the parameters, five soft x ray multilayer mirrors were fabricated

    在多層膜的淀積過程中，使用小角x射線衍射的方法對多層鏡進行了反復的標定，獲得了軟x射線短波段多層膜反射鏡沉積的優化工藝參數。
  18. And then, zno thin films were synthesize on quartz and silicon substrates by sol - gel dip - coating and spin - coating. the properties of the films and the effects of growth parameters on the quality of zno films were studied using x - ray diffraction, optical absorption, photoluminescence techniques, etc. to modify the energy gap of the zno, mg2 + was added in the sol - gel solution, and mgxzn1 - xo films were prepared by the same method as that for zno films

    利用溶膠凝膠法成功地在石英玻璃和單晶矽片等襯底上制備出了c軸擇優取向的zno薄膜，並利用x射線衍射儀、紫外-可見光光譜儀、熒光光譜儀等對zno薄膜的結構和性能進行了測試、分析，並研究了熱處理參數等條件對zno薄膜性能的影響。
  19. According to this, the research of the fatigue properties of the ferroelectric films was proposed. the lead zirconate titanate ( pzt ) film was prepared by a metal - organic decomposition method. the films " physical properties were analysed by x - ray diffraction ( xrd ), scanning electron microscopy ( sem ) and hysteresis loops

    然後採用金屬有機物熱分解法制備出作為研究對象的鋯鈦酸鉛pb （ zr ， ti ） o _ 3 （ pzt ）薄膜，用x射線衍射儀、掃描電鏡和rt6000s鐵電測試儀測量表徵鐵電薄膜。
  20. X - ray diffraction method x

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