x ray diffraction microscopy 中文意思是什麼

x ray diffraction microscopy 解釋
射線衍射顯微術
  • x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
  • ray : n 雷〈姓氏，男子名， Raymond 的昵稱〉。n 1 光線，射線，熱線；〈詩〉光輝，閃爍，曙光，一線光明。2 ...
  • diffraction : 分解
  • microscopy : n. 顯微鏡學；顯微鏡使用術。
  1. In chapter two, we fabricated r - ni - fe / al2o3 nanocomposites successfully by using ball - milling mixing method plus hot - pressing process. meanwhile, their microstructures are characterized by x - ray diffraction ( xrd ) analyser, transmission electron microscopy ( tem ), field emission scanning electron microscopy ( fe - sem ) and brunauer - emmett - teller ( bet ). the results indicate that ni - fe particles are homogenously dispersed in the matrix in the composites

    在第二章中，我們採用高能球磨混合方法加上熱壓燒結工藝，成功制備了ni - 20fe al _ 2o _ 3納米復合材料，並通過x射線衍射儀（ xrd ） 、透射電鏡（ tem ） 、場發射掃描電鏡（ fe - sem ） 、比表面孔隙儀（ bet ）對該復合材料的微結構進行了表徵。
  2. Among various fabrication techniques of thin film, the sol - gel process has gained much interest for the preparation of pzt thin film, due to ihe advantages of good homogeneity, easy control of composition, low in - ill i reaving temperature, easy formation of large area thin films pb ( zrxti : - k ) 0 :, ( pzt ) films were prepared on the ito coated glass plates and low resistor silicon wafer in sol - gel dip - coating process associated wi di heat treatment : at different temperatures and characterized by x - ray diffraction ( xrd ) and transmission electron microscopy ( tem ). lt is shown that the pzt ferroelectric thin films with ( 110 ) preferred orientation and well - crystallized perovskite structure can be obtained after annealing at 680 ? for 30 minutes on ito substrate and at 800 " c for lornin on silicon substrate

    Pzt的制備方法有很多，其中溶膠?凝膠（ sol - gel ）方法可以和集成電路（ ic ）光刻工藝相互兼容，處理溫度低，有大面積塗敷性能，能精確地控制組分，無需復雜的真空設備，成本低廉，所以對于集成鐵電薄膜電容的應用這種方法有很廣闊的前景。本文利用sol - gel技術在摻錫的in _ 2o _ 3透明導電薄膜（ ito ）襯底和低阻硅襯底上成功地制備了pzt鐵電薄膜。運用了x射線衍射， sawyer - tower電路和lcr電橋分別對薄膜的晶化溫度，結構和電學性能進行了測試。
  3. Firstly, the tio2 thin films are deposited by dc reactive magnetron sputtering apparatus, and characterlized by n & k analyzer1200, x - ray diffraction spectroscopy ( xrd ), scanning electronic microscopy ( sem ), alpha - step500. and it was analyzed that the effect on performance and structure of films with the change of argon flow, total gas pressure, the substrate - to - target distance and temperature

    第一、應用穩定的直流磁控濺射設備制備tio2減反射薄膜並通過n & kanalyzer1200薄膜光學分析儀、 x射線衍射分析（ xrd ） 、掃描電子顯微鏡（ sem ） 、 alpha - step500型臺階儀等儀器對薄膜進行表徵，分析氧分壓、總氣壓、工作溫度、靶基距等制備工藝參數對薄膜性能結構的影響。
  4. The as - grown crystals were characterization by cutting and directional, x - ray diffraction, high resolution ohmmeter, ir transmission spectroscopy, visible light absorption spectroscopy, scan electronic microscopy ( sem ) and positron annihilate time technique ( pat ). the ir transmittance of czt single crystals grown with cd - riched is about 53 %, while 23 % with no cd riched

    採用解理實驗、 x射線衍射、電學性能測試、紅外透過譜測試、可見光吸收譜測試、 sem蝕坑分析、探測器的試制等分析測試方法，並首次採用正電子湮沒壽命譜分析方法來研究czt單晶體的空位缺陷，綜合表徵了所生長的晶體的質量和性能。
  5. Components, structure and surface morphology of the resulted films were identified by fourier transform infrared ( ftir ) spectroscopy, x - ray diffraction ( xrd ) and scanning electronic microscopy ( sem ). the analyses showed the content of cubic boron nitride in the resultant films on substrates was rather high and crystal particles of c - bn with uniform size, smooth crystal plane and regular shapes ( quadrangle and hexagon ) densely arrayed on the substrate

    傅里葉轉換紅外吸收（ ftir ）光譜儀、 x射線衍射（ xrd ）儀和掃描電鏡（ stm ）的測量結果顯示，基底上的bn膜中立方相含量很高，且晶粒大小均勻、排列緻密，晶形呈規則的四角和六角形。
  6. Their properties have been investigated by using scanning electronic microscopy ( sem ), differential scanning calorimetry ( dsc ), x - ray diffraction ( xrd ), thermogravimetry - differential thermal analysis ( tg - dta ), infrared spectroscopic analysis ( ir ), and gas chromatography ( gc ), etc. the effects of the mulser ' s stirring rate and the emulsifier concentration on the properties of encapsulated pcms have been systematically studied, and nanopcms have been obtained by increasing the stirring rate or the emulsifier concentration. the influences of different nucleating agents on micropcm performances have also been investigated in detail to search for a suitable nucleating agent to prevent micropcms from super - cooling

    首先，系統研究了乳化機轉速和乳化劑濃度對膠囊性能的影響，並通過提高轉速或乳化劑濃度獲得相變材料納膠囊；其次，系統研究了不同成核劑對微膠囊性能的影響，找到合適的成核劑抑制了相變材料微膠囊的過冷現象；再次，詳細研究了環己烷對膠囊性能的影響，並通過添加適量環己烷提高了相變材料微膠囊及納膠囊的耐熱溫度。
  7. The primary theory of absorption and desorption was also explained. the effects of primary process parameters, such as hydrogen pressure, time and temperature on the magnetic properties of ndfeb have been researched. the structure and magnetic properties have been analyzed by means of optical metallographic microscopy, scanning electronic microscopy, x - ray diffraction analysis, infrared oxygen detector and magnetic properties measurement

    本文設計了燒結ndfeb的氫爆制粉設備，對設備調試以及使用過程中出現的主要問題進行了簡要的說明，提出了一系列解決方法；闡述了吸氫、脫氫的基本原理；研究了氫氣壓力、通氫時間、氫爆溫度等基本工藝參數對磁性能的影響；利用金相顯微鏡和掃描電子顯微鏡， x射線衍射分析，紅外線測氧分析及綜合磁性測量儀等手段分析了材料的組織結構和磁性能。
  8. The cenosphere particles were characterized with optical microscope, field emission scanning electron microscopy ( fesem ), energy - dispersive spectroscopy ( eds ) and x - ray diffraction ( xrd ) in and after the plating

    用光學顯微鏡、場發射掃描電子顯微鏡、能譜儀和x射線衍射儀對其進行了分析表徵。
  9. The corrosion behavior of nanocrystalline ( nc ) copper bulks with various grain sizes prepared from igc ( inert gas condemsation ) and vacuum annealing in comparison with conventional microcrystalline ( mc ) copper ( as - rolled and electrolytic ) in acid copper sulphate solution and neutral solution containing chlorides under free corrosion conditions and anodic polarizations has been studied using potentiodynamic polarization, potentiometric analysis, cyclic voltammetry and electrochemical impedance spectroscopy. x - ray diffraction was used to estimate the grain size of the annealed nc copper. field emission gun scanning electron microscopy and x - ray energy - dispersive spectroscopy was used to characterize the surface morphology and analyze the surface composition after the polarization and potentiometric test of both nc and mc copper

    本文研究了用igc （惰性氣體蒸發凝聚原位溫壓法）制備並真空退火到不同晶粒尺寸的納米晶銅和微米晶銅（冷軋紫銅、電解銅）在酸性硫酸銅溶液和中性含氯溶液中，在自腐蝕狀態和陽極極化狀態下的腐蝕性能。使用了動電勢極化、電位測定、循環伏安法（ cv ）和電化學阻抗譜（ eis ）等方法。 x -射線衍射（ xrd ）的方法用來估算納米晶銅晶粒尺寸。
  10. This study was focused on the occurrence characteristics of the cryptomelane - bearing ores and the mineralogical characteristics of natural cryptomelane. the morphology, chemical and structure features of natural cryptomelane were characterized by means of powder x - ray diffraction, scanning electron microscopy, electron probe microanalyzer, energy dispersive spectrometer and x - ray fluorescence

    利用x -射線粉晶衍射掃描電鏡電子探針電子能譜和x熒光光譜對天然錳鉀礦的形貌特徵化學成分結構特徵進行研究，結果表明天然錳鉀礦晶體形態主要為針狀纖維狀，沿
  11. Again, because the ion influx technique have a little damnification on the skin - deep structure for the cdte thin films, among the experiment, we have let the doped cdte thin films be annealed a hour with n2 atmosphere at 500, and then slowly cooled until the room temperature. via the test and analyse, heat treatment has very important effect on the comeback of crystallattice surface disfigurements. finally, the films were characterized by x - ray diffraction ( xrd ), scanning electron microscopy ( sem ), ultraviolet visible ( uv ) and the hall effect measurement

    再次，由於離子注入會對薄膜表面的結構造成損傷，本實驗把被注入離子的cdte薄膜在n2氣氛中500下退火1個小時，然後緩慢冷卻至室溫。經測試分析，熱處理對晶格表面缺陷的恢復有很重要的作用。最後，利用xrd 、 sem 、紫外可見分光光度計及hall測試系統研究其結構，表面形貌和光電性能。
  12. The properties of thin films have been investigated with modern analysis technique, such as afm ( atom force microscopy ), sem ( scanning electron microscope ), xrd ( x - ray diffraction ) and rocking curve ( - scan ). and the properties of ybco thin film and its substrate and deposition temperature have been analysed, comparing with lao substrate ' s crystallization quality, ybco thin film properties, such as morphology and degree of grain alignment, was concluded to correlate with the crystal orientation uniform of lao substrate as revealed by xrd

    本文結合afm 、 sem研究ybco薄膜的表面形貌， xrd 、 fwhm分析薄膜的結晶情況，並結合成膜溫度和基片的質量進行一系列結構與性能的對比研究，發現laalo3 （ lao ）基片的質量對ybco薄膜的結構完整性有很大影響，不僅影響了薄膜的c軸取向性，而且影響了ybco的超導性能。
  13. The morphology, composition and crystalline of the composite particles were characterized by scanning electron microscopy ( sem ), x - ray diffraction ( xrd ) and thermo - gravimetric analysis ( tga ) techniques

    利用掃描電子顯微鏡（ sem ） 、 x -射線衍射分析（ xrd ）和熱重分析（ tga ）對復合微球的形貌、無機沉積物cds的晶型和有機-無機成分相對含量等進行了表徵。
  14. The melted tungsten carbide would react with the steel matrix on the interface and the reaction zone was observed as a result. the reacting production was examined as fe3w3c by means of x - ray diffraction and scanning electron microscopy analysis. the reaction between tungsten particle and steel matrix could improve the interfacial bonding strength remarkably

    Wc鋼復合材料的制備過程中， wc顆粒在高溫下發生了局部溶解並在wc顆粒和鋼基體界面處發生了界面反應； x射線衍射和電子衍射花樣分析表明，反應產物為高穩定性的fe _ 3w _ 3c ，界面反應有效地改善了wc顆粒與鋼基體的界面結合。
  15. Study on the optical properties of transparent epoxy / clay nanocomposites a new type transparent epoxy based nanocomposites has been prepared by the reaction of alkylammonium exchanged montmorillonite ( amt ) with diglycidyl ether of bisphenol a ( dgeba ) and triethylamine as the curing agent. the morphology of amt in the epoxy matrix was characterized with x - ray diffraction ( xrd ), scanning electron microscopy ( sem ) and transmission electron microscopy ( tem )

    光學透明環氧樹脂粘土納米復合材料光學性能採用十八烷基伯胺鹽、十六烷基三甲基溴化胺處理na基蒙脫土製備出兩種不同的有機土，以三乙胺為固化劑，有機土與雙酚a型環氧樹脂熔融插層聚合后制備出剝離型和插層型兩種結構的環氧樹脂粘土納米復合材料。
  16. Current researches, applications, preparation and structure of si3n4 are summarized in this paper. a new conclusion is drawn that silicon wafer can react with nitrogen at the temperature higher than 1100 and in super - pure nitrogen by direct - nitridation of silicon at the temperature from 800 to 1200. the prepared silicon nitride samples are tested by xps ( x - ray photoelectron spectroscopy ), sem ( scanning electron microscopy ), optical microscopy, xrd ( x - ray diffraction ) and edx ( energy dispersive x - ray analysis )

    通過矽片在800到1200各個溫度和各種氮氣氣氛下的氮化處理的實驗結果，報道了不同與其他研究者的氮化條件，矽片在氮氣保護的熱處理中的氮化條件為：高於1100的溫度和高純氮的氣氛條件，同時對該氮化硅薄膜進行了金相顯微鏡、掃描電鏡（ sem ） 、 x射線衍射儀（ xrd ） 、 x射線光電子譜（ xps ） 、 x射線能譜儀（ edx ）和抗氧化性等測試和分析。
  17. Encapsulating materials of epoxy resin are modified with hgh, nano - sio2 and organophilic montmorillonite, in the present investigation, the microstructue, some properties and influence factors about nano - sio2 and organophilic montmorillonite modified encapsulatig materials have been systematically studied using x - ray diffraction, electron microscopy and differential thermal analysis measurement techniques

    隨著航空、電子等事業的發展，灌封器件的高性能化對灌封材料提出了越來越高的要求。探索制備環氧灌封材料的新方法，尋求提高其使用性能的有效途徑是該領域研究的重要課題。
  18. According to this, the research of the fatigue properties of the ferroelectric films was proposed. the lead zirconate titanate ( pzt ) film was prepared by a metal - organic decomposition method. the films " physical properties were analysed by x - ray diffraction ( xrd ), scanning electron microscopy ( sem ) and hysteresis loops

    然後採用金屬有機物熱分解法制備出作為研究對象的鋯鈦酸鉛pb （ zr ， ti ） o _ 3 （ pzt ）薄膜，用x射線衍射儀、掃描電鏡和rt6000s鐵電測試儀測量表徵鐵電薄膜。
  19. X - ray diffraction ( xrd ) and transmission electron microscopy ( tem ) are utilized to analyze the phase, structure and size of the magnetic particles

    利用x射線衍射儀（ xrd ） 、透射電鏡（ tem ）對制得的磁粒子的組成、結構及粒徑進行了分析。
  20. The morphologies of powder were observed by using high - resolution transmission electron microscopy ( hrtem ) ; x - ray diffraction ( xrd ) pattern was used to analyze the phases of the powder ; energy dispersive x - ray spectroscopy ( edx ) was used to analyze the component of composite powder

    用高分辨電鏡觀察復合粉體的形貌，進行電子衍射分析；用d / 3ax3b型x射線衍射儀作復合粉體的物相分析；用pv9900型能譜儀作復合粉末的成分分析。
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