x ray diffractometer 中文意思是什麼

x ray diffractometer 解釋
x射線衍射儀
  • x : X2＝ （羅馬數字）10 XX ＝ 20 IX ＝ 9 XV ＝ 15 XL ＝ 40 LX ＝ 60 XC ＝ 90 DXL ＝ 540 MX ＝ 1010 ＝...
  • ray : n 雷〈姓氏，男子名， Raymond 的昵稱〉。n 1 光線，射線，熱線；〈詩〉光輝，閃爍，曙光，一線光明。2 ...
  • diffractometer : 繞射儀
  1. The composition of sample was identified by means of x - ray diffractometer ( xrd ). magnetic properties were measured by vibrating sample magnetometer ( vsm ). the combustion behavior and crystallization process of the gel were studied by means of differential thermal analysis - thermogravimetric analysis ( dta - tg )

    利用x射線衍射儀（ xrd ）確定樣品物相，振動樣品磁強計（ vsm ）進行磁性測量，綜合熱分析儀研究凝膠的燃燒和析晶過程，掃描電子顯微鏡（ sem ）和透射電子顯微鏡（ tem ）觀察粉末的形貌與粒度。
  2. The lattice constant determination of metals - method of x - ray diffractometer

    金屬點陣常數的測定方法x射線衍射儀法
  3. Carbides in high speed steel - quantitative phase analysis - method of x - ray diffractometer

    高速鋼中碳化物相的定量分析x射線衍射儀法
  4. In this study, the preparing processes of zro2 - ni nanocrystalline composite powder aremixing the nickel salt, zirconium salt and stabilizer, solvent ( distilled water ) together to prepare the mixing solution according to certain ratio ; commingling the mixing solution, coordination solution of carboxylic ammonia, intrusion aid in accordance with certain rate to form sol, drying the sol and turning it into gel, pre - sintering the gel to get the zro2 - nio powder and gaining zro2 - ni nanocrystalline composite powder by reducing the zro2 - nio powder. xrd, x - ray wide - angle diffractometer, bet, sem, tem, hrtem analyses are used to study the zro2 - ni nanocrystalline composite powder and zro2 - ni cermet. the sintering temperature is determined

    本研究的zro _ 2 - ni納米復合粉末的制備方法如下：將鎳鹽、鋯鹽、穩定劑和溶劑（水）按所需成分配成混合溶液，再將混合溶液、外加劑和氨羧絡合劑按比例混合形成溶膠，溶膠經乾燥成為凝膠，凝膠經預燒得到zro _ 2 - nio納米粉，將該氧化物粉還原得到zro _ 2 - ni納米復合粉。
  5. Using scanning electron microscopy, x - ray powder diffractometer, isis energy - dispersive spectroscopy and leica guantitative optical microscopy, the microstructure, composition profiles of cdmnznte ingots were analyzed, a and 3 phases are formed at the tip

    採用掃描電鏡、 x射線粉末衍射儀、 isis能譜儀和leica定量金相分析儀研究了cdmninte晶錠中相的結構，形貌和組分分佈。
  6. The systhesized samples are the mixture of different strontium aluminate crystal by means of x - ray diffractometer analysis

    對合成樣品進行x射線粉晶衍射分析發現，合成物是幾種鋁酸鍶晶體的混合相。
  7. X - ray powder diffractometer, x

    射線粉末衍射儀
  8. Retained austenite in steel - quantitative determination - method of x - ray diffractometer

    鋼中殘余奧氏體定量測定x射線衍射儀法
  9. The sl401 circulating water refrigeration unit is mostly used as a supporting product for precision instrument facilities with the need of isothermal cooling water, for example, the x - ray diffractometer, fluorescence spectrometer, scanning microscope, laser, energy spectrometer, vacuum forming machine, high - frequency generator, mocvd, etc

    Sl401型循環水製冷機組主要為x射線衍射儀、熒光光譜儀、掃描顯微鏡、激光器、能譜、真空成型機、高頻機、 mocvd等需用恆溫冷卻水源的精密儀器設備的配套產品。
  10. Verification regulation for polycrystalline x - ray diffractometer

    多晶x射線衍射儀檢定規程
  11. Specification for x - ray diffractometer

    X射線衍射儀.技術條件
  12. Computer - aided date interception system for certain imported x - ray diffractometer

    射線衍射儀的計算機數據截獲系統
  13. X - ray diffractometer x

    射線衍射儀
  14. Utilizing the scanning electron microscope, x - ray diffractometer, type 9310 microporosity analyzer, the microstructure and chemical composition of mudston, and its macro - variation of physical and mechanical character are measured and analysed, the mechanism of mudstone degradation and softening in water is systematically studied in this paper

    以掃描電子顯微鏡、 x射線衍射儀、 9310型微孔結構分析儀等先進的設備為測試手段，從泥巖的微觀結構及物質組成等方面入手進行研究，結合泥巖遇水后宏觀物理-力學性質的變化規律，全面闡述了泥巖遇水的崩解軟化機理。
  15. 2. the chosen nanometer cacoj particles have been tested and analyzed through advanced instruments. 1 ) the crystal structure and average size of the nanometer cacos particles have been tested by rotatory anode harrow x - ray diffractometer

    2 、採用先進的儀器對所選擇的納米碳酸鈣粒子進行了測定： （ 1 ）使用旋轉陽極靶多晶x射線衍射儀測定其晶體結構和平均粒徑大小。
  16. X - ray powder diffractometer ( xrd ), forier transform infrared spectroscopy ( ft - ir ) and crystalline parameters were used to determine the structure of the samples, x - ray photoelectron spectra ( xps ) were employed to determine the oxide state of elements in the samples

    X射線粉末衍射儀（ xrd ）和傅立葉變換紅外光譜儀（ ft - ir ）確定了不同摻雜比樣品的結構， x射線光電子能譜（ xps ）確定樣品的價態。
  17. Testing method for quantities of - al2o3 phase in alumina with an x - ray diffractometer

    剛玉磨料- al2o3相x射線定量測定方法
  18. Chapter 4 preparation of tio2 nano - films and its surface structural morphology tio2 nano - films were successfully fabricated by a sol - gel process on glass substrate. the morphology and microstructure of films were investigated via atomic force microscope ( afm ), x - ray diffractometer ( xrd ) and transmission electron microscopy ( tem )

    凝膠法制備了tio _ 2納米溶膠，在不同的處理方式下以刮片法制幾種無機納米材料的制備、表徵與應用備了兩種ti仇多孔納米薄膜，並利用afm ， tem ， xrd等測試方法對膜表面結構及物理化學特性進行了表徵。
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