xrf x-ray fluorescence x 中文意思是什麼

xrf x-ray fluorescence x 解釋
射線熒光(檢查)法
  • xrf : x線熒光光譜學
  • x : X2= (羅馬數字)10 XX = 20 IX = 9 XV = 15 XL = 40 LX = 60 XC = 90 DXL = 540 MX = 1010 =...
  • ray : n 雷〈姓氏,男子名, Raymond 的昵稱〉。n 1 光線,射線,熱線;〈詩〉光輝,閃爍,曙光,一線光明。2 ...
  • fluorescence : n. 熒光(性)。
  1. It is used in solar cells and semiconductor detectors for astrophysical research, for x - ray fluorescence ( xrf ) analysis, industrial gauging, nuclear proliferation treaty verifaction et. al, and also in laser window and infrared array technology as subtriate for hg1 - xcdxte

    同時它還可作為紅外探測器材料碲鎘汞( hgcdte )和外延襯底,以及激光窗口和太陽電池等。
  2. The phase structure of different cu - fe thin films were studied by using grazing incidence x - ray analysis ( gixa ). the texture and residual stress of different cu - fe thin films were measured by scan of x - ray diffraction ( xrd ) and 2 scan with different. the thicknesses of different thin films were characterized by means of small angle x - ray scattering ( saxs ) technique. by using atomic force microscope ( afm ) measured surface roughness of thin films. the component of different thin film was characterized by energy disperse spectrum ( eds ) and x - ray fluorescence ( xrf ). the magnetic properties of cu - fe thin films were measured by means of vibrating sample magnetometer ( vsm ). in addition, the giant magnetoresistance ( gmr ) effects of different films were also measured. the original resistance of the film fabricated by a direction - current magnetron sputtering system is directly affected by bias voltage

    利用掠入射x射線分析( gixa )技術對不同cu - fe薄膜的相結構進行了研究;利用xrd掃描及不同角度的2掃描對薄膜進行了結晶織構及殘余應力分析;運用小角x射線散射( saxs )技術測量了薄膜的厚度;採用原子力顯微鏡( afm )觀察了薄膜的表面形貌;運用能量損失譜( eds )及x射線熒光光譜( xrf )對薄膜進行了成分標定;使用振動樣品磁強計測量了不同cu - fe過飽和固溶體薄膜的磁性能;最後利用自製的磁阻性能測試設備測量了真空磁場熱處理前後不同薄膜的巨磁阻值。
  3. Xrf x - ray fluorescence spectroscopy of pigments and extenders

    顏料和填充劑的x射線螢光
  4. X - ray fluorescence spectrometer xrf

    射線熒光光譜儀
  5. Components of pottery samples excavated in the shang ji fang ying zi site were analyzed by x - ray fluorescence spectrometry ( xrf ) with multivariate statistical analysis by spss software

    摘要利用x射線熒光對上機房營子遺址出土陶器殘片的成分進行分析,用社會科學用統計軟體包( spss )對實驗數據進行多元統計分析。
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