射電分光儀 的英文怎麼說

中文拼音 [shèdiànfēnguāngyí]
射電分光儀 英文
radio spectrometer
  • 射 : Ⅰ動詞1 （用推力或彈力送出） shoot; fire 2 （液體受到壓力迅速擠出） discharge in a jet 3 （放出） ...
  • 電 : Ⅰ名詞1 （有電荷存在和電荷變化的現象） electricity 2 （電報） telegram; cable Ⅱ動詞1 （觸電） give...
  • 分 : 分Ⅰ名詞1. （成分） component 2. （職責和權利的限度） what is within one's duty or rights Ⅱ同 「份」Ⅲ動詞[書面語] （料想） judge
  • 光 : Ⅰ名詞1 （照耀在物體上、使人能看見物體的一種物質） light; ray 2 （景物） scenery 3 （光彩; 榮譽） ...
  • 儀 : 名詞1 （人的外表） appearance; bearing 2 （禮節; 儀式） ceremony; rite 3 （禮物）present; gift 4 ...
  1. The emulsoid particle size and its distribution were determined by laser particle sizer. the composition changes of acr were inspected by ir, and the core - shell structure was observed by tem. the morphologyes of acr resin particles were inspected by polarization microscope at last

    通過激光粒度分析儀對所合成的乳膠粒徑及其分佈進行了分析測試，藉助于ir考察了所合成的acr的組成變化，並通過透射電鏡對所合成的acr的核殼結構進行了驗證，最後藉助于偏光顯微鏡觀察了破乳乾燥后得到的acr粒子。
  2. The feature of optical fiber transmission system and its effect on the solar radio heliograph are analyzed in this article

    摘要分析了光纖傳輸系統的特性，及其對太陽射電頻譜日像儀的影響。
  3. Firstly, the tio2 thin films are deposited by dc reactive magnetron sputtering apparatus, and characterlized by n & k analyzer1200, x - ray diffraction spectroscopy ( xrd ), scanning electronic microscopy ( sem ), alpha - step500. and it was analyzed that the effect on performance and structure of films with the change of argon flow, total gas pressure, the substrate - to - target distance and temperature

    第一、應用穩定的直流磁控濺射設備制備tio2減反射薄膜並通過n & kanalyzer1200薄膜光學分析儀、 x射線衍射分析（ xrd ） 、掃描電子顯微鏡（ sem ） 、 alpha - step500型臺階儀等儀器對薄膜進行表徵，分析氧分壓、總氣壓、工作溫度、靶基距等制備工藝參數對薄膜性能結構的影響。
  4. The epitaxial growths of ingaas / gaas / algaas fundamental material and the fabrication of 45 - deflector are extensively studied in our work. some measuring methods are used to evaluate the growth quality of our grown structure by pl, cv, x - ray double crystal diffraction, sem etc. property analysis are provided for it

    利用高能電子衍射、電化學c - v 、掃描電鏡（ sem ） 、 x射線雙晶衍射儀、光熒光譜儀（ pl ） 、原子力顯微鏡等多種方法對制備的器件進行了檢測，同時對實驗結果進行了必要的分析。
  5. Standard practice for calibration of the electron binding - energy scale of an x - ray photoelectron spectrometer

    X -射線光電分光儀的電子結合能刻度表校準的標準實施規程
  6. The components, microstructure, luminousness, thickness and surface topography of the films were analysised via xrd, uv ? vis, xps, ellipsometric examination and stm. the photocatalytic properties of these fims are characterized by the decomposition rate of methylene blue or rhodamine b. the effect of sputtering power, temperature, o2 mass flow, bias, w - doping and sputtering time on photocatalytic properties are discussed

    採用x射線衍射儀、紫外-可見光分光光度計、 x光電子能譜儀、薄膜厚度測試儀及掃描探針顯微鏡等測試手段，研究分析了薄膜的組分、結構、透光率、膜厚和表面形貌等。
  7. All my samples with good orientation are prepared by rf sputtering. then we invest surface morphology and crystal structure, optical and electrical properties of zno films by afm, xrd, hall testing, ultraviolet - visible spectrum photometer and xps et al. zno films are fabricated on gaas substrate

    本文用射頻反應磁控濺射制備了高度c軸擇優取向的zno薄膜，採用原子力顯微鏡（ afm ） 、 x射線（ xrd ） 、 hall測試儀、紫外?可見分光光度計和x光電子能譜等分析測試手段，研究了樣品的表面形貌、晶體結構、光學和電學性能等。
  8. Solar radio metric wave radiation events observed using the acoustic - optic spectrograph at the yunnan observatory in march of 1991 with associated optic activity and correspanding evevts are analyzed. some characteristics of the events are obtained in this paper

    利用雲南天文臺聲光頻譜儀在1991年3月記錄到的太陽射電米波輻射事件、光學活動及相關事件作了分析，得到來自6538活動區太陽射電米波事件的一些基本特性。
  9. The structure of wpu emulsion was analyzed and characterized by ft - ir, malvern particle size analyzer, gpc and tem

    通過傅立葉變換紅外光譜、粒徑分析儀、凝膠滲透色譜（ gpc ）和透射電鏡（ tem ）對乳液進行了結構分析與表徵。
  10. By means of sem, tem, laser scattered particle analyzer, etc., the formation mechanism of ultrafine sio2 particle was studied. it was found that at the initial stage, the sio2 particle consisted of some minicrystal, but after the initial stage the sio2 particle was formed by some soluble aggregated substance growing on the surface of the early particle

    運用掃描電鏡、透射電鏡、激光粒度分析儀等檢測手段，探討了體系中超細二氧化硅顆粒的形成機理和過程，指出超細二氧化硅粒子前期是由體系中的微晶核組成，中後期則由體系中的可溶性縮合物在其表面生長而成。
  11. Current researches, applications, preparation and structure of si3n4 are summarized in this paper. a new conclusion is drawn that silicon wafer can react with nitrogen at the temperature higher than 1100 and in super - pure nitrogen by direct - nitridation of silicon at the temperature from 800 to 1200. the prepared silicon nitride samples are tested by xps ( x - ray photoelectron spectroscopy ), sem ( scanning electron microscopy ), optical microscopy, xrd ( x - ray diffraction ) and edx ( energy dispersive x - ray analysis )

    通過矽片在800到1200各個溫度和各種氮氣氣氛下的氮化處理的實驗結果，報道了不同與其他研究者的氮化條件，矽片在氮氣保護的熱處理中的氮化條件為：高於1100的溫度和高純氮的氣氛條件，同時對該氮化硅薄膜進行了金相顯微鏡、掃描電鏡（ sem ） 、 x射線衍射儀（ xrd ） 、 x射線光電子譜（ xps ） 、 x射線能譜儀（ edx ）和抗氧化性等測試和分析。
  12. In this paper, the property difference of sio2 sols used for preparing thin films by esam method or sol - gel process has been discussed. three kinds of sio2 sols were prepared, catalyzed by hcl or nh3 h2o only, or hcl first and then nh3 h2o respectively ( please note : in following text, the sio2 sol catalyzed by hc1 first and then nh3 h2o and its correspondent films will be named sio2 sol 1 # and film 1 ; the sio2 sol catalyzed by nh3 h2o only and its correspondent films will be named sio2 sol 2 # and film 2 # ). through investigating the assembling properties of the sols, observing thin films " microscopic structure with tem and testing their transmissivity with 721 spectrophotometer, we find that the first kind of sol is not suitable for preparing esam films, but the last two, i. e. sol 1 # and sol 2 #, are good

    本文討論了esam法制備薄膜所用的溶膠與sol - gel法所用的溶膠在性能上的區別，在hc1或nh _ ? h _ 2o分別單獨催化和hc1 nh _ 3 ? h _ 2o分步催化三種催化條件下制備了sio _ 2溶膠（以下規定hc1 nh _ 3 ? h _ 2o分步催化的sio _ 2溶膠為1 ~ #溶膠，相應的薄膜為1 ~ #薄膜， nh _ 3 ? h _ 2o催化的sio _ 2溶膠為2 ~ #溶膠、相應的薄膜為2 ~ #薄膜） ，在通過組裝薄膜並用透射電鏡（ tem ）觀察薄膜微觀結構以及用721分光光度計測試樣品的光透射率，得出了后兩種催化方法所制備的溶膠適合於esam法鍍膜，而第一種溶膠不適于用此法鍍膜的結論，用傅立葉紅外光譜（ ft - ir ）研究了溶膠組成；用差熱失重分析儀（ dta - tg ）對膠體進行了熱分析。
  13. Optical fibre amplifiers - basic specifications - part 5 - 3 : test methods for reflectance parameters ; reflectance tolerance test method using electrical spectrum analyzer

    光纖放大器.基本規范.第5 - 3部分:反射參數的試驗方法.使用電譜分析儀的反射公差試驗法
  14. The company has the advanced precision casting, the machine - finishing equipment and the check - out facility, including : disk wax mould machine, moistening slurry machine, intermediate frequency melting furnaces, cnc tooling machine, spectrometer, metallurgical microscope, hardness testing machine, computer material test machine. and so on

    公司擁有先進的精密鑄造、機械加工設備及檢測設備，其中包括：雙工位射蠟機、圓盤射蠟機、沾漿機、中頻熔化電爐，光譜分析儀、金相顯微鏡、硬度試驗機、電腦萬能材料試驗機， cnc數控車床、普通鉆銑床及閥門管件殼體、密封試驗機等。
  15. Optical fibre amplifiers. basic spectrum analyzers - transmitter output optical power measurement for single - mode optical fibre cable

    光纖放大器.基本光譜分析儀.單模光纖電纜用發射機光輸出功率測量
  16. In the investigation of the interaction of the us - ui laser pulse with the plasma, a standard - ray source is firstly used to absolutely calibrate lif mermc - luminescence dosimeters ( tlds ), and the dosimeter are employed as the angular distribution spectrometer and the energy spectrum spectrometer of the hot electrons

    在超短超強激光等離子體相互作用的研究中，首次採用137cs鄧標準源對lif熱釋光探測器（ tlds ）進行了絕對標定。並以此作為電子角分佈儀和電子譜儀的探測元件，研究了超短超強激光與等離子體相互作用中超熱電子發射的角分佈和能量分佈。
  17. The infrared spectroscopy, transmission electron microscopy, light scattering and x - ray photoelectron spectroscopy are used to characterize the polymer structure and the morphology of the latex particles. the results demonstrate that composite latex with core / shell morphology is indeed successfully prepared

    利用紅外光譜、透射電鏡、激光粒度儀、表面能譜分析等手段對聚合產物的化學結構及乳膠粒粒子形態進行了表徵。
  18. Zero - expansion models satisfy the request of space structures for they can possess high dimensional stability in temperature - change fields. the surface morphology, electrical conductivity and spectral reflectivity of al / kapton films before and after space environment simulated tests were

    對于al / kapton薄膜試驗分別採用原子力顯微鏡、四探針電阻測量儀、紫外可見分光光度計測試其空間環境試驗后的表面形貌、面電導率、光學反射率。
  19. Optical fibre amplifiers - basic specification - part 5 - 3 : test methods for reflectance parameters - reflectance tolerance using an electrical spectrum analyser

    光纖放大器.基礎規范.第5 - 3部分:反射參數的試驗方法.使用電光譜分析儀檢測反射公差
  20. The surface restoration layer of a gear wheel, which had run in lubricating oil with pbc restoration agent was analyzed using tem, sem, xps, aes and raman ; and the mechanism of reducing friction of the restoration agent was studied

    以透射電鏡、 x射線光電子能譜儀、俄歇電子能譜儀和拉曼光譜儀分析了在添加摩聖修復劑的潤滑油中運行過的齒輪表層，對摩聖修復劑的減摩機理進行了分析。
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