氣候試驗 的英文怎麼說
中文拼音 [qìhòushìyàn]
氣候試驗
英文
climatic testing- 氣 : Ⅰ名詞1 （氣體） gas 2 （空氣） air 3 （氣息） breath 4 （自然界冷熱陰晴等現象） weather 5 （氣味...
- 試 : 名詞（古代占卜用的器具） astrolabe
- 驗 : 動詞1. （察看; 查考） examine; check; test 2. （產生預期的效果） prove effective; produce the expected result
- 氣候 : 1. （氣象情況） climate; weather 2. （局勢） climate; situation 3. （結果; 成就） successful development
- 試驗 : trial; experiment; test
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Technical climatology ; climate - test - devices ; climatic parameter : air - humidity and air - temperature
技術氣候學.氣候試驗裝置.氣候參數：空氣濕度和溫度Semiconductor devices - mechanical and climatic test methods - rapid change of temperature - two - fluid - bath method
半導體裝置.機械和氣候試驗方法.溫度速變.雙流體浸泡法Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature ; two - fluid - bath method
半導體器件.機械和氣候試驗方法.第11部分:溫度的急速變化.雙液電鍍槽法Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature - two - fluid - bath method
半導體裝置.機械和氣候試驗方法.第11部分:溫度的急速變化.雙液電鍍槽法Semiconductor devices - mechanical and climatic test methods - part 11 : rapid change of temperature ; two - fluid - bath method iec 60749 - 11 : 2002 ; german version en 60749 - 11 : 2002
半導體器件.機械和氣候試驗方法.第11部分:溫度驟變Semiconductor devices - mechanical and climatic test methods - internal moisture content measurement and the analysis of other residual gases
半導體器件.機械和氣候試驗方法.其他殘余氣體的內部濕氣含量的測量和分析Semiconductor devices - mechanical and climatic test methods - part 16 : particle impact noise detection iec 60749 - 16 : 2003 ; german version en 60749 - 16 : 2003
半導體器件.機械和氣候試驗方法.第16部分:粒子碰撞噪Semiconductor devices - mechanical and climatic test methods - high temperature operating life
半導體器件.機械和氣候試驗方法.高溫操作壽命Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life
半導體器件.機械和氣候試驗方法.第23部分:高溫操作壽命Semiconductor devices - mechanical and climatic test methods - part 23 : high temperature operating life iec 60749 - 23 : 2004 ; german version en 60749 - 23 : 2004
半導體器件.機械和氣候試驗方法.第23部分:高溫操作壽Electromechanical components for electronic equipment. basic testing procedures and measuring methods. part 11 : climatic tests. section 1 : test 11a. climatic sequence
電子設備用機電元件.基本試驗程序和測量方法.第11部分:氣候試驗.第1節:試驗11a .氣候序列Fibre optic interconnecting devices and passive components - basic test and measurement procedures - tests - climatic sequence
光纖互聯裝置和無源部件.基本試驗和測量程序.氣候試驗順序Sensitive switches for communication technology ; climatic test categories, measuring methods and testing procedures
通信技術靈敏開關.第1部分:氣候試驗等級測量方法和Climatic tests for electric wheelchairs
電動輪椅車氣候試驗方法Semiconductor devices - mechanical and climatic test methods - part 26 : electrostatic discharge sensitivity testing ; human body model
半導體器件.機械和氣候試驗方法.第26部分:靜電放電敏感性試驗.人體模型Semiconductor devices - mechanical and climatic test methods - permanence of marking
半導體器件.機械和氣候試驗方法.永久性標記Semiconductor devices - mechanical and climatic test methods - part 20 : resistance of plastic - encapsulated smds to the combined effect of moisture and soldering heat
半導體裝置.機械和氣候試驗方法.第20部分:塑料密封的smds抗濕氣和釬焊熱綜合影響的性能Semiconductor devices - mechanical and climatic test methods - resistance of plastic - encapsulated smds to the combined effect of moisture and soldering heat
半導體器件.機械和氣候試驗方法.塑料包封的smds的抗濕及釬焊熱度綜合影響Connectors for electronic equipment - tests and measurements - climatic tests - test 11e - mould growth
電子設備連接器.試驗和測量.氣候試驗.試驗11e .黴菌生長Connectors for electronic equipment - tests and measurements - part 11 - 5 : climatic tests ; test 11e : mould growth
電子設備連接器.試驗和測量.第11 - 5部分:氣候試驗.試驗11e :黴菌生長分享友人