真空淀積法 的英文怎麼說

中文拼音 [zhēnkōngdiàn]
真空淀積法 英文
vacuum deposition process
  • : Ⅰ形容詞(真實) true; genuine; real Ⅱ副詞1 (的確; 實在) really; truly; indeed 2 (清楚確實) cl...
  • : 空Ⅰ形容詞(不包含什麼; 裏面沒有東西或沒有內容; 不切實際的) empty; hollow; void Ⅱ名詞1 (天空) s...
  • : Ⅰ動詞(沉澱) form sediment; settle; precipitateⅡ名詞(淺的湖泊, 多用於地名) shallow lake
  • : Ⅰ動詞(積累) amass; store up; accumulate Ⅱ形容詞(長時間積累下來的) long standing; long pending...
  • : Ⅰ名詞1 (由國家制定或認可的行為規則的總稱) law 2 (方法; 方式) way; method; mode; means 3 (標...
  • 真空 : [物理學] vacuum; empty space; vacuo
  1. Determined by dsc. whereafter, the surface micro - morphology of both sides of tini sma thin film deposited on glass was investigated by atomic force microscope ( afm ), and the difference of morphology between the two sides is observed. it has been shown that, in the growing surface of sputtered tini film, the trend of grain to accumulating along the normal direction like a column is clearly observed, and the grain is very loose which resulted in more microcavities, but in the surface facing to glass substrate, grain is so compact that there are hardly microcavities

    通過濺射,在玻璃襯底上了tini薄膜,並在600進行了退火, dsc測得其馬氏體逆相變峰值溫度為75 ,利用原子力顯微鏡,對玻璃基tini形狀記憶合金薄膜的襯底面與生長面進行了表面微觀形貌分析,發現:生長面晶粒呈現出沿薄膜線方向柱狀堆的趨勢,晶粒緻密性差,微孔洞多;而襯底面晶粒緻密,幾乎沒有微孔洞存在。
  2. In succession, tini thin film is deposited on single - crystal silicon substrate using optimized parameters utilizing sputtering, and its transformation temperature ( a * ) is 72 ? indicated by dsc curve after being annealed in an ultra - high vacuum ( uhv ) chamber. in addition, the composition of the silicon - based tini film was analyzed by an energy dispersive x - ray spectroscopy ( eds ), and the ti content in the film is approximately 51at %

    按照改進的工藝參數,在單晶硅襯底上濺射-了tini薄膜,並進行了超高退火, dsc測得其馬氏體逆相變峰值溫度為72 ,利用能譜分析( eds )技術測得其ti含量約為51at ,通過對非晶tini薄膜與單晶硅襯底之間的界面進行eds及x射線衍射( xrd )分析,發現在用大功率( 2000w )直流磁控濺射制備tini薄膜過程中,存在ti 、 ni與si的雙向擴散,發生了界面反應,並有三元化合物ni _ 3ti _ 2si生成。
  3. Vacuum deposition method

    真空淀積法
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