瞬態電流 的英文怎麼說

中文拼音 [shùntàidiànliú]
瞬態電流 英文
transient current
  • 瞬 : Ⅰ名詞（眼珠一動; 一眨眼） wink; twinkling Ⅱ動詞（眨眼） wink
  • 態 : 名詞1. （形狀; 狀態） form; condition; appearance 2. [物理學] （物質結構的狀態或階段） state 3. [語言學] （一種語法范疇） voice
  • 電 : Ⅰ名詞1 （有電荷存在和電荷變化的現象） electricity 2 （電報） telegram; cable Ⅱ動詞1 （觸電） give...
  • 流 : Ⅰ動1 （液體移動; 流動） flow 2 （移動不定） drift; move; wander 3 （流傳; 傳播） spread 4 （向壞...
  • 瞬態 : transient; instantaneous condition; transient state
  • 電流 : current; galvanic current; electric current; electricity; current flow電流保護裝置 current protec...
  1. Hh silc is found to have a more pronounced transient effect

    熱空穴應力導致的漏電流具有更加顯著的瞬態特性。
  2. Three different d - fronts are defined in this paper, and the test generation is consisted of three parts : to excite the fault at first ; to maximize the iddt difference between fault - free circuit and faulty circuit at second ; and finally to minimize the effect of bypass

    文中定義了三種不同的d前沿，並將測試生成分為三個部分： 1 、激活故障， 2 、使無故障電路和故障電路的瞬態電流差別最大化， 3 、減少旁路的影響。
  3. Focus on the reality that transient current testing overly relies on the test equipments, professor min yinghua from institute of computing technology of china sicence academy proposed at - speed current testing method ( idda testing ) grounded on transient current testing

    針對瞬態電流測試過于依賴測試設備的現狀，中科院閔應驊教授提出了基於瞬態電流的全速電流測試方法（ iddatesting ） 。
  4. In the experiment of testing instantaneous characteristics for circuit breaker, the transient current exists in the experimental circuit because of the closing making angle, which has serious influence on the testing precision

    斷路器進行瞬動特性試驗時，由於合閘相角的原因，試驗電路中會產生暫態電流，暫態電流的存在對試驗精度產生嚴重的影響。
  5. By simulating of transient field in the photoconductor of thz photoconductive antenna, the curve of instant electric current was given here, and the result was validated by fdtd method. the influence of transient field to thz out put was mentioned in this paper too

    通過對thz光電導天線中瞬態電場的模擬，得到了晶元內瞬西安理工大學碩士學位論文態電流的變化曲線，並通過fdtd方法對瞬態電流模擬結果進行了驗證。
  6. Regarding the discrete magnetic vector potential and loop currents as the state variables, and combining the fem with the multi - loop method, a mathematical model of the synchronous machine with internal faults is set up in this paper

    本文以矢量磁位和迴路電流為求解變量，把電機的電磁場方程與反映繞組聯接情況的電路方程聯立起來同時求解，提出了同步發電機定子繞組內部故障的瞬態電磁場與多迴路耦合的數學模型。
  7. Uniqueness and stability of solution to the linear transient eddy current electromagnetic field problem for determining solution

    線性瞬態渦流電磁場定解問題解的唯一性和穩定性
  8. The separated phase of blends and carrier injection, transport and decay were firstly investigated by monitoring two different transient el peaks

    首次引入監測基質和雜質兩個瞬態電致峰值來研究低摻雜體系的相分離及載流子注入、遷移和湮滅過程。
  9. The transient power supply current ( iddt ) testing can detect some faults undetectable by any other test method, and increase fault coverage

    瞬態電流測試方法可以測試一些其他測試方法無法檢測的故障，進一步提高故障覆蓋率。
  10. The stuck - open faults are simulated concurrently based on iddt testing with the test pattern pairs generated above

    利用測試生成的向量對，採用瞬態電流測試方法對開路故障進行並發故障模擬。
  11. The current based test method can be divided into two categories, the one is quiescent current test ( iddq testing ) and the other is transient current test ( iddt testing )

    為了降低測試成本並且提高集成電路的可靠性，電流測試應運而生。電流測試技術包括穩態電流測試（ iddqtesting ） 、瞬態電流測試（ iddttesting ）兩種方法。
  12. Quiescent current test method has been widely applied in ic industries already and transient current testing is still at the stage of studying due to its harsh requirement for apparatus and other technical problems

    穩態電流測試目前已經實用化，而瞬態電流測試由於其對測試設備要求苛刻和其他一些技術問題仍處于研究階段。
  13. On the basis of the analysis on spwm modulation mode and transient current control theory, a new method of voltage balance on the capacitors in dc side is proposed, and computer simulation is carried out in matlab

    在分析了spwm調制方式和瞬態電流控制原理的基礎上，提出了一種直流側兩電容上電壓平衡的方法，並在matlab環境下進行了計算機模擬。
  14. Based on the analysis and research on fan algorithm, an iddt test pattern generation algorithm for stuck - open faults is present. in the case of ignoring hazards, for the stuck - open faults in cmos circuits, the feasibility of transient current test generation based on fan algorithm is discussed

    本文採用啟發式搜索的方法，基於對fan演算法的分析，在不考慮冒險的情況下對于cmos電路中的開路故障，探討了利用fan演算法進行瞬態電流測試生成的可能性。
  15. For the convenience of test, varied circuit chip defects caused by the production process are abstracted as all kinds of models. at present the commonly used fault models mainly consist of stuck - at fault, stuck - open fault, bridge fault, store fault, delay fault, etc. testing methods based on voltage testing mainly aim at stuck - at fault model and have also obtained satisfactory result in research for many years. bridge fault is tested easily by quiescent power supply current ( iddq ) testing method. in regard to stuck - open fault that is difficult to testd by quiescent power supply current ( iddq ) and voltage testing, it can is tested by the dynamic current ( iddt ) testing

    為了便於測試，我們將生產過程中集成電路出現的多種多樣的缺陷抽象為各種模型。目前常用的故障模型主要有:固定故障，開路故障，橋接故障，存儲故障，時滯故障等。電壓測試主要針對固定型故障模型，多年的研究也取得了令人滿意的結果; cmos電路中的橋接故障則宜用穩態電流測試方法（ iddq ）測試;對于電壓和穩態電流難以測試的開路故障，可以使用瞬態電流測試（ iddt ）的方法進行測試。
  16. General seminconductor, inc. is a market leader in the discrete segment of the semiconductor industry with manufacturing facilities in china, france, germany, united states, etc. the company provides customers with a broad array of power rectifiers, transient voltage suppressors and small signal transistors and diodes

    通用半導體有限公司是世界上半導體切片工業的領導者，它的製造廠遍及中國、法國、德國、美國等國家。公司提供多種多樣的整流器、瞬態電壓消除器、小信號晶體管以及二極體。
  17. In this paper an fault simulator for iddt testing is presented, which can detect concurrently the multi - faults. due to the subtle error among equipment manufacturing, the gate delays of circuits are not the same but range within limits. which induces the uncertainty of the waveform transforming time

    本文從故障激活的條件入手，利用五值邏輯，對瞬態電流測試中的延時變化進行波形分析和波形計算，採用並發模擬演算法，編程實現了一個iddt測試的故障模擬器。實際電路中由於製造工藝的限制，邏輯門的延時並不相同，而是在一定范圍內變化，引起波形變化的時間不確定。
  18. The control technology of phase selection has been used on beaker ' s instantaneous characteristic test device for jiang su chang shu switch plant. the precision is ?

    採用上述技術研製的選相分合閘裝置，應用於斷路器瞬動特性試驗設備中，選相精度為1 ，較好地消除了試驗中的暫態電流。
  19. Dynamic current monitor reflects transient loading current instantly to judge the faulty parts of mobile circuit board easily

    動態電流監測器能瞬時反映出負載跳變狀態，更容易判斷手機板的故障部份。
  20. At present testing method based on current testing has become an important cmos digital integrated circuit testing method which has been accepted widely. in order to improve the fault coverage of the testing to meet the demands of people, the dynamic current ( iddt ) testing was proposed to detect some faults that cannot be detected by other testing methods in the middle 1990 ’ s

    90年代中期，人們提出了瞬態電流測試方法（ iddt ） ，以便發現一些其他測試方法所不能發現的故障，進一步從總體上提高測試的故障覆蓋率，滿足人們對高性能集成電路的需要。
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